The following publications are possibly variants of this publication:
- Compact Set of Functional Broadside Tests with Fault Detection on Primary OutputsIrith Pomeranz. vts 2023: 1-7 [doi]
- Improving the Transition Fault Coverage of Functional Broadside Tests by Observation Point InsertionIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 16(7):931-936, 2008. [doi]
- Using piecewise-functional broadside tests for functional broadside test compactionIrith Pomeranz. vts 2017: 1-6 [doi]
- Improving the stuck-at fault coverage of functional test sequences by using limited-scan operationsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 12(7):780-788, 2004. [doi]
- On improving the stuck-at fault coverage of functional test sequences by using limited-scan operationsIrith Pomeranz, Sudhakar M. Reddy. itc 2001: 211-220
- Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside TestsIrith Pomeranz. tvlsi, 21(7):1359-1363, 2013. [doi]
- Compact test sets for high defect coverageSudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara. tcad, 16(8):923-930, 1997. [doi]