The following publications are possibly variants of this publication:
- Testing of Precision DAC Using Low-Resolution ADC With WobblingLe Jin, Hosam Haggag, Randall L. Geiger, Degang Chen. tim, 57(5):940-946, 2008. [doi]
- Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACsHanjun Jiang, Degang Chen, Randall L. Geiger. iscas 2005: 4285-4288 [doi]
- On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with ditheringHanqing Xing, Degang Chen, Randall L. Geiger. eit 2008: 117-122 [doi]
- Linearity test for high resolution DACs using low-accuracy DDEM flash ADCsHanqing Xing, Degang Chen, Randall L. Geiger. iscas 2006: [doi]
- Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function EstimationS. Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin. ets 2009: 3-8 [doi]
- Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACsHanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger. tim, 56(5):1753-1762, 2007. [doi]
- Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACsHanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger. itc 2003: 1379-1388 [doi]
- Low Cost Dynamic Test Methodology for High Precision ΣD ADCsS. Kook, Hyun Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin. ats 2009: 69-74 [doi]
- A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC testBeatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger. iscas 2005: 784-787 [doi]