Wil M. P. van der Aalst - researchr profile publications

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Publications tagged reliability

Soft reliability: an interdisciplinary approach with a user-system focusAylin Koca, Mathias Funk, Evangelos Karapanos, Anne Rozinat, Wil M. P. van der Aalst, Henk Corporaal, Jean-Bernard Martens, Piet van der Putten, A. J. M. M. Weijters, Aarnout Brombacher. qre, 25(1):3-20, 2009. [doi]

Nanotechnology - The basis for the creation of new high-reliability elementsV. A. Smagin. accs, 42(2):109-111, 2008. [doi]

Digital Evidence: Findings of Reliability, Not PresumptionsVictor Limongelli. jdfp, 2(1):13-16, 2008. [doi]

Monte Carlo reliability model for microwave monolithic integrated circuitsAris Christou. qre, 24(3):315-329, 2008. [doi]

Integrity-directed sequential state estimation: Assessing high reliability requirements via safe confidence intervalsOlivier Bilenne. inffus, 8(1):40-55, 2007. [doi]

Digital Evidence: Challenging the Presumption of ReliabilityEric Van Buskirk, Vincent T. Liu. jdfp, 1(1):19-26, 2006. [doi]

Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cyclingL. Dupont, Z. Khatir, S. Lefebvre, S. Bontemps. mr, 46(9-11):1766-1771, 2006. [doi]

Impact of the number of chips on the reliability of the solder balls for wire-bonded stacked-chip ball grid array packagesYi-Ming Jen, Ying-Lung Wu, Chih-Kai Fang. mr, 46(2-4):386-399, 2006. [doi]

Thermal and electrostatic reliability characterization in RF MEMS switchesQ.-H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, P. Pons, F. Flourens, F. Pressecq. mr, 45(9-11):1790-1793, 2005. [doi]

Verification of submodeling technique in thermomechanical reliability assessment of flip-chip package assemblyYi-Shao Lai, Tong Hong Wang. mr, 45(3-4):575-582, 2005. [doi]

Reliability of Cluster System with a Lot of Software InstancesMagdalena Szymczyk, Piotr Szymczyk. iccS 2004: 417-420 [doi]

On the exponential formula for reliabilityM. S. Finkelstein. tr, 53(2):265-268, 2004. [doi]

An O(k:::2:::·log(n)) algorithm for computing the reliability of consecutive-k-out-of-n: F systemsMin-Sheng Lin. tr, 53(1):3-6, 2004. [doi]

Fast wafer level reliability: methods and experiencesRolf-Peter Vollertsen. mr, 44(8):1207-1208, 2004. [doi]

Long time reliability study of soldered flip chips on flexible substratesBarbara Pahl, Christine Kallmayer, Rolf Aschenbrenner, Herbert Reichl. mr, 44(2):309-314, 2004. [doi]

Combinatorial methods for the evaluation of yield and operational reliability of fault-tolerant systems-on-chipJuan A. Carrasco, Víctor Suñé. mr, 44(2):339-350, 2004. [doi]

The rainfall reliability wizard--a new tool to rapidly analyse spatial rainfall reliability with examplesGreg P. Laughlin, Heping Zuo, James Walcott, Adrian L. Bugg. envsoft, 18(1):49-57, 2003.

The right way to assess electronic system reliability: FIDESP. Charpenel, F. Davenel, R. Digout, M. Giraudeau, M. Glade, J. P. Guerveno, N. Guillet, A. Lauriac, S. Male, D. Manteigas. mr, 43(9-11):1401-1404, 2003. [doi]

Indirect assessment of system reliabilityNader B. Ebrahimi. tr, 52(1):58-62, 2003. [doi]

Reliability aspects of semiconductor devices in high temperature applicationsW. Kanert, H. Dettmer, B. Plikat, N. Seliger. mr, 43(9-11):1839-1846, 2003. [doi]

Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviationsJ.-Y. Delétage, F. J.-M. Verdier, B. Plano, Y. Deshayes, L. Béchou, Y. Danto. mr, 43(7):1137-1144, 2003. [doi]

Impact of probing procedure on flip chip reliabilityKuo-Ming Chen, Kuo-Ning Chiang. mr, 43(1):123-130, 2003. [doi]

Reliability of optoelectronics components: towards new qualification practicesJ. L. Goudard, X. Boddaert, J. Périnet, D. Laffitte. mr, 43(9-11):1767-1769, 2003. [doi]

Influence of the turn-on mechanism on TRIACs reliability: di/dt thermal fatigue study in Q1 compared to Q2S. Moreau, S. Forster, T. Lequeu, R. Jérisian. mr, 42(9-11):1663-1666, 2002. [doi]

Reliability of thin-film resistors: impact of third harmonic screeningsReiner W. Kuehl. mr, 42(6):807-813, 2002. [doi]

Effects of hydrogen transport and reactions on microelectronics radiation response and reliabilityD. M. Fleetwood. mr, 42(4-5):523-541, 2002. [doi]

Growth process and chemical characterization of an ultrathin phosphate film grafted onto Al-alloy metallization surfaces relevant to microelectronic devices reliabilityG. Curro, R. Greco, A. Scandurra. mr, 42(9-11):1659-1662, 2002. [doi]

Effect of trench edge on pMOSFET reliabilityYung-Huei Lee, Tom Linton, Ken Wu, Neal Mielke. mr, 41(5):689-696, 2001. [doi]

Impact of ESD protection device trigger transient on the reliability of ultra-thin gate oxideKin P. Cheung. mr, 41(5):745-749, 2001. [doi]

Electrical reliability aspects of through the gate implanted MOS structures with thin oxidesM. P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel. mr, 41(7):987-990, 2001. [doi]

Lead-free plastic area array BGAs and polymer stud grid arrays:::TM::: package reliabilityDominique Wojciechowski, Moses Chan, Fabrizio Martone. mr, 41(11):1829-1839, 2001. [doi]

Ultra-thick gate oxides: charge generation and its impact on reliabilityUdo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber. mr, 41(7):1007-1010, 2001. [doi]

Reliability of 80 mum pitch flip chip attachment on flexPetteri Palm, Jarmo Määttänen, Aulis Tuominen, Eero Ristolainen. mr, 41(5):633-638, 2001. [doi]

Legal Reliability in Large-Scale Distributed SystemsPeter Sommer. srds 1998: 416-421

Computing Optimal Assignments for Residual Network ReliabilityConstantine Stivaros, Klaus Sutner. DAM, 75(3):285-295, 1997. [doi]

Questionnaire Administration Via the WWW: A Validation & Reliability Study for a User Satisfaction QuestionnaireBen D. Harper, Laura A. Slaughter, Kent L. Norman. webnet 1997:

A Criticism on the Capture-and-Recapture Method for Software Reliability AssuranceSadahiro Isoda. apsec 1995: 38 [doi]

Software Reliability Trend Analyses from Theoretical to Practical ConsiderationsKarama Kanoun, Jean-Claude Laprie. TSE, 20(9):740-747, 1994. [doi]

Influence of Cumulative Damage on the Seismic Reliability of Multi-Storey FramesL. Esteva, O. Diaz. ifip7-5 1993: 65-72

Effects of image smoothing on the reliability of motion estimationDong Wook Kang, Kyeong-Hoon Jung, Choong Woong Lee. iscas 1993: 5-8

New Reliability Evaluation Algorithms for Distributed Computing SystemsMin-Sheng Lin, Deng-Jyi Chen. jise, 8(3):353-391, 1992. [doi]

Comments on Resourceful Systems for Fault Tolerance, Reliability, and Safety Surveyors Forum. ACM Comput. Surv., 23(3):407-411, 1991.

A Lower Bound On The Reliability of an ::::n::::-Dimensional HypercubeDov Bulka, Joanne Bechta Dugan. srds 1990: 44-53

Software Reliability MeasurementWilliam W. Everett. jsac, 8(2):247-252, 1990.

Exponential Order Statistic Models of Software Reliability GrowthDouglas R. Miller. TSE, 12(1):12-24, 1986.

A comparison of time domains for software reliability modelsJohn D. Musa, Kazuhira Okumoto. jss, 4(4):277-287, 1984. [doi]

Software reliability measurement: Prediction, estimation, and assessmentJoseph P. Cavano. jss, 4(4):269-275, 1984. [doi]

On Concurrency and Reliability of a Real-time DBMS for 5ESS Switching SystemF. K. Ng. srds 1983: 182-188

An Improvement of Reliability of Memory System with Skewing ReconfigurationTakeo Kanai. TC, 30(10):811-812, 1981.

Reliability and fault-masking in n-variable NOR treesMarion Dunning, Bernard Kolman. focs 1965: 126-142

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