Ruijing Shen - researchr alias

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Viewing Publication 1 - 14 from 14

2012

General Parameterized Thermal Modeling for High-Performance Microprocessor DesignThom Jefferson A. Eguia, Sheldon X.-D. Tan, Ruijing Shen, Duo Li, Eduardo H. Pacheco, Murli Tirumala, Lingli Wang. tvlsi, 20(2):211-224, 2012. [doi]

A new voltage binning technique for yield improvement based on graph theoryRuijing Shen, Sheldon X.-D. Tan, Xuexin Liu. isqed 2012: 243-248 [doi]

Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI SystemsRuijing Shen, Sheldon X.-D. Tan, Hai Wang, Jinjun Xiong. todaes, 17(4):51, 2012. [doi]

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI DesignsRuijing Shen, Sheldon X.-D. Tan, Hao Yu. Springer, 2012. [doi]

Decentralized and Passive Model Order Reduction of Linear Networks With Massive PortsBoyuan Yan, Sheldon X.-D. Tan, Lingfei Zhou, Jie Chen 0005, Ruijing Shen. tvlsi, 20(5):865-877, 2012. [doi]

2011

Statistical full-chip dynamic power estimation considering spatial correlationsZhigang Hao, Ruijing Shen, Sheldon X.-D. Tan, Bao Liu, Guoyong Shi, Yici Cai. isqed 2011: 677-682 [doi]

Performance bound analysis of analog circuits considering process variationsZhigang Hao, Sheldon X.-D. Tan, Ruijing Shen, Guoyong Shi. dac 2011: 310-315 [doi]

2010

General behavioral thermal modeling and characterization for multi-core microprocessor designThom Jefferson A. Eguia, Sheldon X.-D. Tan, Ruijing Shen, Eduardo H. Pacheco, Murli Tirumala. date 2010: 1136-1141 [doi]

Statistical modeling and analysis of chip-level leakage power by spectral stochastic methodRuijing Shen, Sheldon X.-D. Tan, Ning Mi, Yici Cai. integration, 43(1):156-165, 2010. [doi]

A linear statistical analysis for full-chip leakage power with spatial correlationRuijing Shen, Sheldon X.-D. Tan, Jinjun Xiong. glvlsi 2010: 227-232 [doi]

A linear algorithm for full-chip statistical leakage power analysis considering weak spatial correlationRuijing Shen, Sheldon X.-D. Tan, Jinjun Xiong. dac 2010: 481-486 [doi]

Variational Capacitance Extraction and Modeling Based on Orthogonal Polynomial MethodRuijing Shen, Sheldon X.-D. Tan, Jian Cui, Wenjian Yu, Yici Cai, Gengsheng Chen. tvlsi, 18(11):1556-1566, 2010. [doi]

2009

Statistical modeling and analysis of chip-level leakage power by spectral stochastic methodRuijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong. aspdac 2009: 161-166 [doi]

2008

Variational capacitance modeling using orthogonal polynomial methodJian Cui, Gengsheng Chen, Ruijing Shen, Sheldon X.-D. Tan, Wenjian Yu, Jiarong Tong. glvlsi 2008: 23-28 [doi]

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