test coverage - researchr tag

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2011

Incorporating Coverage Criteria in Bounded Exhaustive Black Box Test Generation of Structural InputsNazareno Aguirre, Valeria S. Bengolea, Marcelo F. Frias, Juan P. Galeotti. tap 2011: 15-32 [doi]

High coverage testing of Haskell programsTristan O. R. Allwood, Cristian Cadar, Susan Eisenbach. ISSTA 2011: 375-385 [doi]

A multiple-population genetic algorithm for branch coverage test data generationMohammad Alshraideh, Basel A. Mahafzah, Saleh Al-Sharaeh. sqj, 19(3):489-513, 2011. [doi]

Combining Specification-based and Code-based Coverage for Model Transformation ChainsEduard Bauer, Jochen Kuester. ICMT 2011: 78-92

Software automated testing: A solution to maximize the test plan coverage and to increase software reliability and quality in useMarcantonio Catelani, Lorenzo Ciani, Valeria L. Scarano, Alessandro Bacioccola. csi, 33(2):152-158, 2011. [doi]

Low Coverage Analysis using dynamic un-testability debug in ATPGKameshwar Chandrasekar, Surendra Bommu, Sanjay Sengupta. vts 2011: 291-296 [doi]

Security Sensitive Data Flow Coverage Criterion for Automatic Security Testing of Web ApplicationsThanh-Binh Dao, Etsuya Shibayama. ESSoS 2011: 101-113 [doi]

Test Coverage of Data-Centric Dynamic Compositions in Service-Based SystemsWaldemar Hummer, Orna Raz, Onn Shehory, Philipp Leitner, Schahram Dustdar. icst 2011: 40-49 [doi]

Lazy symbolic execution for test data generationMengxiang Lin, Yin-li Chen, Kai Yu, Guo-shi Wu. iee, 5(2):132-141, 2011. [doi]

Transition coverage testing for simulink/stateflow models using messy genetic algorithmsJungsup Oh, Mark Harman, Shin Yoo. gecco 2011: 1851-1858 [doi]

Structural Test Coverage Criteria for Integration Testing of LUSTRE/SCADE ProgramsVirginia Papailiopoulou, Ajitha Rajan, Ioannis Parissis. fmics 2011: 85-101 [doi]

Improving test coverage using merged classification treeBalakrishnan Ramadoss, P. Prema, S. R. Balasundaram. icwet 2011: 752-757 [doi]

State Coverage Metrics for Specification-Based Testing with Büchi AutomataLi Tan. tap 2011: 171-186 [doi]

Coverage guided systematic concurrency testingChao Wang, Mahmoud Said, Aarti Gupta. ICSE 2011: 221-230 [doi]

A heuristic algorithm for reducing system-level test vectors with high branch coverageKoji Yamazaki, Yusuke Sekihara, Takashi Aoki, Eiichi Hosoya, Akira Onozawa. iscas 2011: 1475-1478 [doi]

Combined static and dynamic automated test generationSai Zhang, David Saff, Yingyi Bu, Michael D. Ernst. ISSTA 2011: 353-363 [doi]

2010

Mutation analysis vs. code coverage in automated assessment of students testing skillsKalle Aaltonen, Petri Ihantola, Otto Seppälä. OOPSLA 2010: 153-160 [doi]

Coverage Driven High-Level Test Generation Using a Polynomial Model of Sequential CircuitsBijan Alizadeh, Mohammad Mirzaei, Masahiro Fujita. tcad, 29(5):737-748, 2010. [doi]

Software Reliability Modeling with Integrated Test CoverageJinxia An, Jihong Zhu. ssiri 2010: 106-112 [doi]

Specification Coverage for Testing in ::::Circus::::Ana Cavalcanti, Marie-Claude Gaudel. utp 2010: 1-45 [doi]

A MATLAB-based technique for defect level estimation using data mining of test fallout data versus fault coverageKanad Chakraborty. isqed 2010: 418-421 [doi]

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test CostZhen Chen, Dong Xiang. tcad, 29(6):966-976, 2010. [doi]

Fault Coverage-Driven Incremental Test GenerationAdenilso da Silva Simão, Alexandre Petrenko. cj, 53(9):1508-1522, 2010. [doi]

Coverage Criteria for Automatic Security Testing of Web ApplicationsThanh-Binh Dao, Etsuya Shibayama. iciss 2010: 111-124 [doi]

RTL DFT Techniques to Enhance Defect Coverage for Functional Test SequencesHongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara. et, 26(2):151-164, 2010. [doi]

Test Coverage Analysis of UML Activity Diagrams for Interactive SystemsRicardo D. F. Ferreira, João C. P. Faria, Ana C. R. Paiva. quatic 2010: 268-274 [doi]

Test Coverage Analysis of UML State MachinesRicardo D. F. Ferreira, João C. P. Faria, Ana C. R. Paiva. icst 2010: 284-289 [doi]

An Empirical Evaluation to Study Benefits of Visual versus Textual Test Coverage InformationVahid Garousi, Negar Koochakzadeh. taicpart 2010: 189-193 [doi]

Object-oriented Testing beyond Statement CoveragePranshu Gupta, David A. Gustafson. caine 2010: 150-155

Coverage Management with Inline Assertions and Formal Test PointsAritra Hazra, Priyankar Ghosh, Pallab Dasgupta, Partha Pratim Chakrabarti. vlsid 2010: 140-145 [doi]

A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length ConstraintRyoichi Inoue, Toshinori Hosokawa, Hideo Fujiwara. ieicet, 93-D(1):24-32, 2010. [doi]

Feedback-Based Coverage Directed Test Generation: An Industrial EvaluationCharalambos Ioannides, Geoff Barrett, Kerstin Eder. hvc 2011: 112-128 [doi]

Automated Test Coverage Measurement for Reactor Protection System Software Implemented in Function Block DiagramEunkyoung Jee, Suin Kim, Sung Deok Cha, Insup Lee. safecomp 2010: 223-236 [doi]

Defect Coverage-Driven Window-Based Test CompressionXrysovalantis Kavousianos, Krishnendu Chakrabarty, Emmanouil Kalligeros, Vasileios Tenentes. ats 2010: 141-146 [doi]

TeCReVis: A Tool for Test Coverage and Test Redundancy VisualizationNegar Koochakzadeh, Vahid Garousi. taicpart 2010: 129-136 [doi]

100 Coverage for Safety-Critical Software - Efficient Testing by Static AnalysisDaniel Kästner, Reinhold Heckmann, Christian Ferdinand. safecomp 2010: 196-209 [doi]

Testing Product Generation in Software Product Lines Using Pairwise for Features CoverageBeatriz Pérez Lamancha, Macario Polo Usaola. pts 2010: 111-125 [doi]

Test coverage for collaborative workflow application based on Petri NetZhenyu Liu, Tiejiang Liu, Lizhi Cai, Genxing Yang. cscwd 2010: 213-218 [doi]

The impact of Test-First programming on branch coverage and mutation score indicator of unit tests: An experimentLech Madeyski. INFSOF, 52(2):169-184, 2010. [doi]

Fault coverage of Constrained Random Test Selection for access control: A formal analysisAmmar Masood, Arif Ghafoor, Aditya P. Mathur. jss, 83(12):2607-2617, 2010. [doi]

A Dependence Representation for Coverage Testing of Object-Oriented ProgramsE. S. F. Najumudheen, Rajib Mall, Debasis Samanta. jot, 9(4):1-23, 2010. [doi]

Designing Test Coverage for Grey Box AnalysisFaizah Omar, Suhaimi Ibrahim. qsic 2010: 353-356 [doi]

Guided test generation for coverage criteriaRahul Pandita, Tao Xie, Nikolai Tillmann, Jonathan de Halleux. ICSM 2010: 1-10 [doi]

On Bias in Transition Coverage of Test Sets for Path Delay FaultsIrith Pomeranz, Sudhakar M. Reddy. ats 2010: 349-352 [doi]

Diagnosis of path delay faults based on low-coverage testsIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 4(2):89-103, 2010. [doi]

Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Scan-Based TestsIrith Pomeranz, Sudhakar M. Reddy. tvlsi, 18(2):333-337, 2010. [doi]

Coverage optimization for Minimization of Drive Tests in LTE with extended RLF reportingJani Puttonen, Jussi Turkka, Olli Alanen, Janne Kurjenniemi. pimrc 2010: 1764-1768 [doi]

Improving the tests coverage of a medium voltage protection device using system simulation approachesKhaled Rahmouni, Frédéric Pétrot. sies 2010: 184-187 [doi]

Maximizing GUI Test Coverage Through Particle Swarm OptimizationAbdul Rauf, Naveed Kazim, Sajid Anwar, Shafiq-Ur Rehman, Arshad Ali Shahid. sede 2010: 51-56

Evolutionary Based Automated Coverage Analysis for GUI TestingAbdul Rauf, Sajid Anwar, Naveed Kazim, Arshad Ali Shahid. ic3 2010: 456-466 [doi]

Automated GUI Test Coverage Analysis Using GAAbdul Rauf, Sajid Anwar, M. Arfan Jaffer, Arshad Ali Shahid. itng 2010: 1057-1062 [doi]

Open Code Coverage Framework: A Consistent and Flexible Framework for Measuring Test Coverage Supporting Multiple Programming LanguagesKazunori Sakamoto, Hironori Washizaki, Yoshiaki Fukazawa. qsic 2010: 262-269 [doi]

Coverage metrics for verification of concurrent SystemC designs using mutation testingAlper Sen, Magdy S. Abadir. hldvt 2010: 75-81 [doi]

Improved Launch for Higher TDF Coverage With Fewer Test PatternsYouhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki. tcad, 29(8):1294-1299, 2010. [doi]

The Pushdown Automaton and Its Coverage Criterion for Testing Undo/Redo Functions of SoftwareTomohiko Takagi, Zengo Furukawa. ACISicis 2010: 770-775 [doi]

Concurrent N-Switch Coverage Criterion for Generating Test Cases from Place/Transition NetsTomohiko Takagi, Naoya Oyaizu, Zengo Furukawa. ACISicis 2010: 782-787 [doi]

DyGen: Automatic Generation of High-Coverage Tests via Mining Gigabytes of Dynamic TracesSuresh Thummalapenta, Jonathan de Halleux, Nikolai Tillmann, Scott Wadsworth. tap 2010: 77-93 [doi]

Visualisation of Test Coverage for Conformance Tests of Low Level Communication ProtocolsKatharina Tschumitschew, Frank Klawonn, Nils Obermöller, Wolfhard Lawrenz. kes 2010: 244-252 [doi]

Full predicate coverage for testing SQL database queriesJavier Tuya, María José Suárez Cabal, Claudio de la Riva. stvr, 20(3):237-288, 2010. [doi]

Increasing Functional Coverage by Inductive Testing: A Case StudyNeil Walkinshaw, Kirill Bogdanov, John Derrick, Javier Paris. pts 2010: 126-141 [doi]

A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture SchemesF. Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, X. Wen, Nisar Ahmed. jolpe, 6(2):359-374, 2010. [doi]

A diagnostic test generation system and a coverage metricYu Zhang, Vishwani D. Agrawal. ets 2010: 254 [doi]

Event Handler-Based Coverage for GUI TestingLei Zhao, Kai-Yuan Cai. qsic 2010: 326-331 [doi]

2009

Structural Coverage Criteria for Testing SQL QueriesMarÃa JosÃ© SuÃ¡rez Cabal, Javier Tuya. jucs, 15(3):584-619, 2009. [doi]

The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test CostZhen Chen, Dong Xiang, Boxue Yin. vts 2009: 146-151 [doi]

Conflict driven scan chain configuration for high transition fault coverage and low test powerZhen Chen, Boxue Yin, Dong Xiang. aspdac 2009: 666-671 [doi]

Recomputing Coverage Information to Assist Regression TestingPavan Kumar Chittimalli, Mary Jean Harrold. TSE, 35(4):452-469, 2009. [doi]

Coverage-guided test generation for continuous and hybrid systemsThao Dang, Tarik Nahhal. fmsd, 34(2):183-213, 2009. [doi]

A methodology for evaluating test coverage criteria of high levelPetri netsJunhua Ding, Peter J. Clarke, Gonzalo Argote-Garcia, Xudong He. INFSOF, 51(11):1520-1533, 2009. [doi]

Testing Timed Finite State Machines with Guaranteed Fault CoverageKhaled El-Fakih, Nina Yevtushenko, HacÃ¨ne Fouchal. pts 2009: 66-80 [doi]

Increasing Diversity in Coverage Test Suites Using Model CheckingGordon Fraser, Franz Wotawa. qsic 2009: 211-218 [doi]

Automatic Test Data Generation for Multiple Condition and MCDC CoverageKamran Ghani, John A. Clark. icsea 2009: 152-157 [doi]

Applying Testability Transformations to Achieve Structural Coverage of Erlang ProgramsQiang Guo, John Derrick, Neil Walkinshaw. pts 2009: 81-96 [doi]

Addressing Defect Coverage through Generating Test Vectors for Transistor DefectsYoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu. ieicet, 92-A(12):3128-3135, 2009. [doi]

Generation of compact test sets with high defect coverageXrysovalantis Kavousianos, Krishnendu Chakrabarty. date 2009: 1130-1135 [doi]

Test Coverage Metric for Two-Staged Language with Abstract InterpretationTaeksu Kim, Chunwoo Lee, Kiljoo Lee, Soohyun Baik, Chisu Wu, Kwangkeun Yi. apsec 2009: 301-308 [doi]

Randomized Testing in PLT RedexCasey Klein, Robby Findler. In Workshop on Scheme and Functional Programming (SFP). 2009:

Test Redundancy Measurement Based on Coverage Information: Evaluations and Lessons LearnedNegar Koochakzadeh, Vahid Garousi, Frank Maurer. icst 2009: 220-229 [doi]

Factor oriented requirement coverage based system test case prioritization of new and regression test casesR. Krishnamoorthi, S. A. Sahaaya Arul Mary. INFSOF, 51(4):799-808, 2009. [doi]

Field test and experimental characterization of 5GHz RF tranceivers for coverage extensionIl-Gu Lee, Jungbo Son, Sok-Kyu Lee. wcnc 2009: 2486-2489 [doi]

Multi-robot formations for area coverage in space applicationsJuxi Leitner. Master's thesis, Helsinki University of Technology, Espoo, Finland, 2009.

Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL CircuitsLoganathan Lingappan, Vijay Gangaram, Niraj K. Jha, Sreejit Chakravarty. tvlsi, 17(5):697-708, 2009. [doi]

Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?Marcelo Lubaszewski. dft 2009: 224-224 [doi]

Calculating BPEL Test Coverage Through InstrumentationDaniel Lübke, Leif Singer, Alex Salnikow. ICSE 2009: 115-122 [doi]

Test coverage and post-verification defects: A multiple case studyAudris Mockus, Nachiappan Nagappan, Trung T. Dinh-Trong. esem 2009: 291-301 [doi]

The influence of size and coverage on test suite effectivenessAkbar Siami Namin, James H. Andrews. ISSTA 2009: 57-68 [doi]

Test vector chains for increasing the fault coverage and numbers of detectionsIrith Pomeranz, Sudhakar M. Reddy. iet-cdt, 3(2):222-233, 2009. [doi]

Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Functional Test SequencesIrith Pomeranz, Sudhakar M. Reddy. dft 2009: 358-366 [doi]

Automatic generation of test specifications for coverage of system state transitionsMonalisa Sarma, Rajib Mall. INFSOF, 51(2):418-432, 2009. [doi]

Interpreting a Successful Testing Process: Risk and Actual CoverageMariÃ«lle Stoelinga, Mark Timmer. tase 2009: 251-258 [doi]

Usage Distribution Coverage: What Percentage of Expected Use Has Been Executed in Software Testing?Tomohiko Takagi, Kazuya Nishimachi, Masayuki Muragishi, Takashi Mitsuhashi, Zengo Furukawa. In Roger Y. Lee, Naohiro Ishii, editors, Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing. Volume 209 of Studies in Computational Intelligence, pages 57-67, Springer, 2009. [doi]

Compact Delay Test Generation with a Realistic Low Cost Fault Coverage MetricZheng Wang, Duncan M. Hank Walker. vts 2009: 59-64 [doi]

Using coverage to automate and improve test purpose based testingMartin Weiglhofer, Gordon Fraser, Franz Wotawa. INFSOF, 51(11):1601-1617, 2009. [doi]

Improving Coverage Based Test PurposesMartin Weiglhofer, Franz Wotawa. qsic 2009: 219-228 [doi]

Semantic-Preserving Test Model Transformationsfor Interchangeable Coverage CriteriaStephan Weißleder. mbees 2009: 26-35 [doi]

Statistical multilayer process space coverage for at-speed testJinjun Xiong, Yiyu Shi, Vladimir Zolotov, Chandu Visweswariah. dac 2009: 340-345 [doi]

A Survey of Coverage-Based Testing ToolsQian Yang, J. Jenny Li, David M. Weiss. cj, 52(5):589-597, 2009. [doi]

On the Coverage of Program Code by Specification-Based TestsY. T. Yu, Eric Y. K. Chan, Pak-Lok Poon. qsic 2009: 41-50 [doi]

Prioritizing JUnit test cases in absence of coverage informationLingming Zhang, Ji Zhou, Dan Hao, Lu Zhang, Hong Mei. ICSM 2009: 19-28 [doi]

Jtop: Managing JUnit Test Cases in Absence of Coverage InformationLingming Zhang, Ji Zhou, Dan Hao, Lu Zhang, Hong Mei. kbse 2009: 677-679 [doi]

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