Journal: IEEE T. Instrumentation and Measurement

Volume 52, Issue 6

1694 -- 1695Nohpill Park, Fabrizio Lombardi. Guest Editorial
1696 -- 1702Vishal Sahni, V. Prem Pyara. An embryonic approach to reliable digital instrumentation based on evolvable hardware
1703 -- 1712Cristiana Bolchini, Luigi Pomante, Fabio Salice, Donatella Sciuto. The design of reliable devices for mission-critical applications
1713 -- 1721Byoungjae Jin, Nohpill Park, Kayikkalthop M. George, Minsu Choi, Mark B. Yeary. Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems
1722 -- 1728Luca Schiano, Cecilia Metra, Diego Marino. Self-checking design, implementation, and measurement of a controller for track-side railway systems
1729 -- 1737Petros Drineas, Yiorgos Makris. SPaRe: selective partial replication for concurrent fault-detection in FSMs
1738 -- 1748Tian Xia, Jien-Chung Lo. Time-to-voltage converter for on-chip jitter measurement
1749 -- 1755Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max. Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment
1756 -- 1764Marco S. Dragic, Martin Margala. A versatile built-in CMOS sensing device for digital circuit parametric test
1765 -- 1770Michele Norgia, Silvano Donati. A displacement-measuring instrument utilizing self-mixing interferometry
1771 -- 1779Trent McConaghy, Henry Leung, Éloi Bossé, Vinay Varadan. Classification of audio radar signals using radial basis function neural networks
1780 -- 1786Mohamed Hafed, Gordon W. Roberts. Techniques for high-frequency integrated test and measurement
1787 -- 1791Seung Ho Hong, In-Ho Choi. Experimental evaluation of a bandwidth allocation scheme for foundation fieldbus
1792 -- 1798Jordi Salazar, Antoni Turó, Juan Antonio Chávez, Juan A. Ortega, Miguel Jesus García. High-power high-resolution pulser for air-coupled ultrasonic NDE applications
1799 -- 1808Hakim Khali, Yvon Savaria, Jean-Louis Houle, Marc Rioux, J.-Angelo Beraldin, D. Poussart. Improvement of sensor accuracy in the case of a variable surface reflectance gradient for active laser range finders
1809 -- 1814Luigi Fortuna, Mattia Frasca, Alessandro Rizzo. Chaotic pulse position modulation to improve the efficiency of sonar sensors
1815 -- 1819Sergey N. Kharkovsky, Ugur Cem Hasar. Measurement of mode patterns in a high-power microwave cavity
1820 -- 1824Daniel Nordin, Kalevi Hyyppä. Single-stage photodiode op-amp solution suited for a self-mixing FMCW system
1825 -- 1833Nicholas G. Paulter Jr., Andrew J. A. Smith, Donald R. Larson, T. M. Souders, A. G. Roddie. NIST-NPL interlaboratory pulse measurement comparison
1834 -- 1837Wendy Van Moer, Yves Rolain. Proving the usefulness of a three-port nonlinear vectorial network analyzer through mixer measurements
1838 -- 1845Sheng-Jen Hsieh, Clarence E. Rash, Thomas H. Harding, Howard H. Beasley, John S. Martin. Helmet-mounted display image quality evaluation system
1846 -- 1853M. Bahoura, André Clairon. Diode laser phase noise influence on the ultimate performance of its frequency stabilization to a Mach-Zehnder interferometer fringe
1854 -- 1858Thilo Sauter, Herbert Nachtnebel. A feasible noise estimation algorithm for resource-limited sensor systems
1859 -- 1864Kati Sulonen, Pertti Vainikainen. Performance of mobile phone antennas including effect of environment using two methods
1865 -- 1869Kok Wai Wong, Chun Che Fung, Halit Eren, Tom Gedeon. Fuzzy rule interpolation for multidimensional input spaces in determining d50c of hydrocyclones
1870 -- 1880Abdullah Al Mamun, Tong Heng Lee, Guoxiao Guo, Wai Ee Wong, W. C. Ye. Measurement of position offset in hard disk drive using dual frequency servo bursts
1886 -- 1891Bertalan Eged, László Balogh. Analytical calculation of the impedance of lossy power/ground planes
1892 -- 1897Bruno Casadei, Jean-Piere Le Normand, Yann Hu, Bernard Cunin. Design and characterization of a fast CMOS multiple linear array imager for nanosecond light pulse detections
1898 -- 1902Pietro Fiorentin. Effect of the finite memory length of a recorder in evaluating its frequency response from step response

Volume 52, Issue 5

1350 -- 1352Sunil R. Das, Rochit Rajsuman. Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]
1353 -- 1362Krishnendu Chakrabarty, Markus Seuring. Space compaction of test responses using orthogonal transmission functions [logic testing]
1363 -- 1380Sunil R. Das, M. Sudarma, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Krishnendu Chakrabarty, Mehmet Sahinoglu. Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets
1381 -- 1390Wen-Ben Jone, Der-Chen Huang, Sunil R. Das. An efficient BIST method for non-traditional faults of embedded memory arrays
1391 -- 1398Parag K. Lala, Alfred L. Burress. Self-checking logic design for FPGA implementation
1399 -- 1407San L. Lin, Shoba Krishnan, Samiha Mourad. A self-binning BIST structure for data communications transceivers
1408 -- 1427Rochit Rajsuman. Architecture, design, and application of an event-based test system
1428 -- 1443Mehmet Sahinoglu. An empirical Bayesian stopping rule in testing and verification of behavioral models
1444 -- 1454Jacob Savir, Zhen Guo. Test limitations of parametric faults in analog circuits
1455 -- 1457Amit M. Sheth, Jacob Savir. Single-clock, single-latch, scan design
1458 -- 1467Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai. A cost-effective wafer-level reliability test system for integrated circuit makers
1468 -- 1473Lörinc Antoni, Régis Leveugle, Béla Fehér. Using run-time reconfiguration for fault injection applications
1474 -- 1481Salvatore Baglio. Bio-geochemically inspired capacitive sensors for heavy metals pollution monitoring
1482 -- 1487Sebastian Yuri Cavalcanti Catunda, Jean-François Naviner, Gurdip Singh Deep, Raimundo Carlos Silvério Freire. Designing a programmable analog signal conditioning circuit without loss of measurement range
1488 -- 1493Soubhi Abou Chahine, Bernard Huyart, Joseph Achkar. Reflectometer calibration without an open circuit
1494 -- 1500Song Chen, De-Yin Jeng, Hironori Hadano, Yoshiaki Ishiguro, Masakatsu Nakayama, Kenzo Watanabe. A Nasicon CO::2:: gas sensor with drift-detection electrode
1501 -- 1508Tsenchieh Chiu. Dielectric constant measurement technique for a dielectric strip using a rectangular waveguide
1509 -- 1519Minsu Choi, Nohpill Park, Fabrizio Lombardi. Modeling and analysis of fault tolerant multistage interconnection networks
1520 -- 1527Konstantinos Christidis, G. P. Premasiri Gunarathne. Temperature compensation for ultrasound measurements and characterization of materials
1528 -- 1532U. Cilingiroglu, Siew Kuok Hoon. An optimally self-biased threshold-voltage extractor [MOSFET circuit parametric testing]
1533 -- 1536Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra. Micro-prober for wafer-level low-noise measurements in MOS devices
1537 -- 1547Kevin J. Coakley, C. M. Wang, Paul D. Hale, Tracy S. Clement. Adaptive characterization of jitter noise in sampled high-speed signals
1548 -- 1553Gustavo H. M. de Arruda, Péricles R. Barros. Relay-based gain and phase margins PI controller design
1554 -- 1558Rômulo Pires Coelho Ferreira, Raimundo Carlos Silvério Freire, Gurdip Singh Deep. Performance evaluation of a fluid temperature-compensated single sensor constant temperature anemometer
1559 -- 1565George C. Giakos, R. Guntupalli, J. Alexis De Abreu Garcia, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, N. Patnekar, S. Sumrain, K. Mehta, Edward A. Evans, A. Orozco, V. Kumar, Okechukwu C. Ugweje, A. Moholkar. Intrinsic sensitivity of Cd::1-x::Zn::x::Te semiconductors for digital radiographic imaging
1566 -- 1572George C. Giakos, Samir Chowdhury, N. Shah, S. Guntupalli, Srinivasan Vedantham, Sankararaman Suryanarayanan, Richard Nemer, A. Dasgupta, K. Mehta, Edward A. Evans, A. Orozco, V. Kumar, Luay Fraiwan, N. Patnekar. Signal dispersion measurements on the gas detector volume of a dual-energy multimedia digital imaging sensor
1573 -- 1580Gaetano Iuculano, Andrea Zanobini, Annarita Lazzari, G. P. Gualtieri. Measurement uncertainty in a multivariate model: a novel approach
1581 -- 1587Dileepan Joseph, Steve Collins. Modeling, calibration, and rendition of color logarithmic CMOS image sensors
1588 -- 1592V. Jagadeesh Kumar, P. Sankaran, K. Sudhakara Rao. Measurement of C and tanδ of a capacitor employing PSDs and dual-slope DVMs
1593 -- 1605Xi Li, Renbiao Wu, Srihari Rasmi, Jian Li, Louis N. Cattafesta, Mark Sheplak. Acoustic proximity ranging in the presence of secondary echoes
1606 -- 1610Sabine Long, Laurent Escotte, Jacques Graffeuil, F. Brasseau, J. L. Cazaux. On-wafer noise characterization of low-noise amplifiers in the Ka-band
1611 -- 1617David Macii, Paolo Carbone, Dario Petri. Management of measurement uncertainty for effective statistical process control
1618 -- 1626Nicholas G. Paulter Jr., Donald R. Larson. Sources of uncertainty in the nose-to-nose sampler calibration method
1627 -- 1634Pierre Payeur, Changzhong Chen. Registration of range measurements with compact surface representation
1635 -- 1639M. Schlaf, Hani A. Hagras, David Sands. Optimization strategies for parametric analysis of thin-film reflectivity spectra
1640 -- 1647Mohamed A. Suhail, Mohammad S. Obaidat. Digital watermarking-based DCT and JPEG model
1648 -- 1653Zdzislaw Szczepanik, Zbigniew Rucki, Zbigniew Moron. Finite-element analysis of the electric field distribution in conductance cell
1654 -- 1659Vladimir V. Terzija. Improved recursive Newton-type algorithm for frequency and spectra estimation in power systems
1660 -- 1664Hartwig W. Thim. Absence of the relativistic transverse Doppler shift at microwave frequencies
1665 -- 1673Gabriella Tognola, Marta Parazzini, Paolo Ravazzani, Ferdinando Grandori, Cesare Svelto. 3-D acquisition and quantitative measurements of anatomical parts by optical scanning and image reconstruction from unorganized range data
1674 -- 1681Wuqiang Yang, A. L. Stott, J. C. Gamio. Analysis of the effect of stray capacitance on an ac-based capacitance tomography transducer
1688 -- 1692Predrag Pejovic, Lazar Saranovac, Miodrag Popovic. Comments on New algorithm for measuring 50/60-Hz AC values based on the usage of slow A/D converters and Measuring of slowly changing AC signals without sample-and-hold circuit

Volume 52, Issue 4

994 -- 996Renato Sasdelli. Editorial [IMTC 2002]
997 -- 1003Chin E. Lin, Chih-Ching Li, An Sang Hou, Chih-Chen Wu. A real-time remote control architecture using mobile communication
1009 -- 1020José Ismael de la Rosa Vargas, Gilles Fleury, Marie-Eve Davoust. Minimum-entropy, PDF approximation, and kernel selection for measurement estimation
1021 -- 1024Johan Schoukens, Yves Rolain, Gyula Simon, Rik Pintelon. Fully automated spectral analysis of periodic signals
1025 -- 1029Sebastian C. Schneider, Y. Gautam, Bernhard G. Zagar. Application of a locally operating laser-speckle strain sensor
1030 -- 1034Alain Geens, Wendy Van Moer, Yves Rolain. Measuring in-band distortions of mixers
1035 -- 1040Niksa Tadic, Desa Gobovic. A square-rooting current-to-frequency converter
1041 -- 1047Qiang Wang, Yi Shen, Ye Zhang, Jian Qiu Zhang. A quantitative method for evaluating the performances of hyperspectral image fusion
1048 -- 1053Matteo Bertocco, Ronny Tittoto, Edoardo Rizzi, Luigino Benetazzo. Statistical analysis of measurements for telecommunication-network troubleshooting
1054 -- 1060Piet M. T. Broersen, Stijn de Waele. Time series analysis in a frequency subband
1061 -- 1067Piet M. T. Broersen, Stijn de Waele. Generating data with prescribed power spectral density
1068 -- 1072Antonio J. López-Martín, Juan Ignacio Osa, Mikel Zuza, Alfonso Carlosena. Analysis of a negative impedance converter as a temperature compensator for bridge sensors
1073 -- 1078Loredana Cristaldi, Alessandro Ferrero, Carlo Muscas, Simona Salicone, Roberto Tinarelli. The impact of Internet transmission on the uncertainty in the electric power quality estimation by means of a distributed measurement system
1079 -- 1086Claudia Di Nucci, Ada Fort, Santina Rocchi, Luca Tondi, Valerio Vignoli, F. Di Francesco, M. Belén Serrano-Santos. A measurement system for odor classification based on the dynamic response of QCM sensors
1087 -- 1091Bernhard Schweighofer, Klaus M. Raab, Georg Brasseur. Modeling of high power automotive batteries by the use of an automated test system
1092 -- 1096Pawel Niewczas, Lukasz Dziuda, Grzegorz Fusiek, Andrew J. Willshire, James R. McDonald, G. Thursby, D. Harvey, W. Craig Michie. Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices
1097 -- 1106Leopoldo Angrisani, Massimo D Apuzzo, Mauro D Arco. A new method for power measurements in digital wireless communication systems
1107 -- 1113David I. Bergman, Bryan C. Waltrip. A low-noise latching comparator probe for waveform sampling applications
1114 -- 1119Michael Solomou, David Rees. Measuring the best linear approximation of systems suffering nonlinear distortions: an alternative method
1120 -- 1124Jan Obrzut, Aleksei Anopchenko. High-frequency input impedance characterization of dielectric films for power-ground planes
1125 -- 1128Dan Shi, Hongjian Zhang, Liming Yang. Time-delay neural network for the prediction of carbonation tower s temperature
1129 -- 1135Pier Andrea Traverso, Domenico Mirri, Gaetano Pasini, Fabio Filicori. A nonlinear dynamic S/H-ADC device model based on a modified Volterra series: identification procedure and commercial CAD tool implementation
1136 -- 1142Woei-Wan Tan, Reginald F. Y. Li. An in-situ temperature measurement system for DUV lithography
1143 -- 1147Lorenzo Peretto, Renato Sasdelli, Roberto Tinarelli. A statistical model for estimating the trend of electrical quantities in power systems
1148 -- 1154Fabrizio Russo. A method for estimation and filtering of Gaussian noise in images
1155 -- 1159Seiji Oda, Mitsuyoshi Anzai, Shoichi Uematsu, Kenzo Watanabe. A silicon micromachined flow sensor using thermopiles for heat transfer measurements
1160 -- 1165Raul Carneiro Martins, António Manuel da Cruz Serra. Representation and measurement of nonlinearities in stimulus signals
1166 -- 1173Rommanee Jirawimut, Simant Prakoonwit, Franjo Cecelja, Wamadeva Balachandran. Visual odometer for pedestrian navigation
1174 -- 1181Alessandro Ferrero, Simona Salicone. An innovative approach to the determination of uncertainty in measurements based on fuzzy variables
1182 -- 1189Domenico Capriglione, Consolatina Liguori, Cesare Pianese, Antonio Pietrosanto. On-line sensor fault detection, isolation, and accommodation in automotive engines
1190 -- 1194Gianluca Galzerano, Cesare Svelto, Elio Bava, Giorgio Carelli, M. Finotti, Augusto Moretti, Niccolò Beverini. High-stability 72-GHz Gunn oscillator for the characterization of ultra-high-speed optical receivers based on InP and InSb Schottky diodes
1195 -- 1199Luca Callegaro, Gianluca Galzerano, Cesare Svelto. Precision impedance measurements by the three-voltage method with a novel high-stability multiphase DDS generator
1200 -- 1205Francesco Adamo, Filippo Attivissimo, Nicola Giaquinto, Amerigo Trotta. A/D converters nonlinearity measurement and correction by frequency analysis and dither
1206 -- 1212Theodore Laopoulos, Periklis Neofotistos, C. A. Kosmatopoulos, Spiridon Nikolaidis. Measurement of current variations for the estimation of software-related power consumption [embedded processing circuits]
1213 -- 1219Alberto Lozano, Alfonso Carlosena. DSP-based implementation of an ANSI S1.11 acoustic analyzer
1220 -- 1223Marco Parvis, Guido Perrone, Alberto Vallan. A precompliance EMC test-set based on a sampling oscilloscope
1224 -- 1231Tran Hoai Linh, Stanislaw Osowski, Maciej Stodolski. On-line heart beat recognition using Hermite polynomials and neuro-fuzzy network
1232 -- 1238Johan Driesen, Ronnie Belmans. Wavelet-based power quantification approaches
1239 -- 1242Alessio Carullo, Marco Parvis, Alberto Vallan, Luca Callegaro. Automatic compensation system for impedance measurement
1243 -- 1250Pasquale Daponte, Gianpaolo Mercurio, Sergio Rapuano, Gioacchino Truglia. An image processing-based method for stress classification in digital telecommunication networks
1251 -- 1254Calogero Pace, Carmine Ciofi, Felice Crupi. Very low-noise, high-accuracy programmable voltage reference
1255 -- 1260Federico Baronti, Luca Fanucci, Diego Lunardini, Roberto Roncella, Roberto Saletti. A technique for nonlinearity self-calibration of DLLs
1261 -- 1265Georg Brasseur. Design rules for robust capacitive sensors
1266 -- 1272Andrew G. Morgan, Nick M. Ridler, Martin J. Salter. Generalized adaptive calibration schemes for precision RF vector network analyzer measurements
1273 -- 1278Giovanni Chiorboli. Uncertainty of mean value and variance obtained from quantized data
1279 -- 1283Emilia Nunzi, Paolo Carbone, Dario Petri. A procedure for highly reproducible measurements of ADC spectral parameters
1284 -- 1288Anne-Marie Jeffery, Andrew D. Koffman. Improved 1-kHz capacitance calibration uncertainty
1289 -- 1295Rajesh Luharuka, Robert X. Gao, Sundar Krishnamurty. Design and realization of a portable data logger for physiological sensing [GSR]
1296 -- 1301Changting Wang, Robert X. Gao. Wavelet transform with spectral post-processing for enhanced feature extraction [machine condition monitoring]
1302 -- 1307Antonio Moschitta, Dario Petri. Wideband communication system sensitivity to overloading quantization noise [ADC characterization]
1308 -- 1313Roman Z. Morawski, Andrzej Miekina, Tomasz Oleszczak, Andrzej Barwicz. Polarization-versed calibration of spectrophotometric transducers
1314 -- 1319Piotr S. Filipski, Michael Boecker. Experience with high-output-resistance MJTC AC-DC transfer standards at high frequencies [multijunction thermal converters]
1320 -- 1324Yoshio Tanimoto, Hirosuke Takechi, Akihiro Tokuhiro, Hideo Yamamoto. Measurements of pressure and sinking depth for mattress selection [spinal cord injured patients]
1325 -- 1334Tet H. Yeap, David K. Fenton, Pierre D. Lefebvre. A novel common-mode noise cancellation technique for VDSL applications
1335 -- 1340Petru Rusu, Emil M. Petriu, Thomas E. Whalen, Aurel Cornell, Hans J. W. Spoelder. Behavior-based neuro-fuzzy controller for mobile robot navigation

Volume 52, Issue 3

654 -- 661Fernando López-Peña, Richard J. Duro. A virtual instrument for automatic anemometer calibration with ANN based supervision
662 -- 674Yu Su, Charles R. Allen, David Geng, David J. Burn, Una Brechany, Geoffrey Duncan Bell, R. Rowland. 3-D motion system ( data-gloves ): application for Parkinson s disease
675 -- 680Lionel Valet, Gilles Mauris, Philippe Bolon, Naamen Keskes. A fuzzy linguistic-based software tool for seismic image interpretation
681 -- 685Matteo Bertocco, Sandro Cappellazzo, Alessio Carullo, Marco Parvis, Alberto Vallan. Virtual environment for fast development of distributed measurement applications
686 -- 692Fernando Pianegiani, David Macii, Paolo Carbone. An open distributed measurement system based on an abstract client-server architecture
693 -- 702Giovanni Moschioni. A virtual instrumentation system for measurements on the tallest medieval bell tower in Europe
703 -- 709Daniel Fischer, Barna Szabados, W. F. Skip Poehlman. Using a Bayes classifier to optimize alarm generation to electric power generator stator overheating
710 -- 715Alessandro Ferrero, Simona Salicone, Claudio Bonora, Marco Parmigiani. ReMLab: a Java-based remote, didactic measurement laboratory
716 -- 723Francesco Amigoni, Arnaldo Brandolini, Gabriele D Antona, Roberto Ottoboni, Marco Somalvico. Artificial intelligence in science of measurements: from measurement instruments to perceptive agencies
724 -- 732Juan Luis Crespo, Richard J. Duro, Fernando López-Peña. Gaussian synapse ANNs in multi- and hyperspectral image data analysis
733 -- 737Alessio Carullo, Marco Parvis, Alberto Vallan. An audio card-based kit for educational purposes
738 -- 741David W. Braudaway. The costs of calibration
748 -- 753Kenneth Vanhoenacker, Johan Schoukens. Detection of nonlinear distortions with multisine excitations in the case of nonideal behavior of the input signal
754 -- 761Hui Shao, Wei Jin, Shie Qian. Order tracking by discrete Gabor expansion
762 -- 770S. Baglio, Enrico Foti. Non-invasive measurements to analyze sandy bed evolution under sea waves action
771 -- 779Theodore Antonakopoulos, Eustathia Ziouva, Vassilios Makios. On mapping stochastic processes into hardware and its application on ATM traffic emulation
780 -- 784Chung-Bin Wu, Bin-Da Liu, Jar-Ferr Yang. A fuzzy-based impulse noise detection and cancellation for real-time processing in video receivers
785 -- 789Kay-Soon Low, Meng-Teck Keck. Advanced precision linear stage for industrial automation applications
790 -- 795Guillaume Gelle, Maxime Colas, Christine Servière. Blind source separation: a new pre-processing tool for rotating machines monitoring?
796 -- 803Bruno Andò, Annalisa Baeri, Ignazio Fragalà, Salvatore Graziani. A field point based approach for sensor conditioning in MO-CVD reactors
804 -- 808Paiboon Nakmahachalasint, Khai D. T. Ngo. High-temperature, high-frequency characterization system for power ferrites
809 -- 814Alireza K. Ziarani, Adalbert Konrad, Anthony N. Sinclair. A novel time-domain method of analysis of pulsed sine wave signals
815 -- 821Bruno Andò, Salvatore Graziani. An instrument for the detection of optimal working conditions in stochastic systems
822 -- 831Jacques Vanier, Martin W. Levine, Daniel Janssen, Michael J. Delaney. On the use of intensity optical pumping and coherent population trapping techniques in the implementation of atomic frequency standards
832 -- 838Xin Hu, Kevin W. Houser. A versatile spectral lamp measurement system
839 -- 845Franco Fiori, Francesco Musolino. Comparison of IC conducted emission measurement methods
846 -- 851Loredana Cristaldi, Alessandro Ferrero, Massimo Lazzaroni, Adriano P. Morando. Sensorless evaluation of asymmetric hysteresis loops of ferromagnetic materials
852 -- 858Andrea Murari, A. Hoffmann. Signal processing and calibration electronics for the SXR tomographic diagnostic of the RFX fusion experiment
859 -- 864Gabriel Abadal, Francesc Pérez-Murano, Nuria Barniol, X. Aymerich. The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips
871 -- 877Matteo Bertocco, Luca Garbin, Claudio Narduzzi. Correction of systematic effects in digitizing oscilloscopes
878 -- 884Remo Lombardi, Giuseppe Coldani, Giovanni Danese, R. Gandolfi, Francesco Leporati. Data acquisition system for measurements in free moving subjects and its applications
885 -- 890Colt R. Correa, Selim Saad Awad. Embedded controller software and algorithm development tool
891 -- 897Frank De Bisschop, Jan Vandewege, Wei Li, Marc De Mets. Low-frequency electronic gate detection for the counting and sizing of cells, bacteria, and colloidal particles in liquids
898 -- 902Yen-Wei Chen, Shusuke Narieda, Katsumi Yamashita. Blind nonlinear system identification based on a constrained hybrid genetic algorithm
903 -- 908Lorenzo Gonzo, Andrea Simoni, Massimo Gottardi, David Stoppa, J.-Angelo Beraldin. Sensors optimized for 3-D digitization
909 -- 915Valnyr Vasconcelos Lira, José Sérgio da Rocha Neto, P. Rezende Barros, Adrianus C. van Haandel. Automation of an anaerobic-aerobic wastewater treatment process
916 -- 920Amei Li, Xinqun Liu, Warwick Clegg, David F. L. Jenkins, Terrence Donnelly. Real-time method to measure head disk spacing variation under vibration conditions
921 -- 926Ada Fort, Nicola Machetti, Santina Rocchi, M. Belén Serrano-Santos, Luca Tondi, Nicola Ulivieri, Valerio Vignoli, Giorgio Sberveglieri. Tin oxide gas sensing: comparison among different measurement techniques for gas mixture classification
927 -- 931Zoltin Szabó, Géza Kolumbán. How to avoid false lock in SPLL frequency synthesizers
932 -- 937Paolo Ferrari, Alessandra Flammini, Daniele Marioli, Andrea Taroni. High-resolution multichannel instrument for resonant sensor array
938 -- 945Andrea Aiello, Domenico Grimaldi. Frequency error measurement in GMSK signals in a multipath propagation environment
946 -- 949Roland Holcer, Linus Michaeli, Ján Saliga. DNL ADC testing by the exponential shaped voltage
950 -- 958Rainer J. Fink, Mark B. Yeary, Mark Burns, David W. Guidry. A DSP-based technique for high-speed A/D conversion to generate coherently sampled sequences
959 -- 965Andrea Bernieri, Giovanni Betta, Luigi Ferrigno. Improving nondestructive testing probe performance by digital processing techniques
966 -- 972Michal Wisniewski, Roman Z. Morawski, Andrzej Barwicz. An adaptive rational filter for interpretation of spectrometric data
973 -- 977Ali Iraqi, Andrzej Barwicz, Paul Mermelstein, Roman Z. Morawski, Wojtek J. Bock. Design of a wireless communications module for telemetry in civil infrastructure monitoring
978 -- 983Pasquale Arpaia, Felice Cennamo, Pasquale Daponte, Harald Schumny. Modeling and characterization of sigma-delta analog-to-digital converters
984 -- 989Kostas N. Tarchanidis, John N. Lygouras. Data glove with a force sensor
990 -- 0Ángel Custodio, Ramon Pallas-Areny, Ramon Bragós. Correction to Error analysis and reduction for a simple sensor-microcontroller interface

Volume 52, Issue 2

227 -- 231John L. Hall, Jun Ye. Optical frequency standards and measurement
232 -- 235Long Sheng Ma, Lennart Robertsson, Susanne Picard, Jean-Marie Chartier, H. Karlsson, E. Prieto, Robert Windeler. The BIPM laser standards at 633 nm and 532 nm simultaneously linked to the SI second using a femtosecond laser in an optical clock configuration
236 -- 239Susanne Picard, Lennart Robertsson, Long Sheng Ma, Y. Millerioux, Patrick Juncar, Jean-Pierre Wallerand, Petr Balling, Petr Krin, Kaj Nyholm, Mikko Merimaa, Tero E. Ahola, Feng-Lei Hong. Results from international comparisons at the BIPM providing a world-wide reference network of :::127:::I::2:: stabilized frequency-doubled Nd: YAG lasers
240 -- 244Feng-Lei Hong, Jun Ishikawa, Kazuhiko Sugiyama, Kazuhik Onae, Hirokazu Matsumoto, Jun Ye, John L. Hall. Comparison of independent optical frequency measurements using a portable iodine-stabilized Nd: YAG laser
245 -- 249U. Tanaka, James C. Bergquist, Sebastien Bize, Scott A. Diddams, R. E. Drullinger, Leo Hollberg, Wayne M. Itano, Carol E. Tanner, David J. Wineland. Optical frequency standards based on the :::199:::Hg:::+::: ion
250 -- 254Jürgen Helmcke, Guido Wilpers, Tomas Binnewies, Carsten Degenhardt, Uwe Sterr, Harald Schnatz, Fritz Riehle. Optical frequency standard based on cold Ca atoms
255 -- 257Irène Courtillot, Audrey Quessada, Richard P. Kovacich, Jean-Jacques Zondy, Arnaud Landragin, Giorgio Santarelli, André Clairon, Pierre Lemonde. Cold strontium atoms for an optical frequency standard
258 -- 262Jacques Vanier, Martin W. Levine, Daniel Janssen, Michael J. Delaney. The coherent population trapping passive frequency standard [Rb example]
263 -- 266Taeg Yong Kwon, Ho Seong Lee, Sung Hoon Yang, Sang-Eon Park. Development of a cesium atomic fountain frequency standard
267 -- 271Filippo Levi, Luca Lorini, Davide Calonico, Aldo Godone. Systematic shift uncertainty evaluation of IEN CSF1 primary frequency standard
272 -- 276A. A. Madej, M. Ball. Iodine stabilized dye laser system for frequency measurements in the visible and near IR region of the spectrum
277 -- 279Sang-Eon Park, Taeg Yong Kwon, Ho Seong Lee. Production of Raman laser beams using injection-locking technique
280 -- 283Sang-Eon Park, Taeg Yong Kwon, Eun-joo Shin, Ho Seong Lee. A compact extended-cavity diode laser with a Littman configuration
284 -- 287Kaj Nyholm, Mikko Merimaa, Tero E. Ahola, Antti Lassila. Frequency stabilization of a diode-pumped Nd: Yag laser at 532 nm to iodine by using third-harmonic technique
288 -- 291Frédéric du Burck, Olivier Lopez, A. El Basri. Narrow-band correction of the residual amplitude modulation in frequency-modulation spectroscopy
292 -- 296Simon Rainville, James K. Thompson, David E. Pritchard. Two ions in one trap: ultra-high precision mass spectrometry?
297 -- 301Fengchao Xiao, Fadhel M. Ghannouchi, Toshiyuki Yakabe. Application of a six-port wave-correlator for a very low velocity measurement using the Doppler effect
302 -- 305Anton Widarta, Tomoteru Kawakami. Attenuation measurement system in the frequency range of 10 to 100 MHz
306 -- 310H. Nakano, H. Murakami, T. Inoue, Y. Kato. An experiment for verification of the auxiliary transmission-line method to evaluate a microwave thermal noise source
311 -- 315Ulrich Stumper. Influence of TMSO calibration standards uncertainties on VNA S-parameter measurements
316 -- 319Ilona Rolfes, Burkhard Schiek. LRR-a self-calibration technique for the calibration of vector network analyzers
320 -- 323Luciano Brunetti, Emil T. Vremera. A new microcalorimeter for measurements in 3.5-mm coaxial line
324 -- 327Thomas Musch. A high precision 24-GHz FMCW radar based on a fractional-N ramp-PLL
328 -- 332Ling Hao, John C. Gallop, John C. Macfarlane. Coupled microwave resonators as the basis for sensitive bolometric detection
333 -- 336Nicolas Gagnon, Jafar Shaker, Pierre Berini, Langis Roy, Aldo Petosa. Material characterization using a quasi-optical measurement system
337 -- 340Umberto Pogliano. Frequency band requirement for a precision RMS measurement system based on successive extraction of the means of absolute values
341 -- 344Milos Stojanovic, Manfred Klonz, Borislav Stojanovic. High performance millivolt-amplifier for the planar multijunction thermal converter
345 -- 349Luciana Scarioni, Manfred Klonz, David Janik, Héctor Laiz, Marian Kampik. High-frequency thin-film multijunction thermal converter on a quartz crystal chip
350 -- 354Héctor Laiz, Manfred Klonz, Ernst Kessler, Marian Kampik, Rado Lapuh. Low-frequency AC-DC voltage transfer standards with new high-sensitivity and low-power-coefficient thin-film multijunction thermal converters
355 -- 358Borislav Stojanovic, Manfred Klonz, Héctor Laiz, S. Kraicanic. AC-DC voltage transfer module with thin-film multijunction thermal converter
359 -- 362Hitoshi Sasaki, Hirotake Yamamori, Hiroyuki Fujiki, Kunihiko Takahashi, Akira Shoji. Measurement of thermoelectric effects in a thermal converter using a NbN/TiN/NbN Josephson junction array
363 -- 366Ling Xiang Liu, Sze Wey Chua, Chee Kiang Ang. Behavior and frequency dependence of AC-DC high voltage transfer standard under humidity step changes
367 -- 370Gregory A. Kyriazis. Extension of Swerlein s algorithm for AC voltage measurement in the frequency domain
371 -- 374Waldemar G. Kürten Ihlenfeld, Enrico Mohns, Hans Bachmair, Günther Ramm, Harald Moser. Evaluation of the synchronous generation and sampling technique
375 -- 379Umberto Pogliano, Gian Carlo Bosco, Vincenzo D Elia. Extension of the IEN traceability for AC voltages below 200 mV
380 -- 383Luca Callegaro, Gian Carlo Bosco, Vincenzo D Elia, Danilo Serazio. Direct-reading absolute calibration of AC voltage ratio standards
384 -- 387Rae Duk Lee, Han Jun Kim, Yu. P. Semyonov. Precise ratio transformer: a new concept of the magnetic system
388 -- 391Andrew C. Corney. Digital generator assisted impedance bridge
396 -- 399Günther Ramm, Harald Moser. Calibration of electronic capacitance and dissipation factor bridges
400 -- 403Jari K. Hällström, Yury Chekurov, Martti M. Aro. A calculable impulse voltage calibrator for calibration of impulse digitizers
404 -- 407Yi Li, Juris Rungis, Terry R. McComb. Comparative impulse voltage measurements at the National Measurement Laboratory (NML), CSIRO, Australia, and the Institute for National Measurement Standards (INMS), NRC, Canada
408 -- 410Daniel Slomovitz. Electronic system for increasing the accuracy of in-service instrument-current transformers
411 -- 414Réjean Arseneau, Michelle E. Sutherland, John J. Zelle. A new transfer device for the NRC Travelling Standard Program
419 -- 423Giancarlo Marullo-Reedtz, Roberto Cerri, Isabelle Blanc, Ove Gunnarsson, Jonathan M. Williams, Felix Raso, Kyu-Tae Kim, Robert B. Frenkel, Zhang Xiuzeng, Alexander S. Katkov, Ronald Dziuba, Mark Parker, Barry M. Wood, Laurie A. Christian, Eddie Tarnow, Surender K. Mahajan, Ajeet Singh, Yasuhiko Sakamoto. Comparison CCEM-K8 of DC voltage ratio: results
424 -- 428Eddy So, Réjean Arseneau, David Bennett, Thomas L. Nelson, Bryan C. Waltrip. NRC-NIST intercomparison of calibration systems for current transducers with a voltage output at power frequencies
429 -- 432Eddy So, Réjean Arseneau, Ernst Hanique. No-load loss measurements of power transformers under distorted supply voltage waveform conditions
433 -- 435Vladlen Ya. Shifrin, Vyacheslav N. Khorev, A. Ye. Shilov, Po Gyu Park. The long-term stability of an atomic magnetic resonance standard system for the reproduction of direct current and magnetic flux density
436 -- 439Gerd-Dietmar Willenberg, H. N. Tauscher, Peter Warnecke. A traceable precision current source for currents between 100 aA and 10 pA
440 -- 444Gunnar Fernqvist, Gregory Hudson, John Pickering, Francis Power. Design and evaluation of a 10-mA DC current reference standard
445 -- 448Gunnar Fernqvist, Bjorn Halvarsson, John G. Pett, John Pickering. A novel current calibration system up to 20 kA
449 -- 453Gert Rietveld, Chris V. Koijmans, Lesley C. A. Henderson, Michael J. Hall, Stuart Harmon, Peter Warnecke, Bernd Schumacher. DC conductivity measurements in the Van der Pauw geometry
454 -- 456Clark A. Hamilton, Larry W. Tarr. Projecting Zener DC reference performance between calibrations
457 -- 460Luis Alexandre Rocha, Edmond Cretu, Reinoud F. Wolffenbuttel. Stability of a micromechanical pull-in voltage reference
461 -- 464Harald Slinde, Kare Lind. A precision setup and method for calibrating a DC voltage divider s ratios from 10 V to 1000 V
465 -- 468Yasuhiko Sakamoto, Hiroyuki Fujiki. DC voltage divider calibration system at NMIJ
469 -- 473Kyu-Tae Kim, Sang Hwa Lee, Jae Kap Jung, Yang Sup Song. Method to determine the voltage coefficient of a DC high-voltage divider
474 -- 477Dean G. Jarrett, Ronald F. Dziuba. CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards
478 -- 482Davey D. L. Wijngaards, Reinoud F. Wolffenbuttel. Study on temperature stability improvement of on-chip reference elements using integrated Peltier coolers
491 -- 494Nien-Fan Zhang, Nell Sedransk, Dean G. Jarrett. Statistical uncertainty analysis of key comparison CCEM-K2
495 -- 499Panu Helistö, Heikki Seppä. Analysis of international comparisons with the minimum variance method
500 -- 503Giovanni Durando, Giovanni Mana, Fabrizio Mazzoleni. Accuracy assessment of data analysis in absolute gravimetry
504 -- 507Alain Picard, Hao Fang. Methods to determine the density of moist air
508 -- 511David B. Newell, John A. Kramar, Jon R. Pratt, Douglas T. Smith, Edwin R. Williams. The NIST microforce realization and measurement project
512 -- 515Se Il Park, Hyun Kwon Hong. Development of 10-V Josephson series arrays
516 -- 520Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, François P. M. Piquemal, Ralf Behr, Charles J. Burroughs, Heikki Seppä. Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays
521 -- 523Ralf Behr, Torsten Funck, Bernd Schumacher, Peter Warnecke. Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays
524 -- 528Ralf Behr, Johannes Kohlmann, Theodoor J. B. M. Janssen, Peter Kleinschmidt, Jonathan M. Williams, Sophie Djordjevic, Jean-Pierre Lo-Hive, François P. M. Piquemal, Per-Otto Hetland, Dominique Reymann, Gunnar Eklund, Christian Hof, Blaise Jeanneret, Oleg A. Chevtchenko, Ernest Houtzager, Helko E. van den Brom, Andrea Sosso, Domenico Andreone, Jaani Nissilä, Panu Helistö. Analysis of different measurement setups for a programmable Josephson voltage standard
529 -- 532Alexander M. Klushin, Alexander V. Komkov, Valentina D. Gelikonova, Solomon I. Borovitskii, M. Siegel. DC voltage calibrator based on an array of high-temperature superconductor Josephson junctions
533 -- 537Panu Helistö, Jaani Nissilä, Kari Ojasalo, Jari S. Penttilä, Heikki Seppä. AC voltage standard based on a programmable SIS array
538 -- 541Ilya Budovsky, Hitoshi Sasaki, P. Coogan. AC-DC transfer comparator for the calibration of thermal voltage converters against Josephson alternating voltage standards
542 -- 544Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus. AC Josephson voltage standard error measurements and analysis
545 -- 549Samuel P. Benz, John M. Martinis, Paul D. Dresselhaus, Sae Woo Nam. An AC Josephson source for Johnson noise thermometry
550 -- 554Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Weston L. Tew, Rod White, John M. Martinis. Johnson noise thermometry measurements using a quantized voltage noise source for calibration
555 -- 558A. Bounouh, W. Poirier, François P. M. Piquemal, Gérard Genevès, J. P. André. Quantum resistance standards with double 2DEG
559 -- 562A. D. Inglis, Barry M. Wood, M. Cote, R. B. Young, Murray D. Early. Direct determination of capacitance standards using a quadrature bridge and a pair of quantized Hall resistors
563 -- 568Jürgen Melcher, Jürgen Schurr, Klaus Pierz, Jonathan M. Williams, Stephen P. Giblin, F. Cabiati, Luca Callegaro, Giancarlo Marullo-Reedtz, Cristina Cassiago, Beat Jeckelmann, Blaise Jeanneret, Frédéric Overney, Jaroslav Bohacek, J. Riha, O. Power, J. Murray, Mario Nunes, M. Lobo, I. Godinho. The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect
569 -- 573A. D. Inglis, Barry M. Wood, M. Cote, R. B. Young, Murray D. Early. Plateau flatness in the ACQHR: do gates really help?
574 -- 578Frédéric Overney, Blaise Jeanneret, Beat Jeckelmann. Effects of metallic gates on AC measurements of the quantum Hall resistance
579 -- 583Brian W. Ricketts, John R. Fiander, H. Leigh Johnson, Greig W. Small. Four-port AC quantized Hall resistance measurements
584 -- 589Helko E. van den Brom, Oswin Kerkhof, Sergey V. Lotkhov, Sergey. A. Bogoslovsky, Gerd-Dietmar Willenberg, Hansjörg Scherer, Alexander B. Zorin, S. Pedersen, C. Kristoffersson, A. Aassime, Per Delsing, Marian A. Taslakov, Z. Ivanov, Håkan Nilsson, Stephen P. Giblin, Peter Kleinschmidt, Christian Hof, Ali L. Eichenberger, Frédéric Overney, Blaise Jeanneret, Gérard Genevès, Nicolas Feltin, Laurent Devoille, Frederic Gay, François P. M. Piquemal. Counting electrons one by one-overview of a joint European research project
590 -- 593Randolph E. Elmquist, Neil M. Zimmerman, William H. Huber. Using a high-value resistor in triangle comparisons of electrical standards
594 -- 598Jens Ebbecke, Nicholas E. Fletcher, Franz-Josef Ahlers, A. Hartland, Jan-Theodor B. M. Janssen. Study of the limitations of the quantized acoustic current technique at PTB and NPL
599 -- 603Nicolas Feltin, Laurent Devoille, François P. M. Piquemal, Sergey V. Lotkhov, Alexander B. Zorin. Progress in measurements of a single-electron pump by means of a CCC
604 -- 607Christian Hof, Blaise Jeanneret, Ali L. Eichenberger, Frédéric Overney, Sergey V. Lotkhov. First steps toward a quantum capacitance standard at METAS
608 -- 611Neil M. Zimmerman, Mahmoud A. El Sabbagh, Yicheng Wang. Larger value and SI measurement of the improved cryogenic capacitor for the electron-counting capacitance standard
612 -- 616Javier Sesé, Elena Bartolomé, Agustin Camón, Jaap Flokstra, Gert Rietveld, Conrado Rillo. Simplified calculus for the design of a cryogenic current comparator
617 -- 620Ling Hao, John C. Gallop, John C. Macfarlane, Chris Carr. HTS cryogenic current comparator for non-invasive sensing of charged particle beams
621 -- 625Gert Rietveld, Elena Bartolomé, Javier Sesé, Pieter de la Court, Jaap Flokstra, Conrado Rillo, Agustin Camón. 1: 30000 cryogenic current comparator with optimum SQUID readout
626 -- 630Walter Beer, Ali L. Eichenberger, Blaise Jeanneret, Beat Jeckelmann, Ali R. Pourzand, Philippe Richard, Joshua P. Schwarz. Status of the METAS watt balance experiment
631 -- 635Naoki Kuramoto, Kenichi Fujii. Interferometric determination of the diameter of a silicon sphere using a direct optical frequency tuning system
636 -- 640Horst Bettin, Hans Toth. Flotation measurements to reveal the reason for the discrepancy in the molar volume of silicon
641 -- 645Michael J. Kenny, Paul De Bievre, Alain Picard. A Web-based database for the international programme to improve the Avogadro constant along the silicon route
646 -- 651Kenichi Fujii, Atsushi Waseda, Naoki Kuramoto, Shigeki Mizushima, Mitsuru Tanaka, Staf Valkiers, Philip Taylor, Rüdiger Kessel, Paul De Bievre. Evaluation of the molar volume of silicon crystals for a determination of the Avogadro constant

Volume 52, Issue 1

2 -- 6Péter Várady, Szabolcs Bongár, Zoltán Benyó. Detection of airway obstructions and sleep apnea by analyzing the phase relation of respiration movement signals
7 -- 12Zhiyao Huang, Baoliang Wang, Haiqing Li. Application of electrical capacitance tomography to the void fraction measurement of two-phase flow
13 -- 19Ants Ronk. Analysis and reproduction of a signal s periodic components by means of an extended block-adaptive Fourier analyzer
20 -- 26Leopoldo Angrisani, Aldo Baccigalupi, Giovanni D Angiolo. A frame-level measurement apparatus for performance testing of ATM equipment
27 -- 37Maurice G. Cox, Mark P. Dainton, Nick M. Ridler, Martin J. Salter, P. R. Young. An interpolation scheme for precision intermediate frequency reflection coefficient measurement
38 -- 45Salvatore Acunto, Pasquale Arpaia, Donald M. Hummels, Fred H. Irons. A new bidimensional histogram for the dynamic characterization of ADCs
46 -- 60Thierry Sentenac, Yannick Le Maoultt, Guy Rolland, Michel Devy. Temperature correction of radiometric and geometric models for an uncooled CCD camera in the near infrared
61 -- 68Rik Pintelon, Yves Rolain, Wendy Van Moer. Probability density function for frequency response function measurements using periodic signals
69 -- 74Francisco André Corrêa Alegria, António Manuel da Cruz Serra. Variance of the cumulative histogram of ADCs due to frequency errors
75 -- 84Giovanni Bucci, Edoardo Fiorucci, Carmine Landi. Digital measurement station for power quality analysis in distributed environments
85 -- 91Alina Caddemi, Nicola Donato. Characterization techniques for temperature-dependent experimental analysis of microwave transistors
92 -- 96Balázs Vödrös, István Kollár. Identification of a furnace from quasi-periodic measurements
97 -- 102Zbigniew Czaja, Romuald Zielonko. Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces
103 -- 110Shoji Kawahito, Ales Cerman, K. Aramaki, Yoshiaki Tadokoro. A weak magnetic field measurement system using micro-fluxgate sensors and delta-sigma interface
111 -- 118Shanup Peer, Joseph T. Case, E. Gallaher, Kimberly E. Kurtis, Reza Zoughi. Microwave reflection and dielectric properties of mortar subjected to compression force and cyclically exposed to water and sodium chloride solution
119 -- 125Dejun Liu, Rensheng Che, Zifang Li, Xiaochuan Luo. Research on the theory and the virtual prototype of 3-DOF parallel-link coordinate-measuring machine
126 -- 129Michael Bazzarelli, Nelson G. Durdle, Edmond Lou, V. James Raso. A wearable computer for physiotherapeutic scoliosis treatment
130 -- 134Richard A. Dudley, Nick M. Ridler. Traceability via the Internet for microwave measurements using vector network analyzers
135 -- 142Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano. An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy
143 -- 148Dalgerti Lelis Milanez, Alexander Eigeles Emanuel. The instantaneous-space-phasor: a powerful diagnosis tool
149 -- 157Valentino Liberali, Fabio Cherchi, Luca Disingrini, Massimo Gottardi, Stefano Gregori, Guido Torelli. A digital self-calibration circuit for absolute optical rotary encoder microsystems
158 -- 164Voicu Z. Groza. Experimental determination of synchronous machine reactances from DC decay at standstill
165 -- 174Giovanni Bucci, Carmine Landi. A distributed measurement architecture for industrial applications
175 -- 181Emil M. Petriu, Lichen Zhao, Sunil R. Das, Voicu Z. Groza, Aurel Cornell. Instrumentation applications of multibit random-data representation
182 -- 188Enrico Rubiola, Vincent Giordano, Hermann Stoll. The ±45° correlation interferometer as a means to measure phase noise of parametric origin
189 -- 196Gabriele D Antona. The full least-squares method
197 -- 202Alain Geens, Yves Rolain, Wendy Van Moer, Kenneth Vanhoenacker, Johan Schoukens. Discussion on fundamental issues of NPR measurements
209 -- 215Rommanee Jirawimut, Piotr Ptasinski, Vanja Garaj, Franjo Cecelja, Wamadeva Balachandran. A method for dead reckoning parameter correction in pedestrian navigation system