The following publications are possibly variants of this publication:
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- Soft Error Resilient System Design through Error CorrectionSubhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim. vlsi 2006: 332-337 [doi]
- Soft Error Resilient System Design through Error CorrectionSubhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim. vlsi 2007: 143-156 [doi]
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- Design for Resilience to Soft Errors and VariationsMing Zhang, T. M. Mak, James Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu. iolts 2007: 23-28 [doi]
- Delay Defect Characteristics and Testing StrategiesKee Sup Kim, Subhasish Mitra, Paul G. Ryan. dt, 20(5):8-16, 2003. [doi]
- Hierarchical Test Compression for SoC DesignsKee Sup Kim, Ming Zhang. dt, 25(2):142-148, 2008. [doi]
- Soft Errors: Technology Trends, System Effects, and Protection TechniquesSubhasish Mitra, Pia Sanda, Norbert Seifert. iolts 2007: 4 [doi]