Thierry Bouwmans - researchr profile publications

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Publications tagged reliability

Nanotechnology - The basis for the creation of new high-reliability elementsV. A. Smagin. accs, 42(2):109-111, 2008. [doi]

Digital Evidence: Findings of Reliability, Not PresumptionsVictor Limongelli. jdfp, 2(1):13-16, 2008. [doi]

Monte Carlo reliability model for microwave monolithic integrated circuitsAris Christou. qre, 24(3):315-329, 2008. [doi]

Comparison of Background Subtraction Methods for a Multimedia Learning SpaceFida El Baf, Thierry Bouwmans, Bertrand Vachon. sigmap 2007: 153-158

A comparative study of the reliability of nine statistical software packagesKellie B. Keeling, Robert J. Pavur. csda, 51(8):3811-3831, 2007. [doi]

Integrity-directed sequential state estimation: Assessing high reliability requirements via safe confidence intervalsOlivier Bilenne. inffus, 8(1):40-55, 2007. [doi]

Correlation between chemistry of polymer building blocks and microelectronics reliabilityH. J. L. Bressers, W. D. van Driel, K. M. B. Jansen, L. J. Ernst, G. Q. Zhang. mr, 47(2-3):290-294, 2007. [doi]

Reliability challenges in the nanoelectronics eraA. J. van Roosmalen, G. Q. Zhang. mr, 46(9-11):1403-1414, 2006. [doi]

Digital Evidence: Challenging the Presumption of ReliabilityEric Van Buskirk, Vincent T. Liu. jdfp, 1(1):19-26, 2006. [doi]

Towards 100 reliability in wireless monitoring networksLance Doherty, Dana A. Teasdale. pe-wasun 2006: 132-135 [doi]

Thermal and electrostatic reliability characterization in RF MEMS switchesQ.-H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, P. Pons, F. Flourens, F. Pressecq. mr, 45(9-11):1790-1793, 2005. [doi]

Reliability of Cluster System with a Lot of Software InstancesMagdalena Szymczyk, Piotr Szymczyk. iccS 2004: 417-420 [doi]

On the exponential formula for reliabilityM. S. Finkelstein. tr, 53(2):265-268, 2004. [doi]

An O(k:::2:::·log(n)) algorithm for computing the reliability of consecutive-k-out-of-n: F systemsMin-Sheng Lin. tr, 53(1):3-6, 2004. [doi]

The rainfall reliability wizard--a new tool to rapidly analyse spatial rainfall reliability with examplesGreg P. Laughlin, Heping Zuo, James Walcott, Adrian L. Bugg. envsoft, 18(1):49-57, 2003.

The right way to assess electronic system reliability: FIDESP. Charpenel, F. Davenel, R. Digout, M. Giraudeau, M. Glade, J. P. Guerveno, N. Guillet, A. Lauriac, S. Male, D. Manteigas. mr, 43(9-11):1401-1404, 2003. [doi]

Indirect assessment of system reliabilityNader B. Ebrahimi. tr, 52(1):58-62, 2003. [doi]

Extending integrated-circuit yield-models to estimate early-life reliabilityThomas S. Barnett, Adit D. Singh, Victor P. Nelson. tr, 52(3):296-300, 2003. [doi]

Reliability aspects of semiconductor devices in high temperature applicationsW. Kanert, H. Dettmer, B. Plikat, N. Seliger. mr, 43(9-11):1839-1846, 2003. [doi]

Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviationsJ.-Y. Delétage, F. J.-M. Verdier, B. Plano, Y. Deshayes, L. Béchou, Y. Danto. mr, 43(7):1137-1144, 2003. [doi]

Impact of probing procedure on flip chip reliabilityKuo-Ming Chen, Kuo-Ning Chiang. mr, 43(1):123-130, 2003. [doi]

Influence of the turn-on mechanism on TRIACs reliability: di/dt thermal fatigue study in Q1 compared to Q2S. Moreau, S. Forster, T. Lequeu, R. Jérisian. mr, 42(9-11):1663-1666, 2002. [doi]

Reliability of thin-film resistors: impact of third harmonic screeningsReiner W. Kuehl. mr, 42(6):807-813, 2002. [doi]

Optical semiconductor device reliabilityMitsuo Fukuda. mr, 42(4-5):679-683, 2002. [doi]

DRAM reliabilityKinam Kim, Gi-Tae Jeong, Chan-Woong Chun, Sam-Jin Hwang. mr, 42(4-5):543-553, 2002. [doi]

Effects of hydrogen transport and reactions on microelectronics radiation response and reliabilityD. M. Fleetwood. mr, 42(4-5):523-541, 2002. [doi]

Growth process and chemical characterization of an ultrathin phosphate film grafted onto Al-alloy metallization surfaces relevant to microelectronic devices reliabilityG. Curro, R. Greco, A. Scandurra. mr, 42(9-11):1659-1662, 2002. [doi]

Effect of trench edge on pMOSFET reliabilityYung-Huei Lee, Tom Linton, Ken Wu, Neal Mielke. mr, 41(5):689-696, 2001. [doi]

Impact of ESD protection device trigger transient on the reliability of ultra-thin gate oxideKin P. Cheung. mr, 41(5):745-749, 2001. [doi]

Electrical reliability aspects of through the gate implanted MOS structures with thin oxidesM. P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel. mr, 41(7):987-990, 2001. [doi]

Lead-free plastic area array BGAs and polymer stud grid arrays:::TM::: package reliabilityDominique Wojciechowski, Moses Chan, Fabrizio Martone. mr, 41(11):1829-1839, 2001. [doi]

Ultra-thick gate oxides: charge generation and its impact on reliabilityUdo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber. mr, 41(7):1007-1010, 2001. [doi]

Reliability of 80 mum pitch flip chip attachment on flexPetteri Palm, Jarmo Määttänen, Aulis Tuominen, Eero Ristolainen. mr, 41(5):633-638, 2001. [doi]

Legal Reliability in Large-Scale Distributed SystemsPeter Sommer. srds 1998: 416-421

Computing Optimal Assignments for Residual Network ReliabilityConstantine Stivaros, Klaus Sutner. DAM, 75(3):285-295, 1997. [doi]

Questionnaire Administration Via the WWW: A Validation & Reliability Study for a User Satisfaction QuestionnaireBen D. Harper, Laura A. Slaughter, Kent L. Norman. webnet 1997:

A Criticism on the Capture-and-Recapture Method for Software Reliability AssuranceSadahiro Isoda. apsec 1995: 38 [doi]

Software Reliability Trend Analyses from Theoretical to Practical ConsiderationsKarama Kanoun, Jean-Claude Laprie. TSE, 20(9):740-747, 1994. [doi]

Influence of Cumulative Damage on the Seismic Reliability of Multi-Storey FramesL. Esteva, O. Diaz. ifip7-5 1993: 65-72

Forword: Software ReliabilityFarokh B. Bastani. TSE, 19(11):1013-1014, 1993. [doi]

Effects of image smoothing on the reliability of motion estimationDong Wook Kang, Kyeong-Hoon Jung, Choong Woong Lee. iscas 1993: 5-8

New Reliability Evaluation Algorithms for Distributed Computing SystemsMin-Sheng Lin, Deng-Jyi Chen. jise, 8(3):353-391, 1992. [doi]

Comments on Resourceful Systems for Fault Tolerance, Reliability, and Safety Surveyors Forum. ACM Comput. Surv., 23(3):407-411, 1991.

A Lower Bound On The Reliability of an ::::n::::-Dimensional HypercubeDov Bulka, Joanne Bechta Dugan. srds 1990: 44-53

Software Reliability MeasurementWilliam W. Everett. jsac, 8(2):247-252, 1990.

Exponential Order Statistic Models of Software Reliability GrowthDouglas R. Miller. TSE, 12(1):12-24, 1986.

A comparison of time domains for software reliability modelsJohn D. Musa, Kazuhira Okumoto. jss, 4(4):277-287, 1984. [doi]

On Concurrency and Reliability of a Real-time DBMS for 5ESS Switching SystemF. K. Ng. srds 1983: 182-188

An Improvement of Reliability of Memory System with Skewing ReconfigurationTakeo Kanai. TC, 30(10):811-812, 1981.

Reliability and fault-masking in n-variable NOR treesMarion Dunning, Bernard Kolman. focs 1965: 126-142

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