Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Chen-Huan Chiang, Sandeep K. Gupta. BIST TPG for Combinational Cluster Interconnect Testing at Board Level. J. Electronic Testing, 16(5):427-442, 2000. [doi]
The following publications are possibly variants of this publication: Possibly Related Publications