Friedrich Taenzler - researchr alias

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Viewing Publication 1 - 15 from 15

2014

Development and empirical verification of an accuracy model for the power down leakage testsJae-woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao. vts 2014: 1-6 [doi]

A novel BIST technique for LDMOS driversBruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian. mwscas 2014: 1069-1072 [doi]

2013

2012

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using MultitonesVishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya. tcad, 31(7):1088-1101, 2012. [doi]

2011

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither SchemeSukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force. et, 27(3):241-252, 2011. [doi]

2010

Low cost test and tuning of RF circuits and systemsAbhijit Chatterjee, Friedrich Taenzler. vts 2010: 42 [doi]

Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF SystemsVishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler. dt, 27(6):6-17, 2010. [doi]

2008

Optimized EVM Testing for IEEE 802.11a/n RF ICsErkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler. itc 2008: 1-10 [doi]

Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE PlatformsGanesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler. itc 2008: 1-9 [doi]

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless TransceiversGanesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee. dt, 25(2):150-159, 2008. [doi]

2007

Production Test of High Volume Commercial RFICFriedrich Taenzler. ats 2007: 476 [doi]

2006

Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral SignaturesGanesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler. vts 2006: 222-227 [doi]

Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platformsGanesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee. date 2006: 658-663 [doi]

1993

Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probingFriedrich Taenzler, Thomas Novak 0003, Erich Kubalek. vts 1993: 120-122 [doi]

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