The following publications are possibly variants of this publication:
- Piecewise-Functional Broadside Tests Based on Reachable StatesIrith Pomeranz. TC, 64(8):2415-2420, 2015. [doi]
- On reset based functional broadside testsIrith Pomeranz, Sudhakar M. Reddy. date 2010: 1438-1443 [doi]
- Functional Broadside Tests with Different Levels of ReachabilityIrith Pomeranz, Sudhakar M. Reddy. vlsid 2007: 799-804 [doi]
- Functional Broadside Tests With Incompletely Specified Scan-In StatesIrith Pomeranz. tcad, 32(9):1445-1449, 2013. [doi]
- Using piecewise-functional broadside tests for functional broadside test compactionIrith Pomeranz. vts 2017: 1-6 [doi]
- LFSR-Based Generation of Partially-Functional Broadside TestsIrith Pomeranz. TC, 65(8):2659-2664, 2016. [doi]
- LFSR-based generation of boundary-functional broadside testsIrith Pomeranz. iet-cdt, 14(2):61-68, 2020. [doi]
- LFSR-Based Generation of Close-to-Functional Broadside TestsIrith Pomeranz. todaes, 23(4), 2018. [doi]
- Reset and partial-reset-based functional broadside testsIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 6(4):232-239, 2012. [doi]
- On the generation of scan-based test sets with reachable states for testing under functional operation conditionsIrith Pomeranz. dac 2004: 928-933 [doi]
- Broadside and Functional Broadside Tests for Partial-Scan CircuitsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 19(6):1104-1108, 2011. [doi]
- Low-power skewed-load tests based on functional broadside testsIrith Pomeranz. todaes, 19(2):18, 2014. [doi]
- Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside TestsIrith Pomeranz. todaes, 22(1), 2016. [doi]