The following publications are possibly variants of this publication:
- QED post-silicon validation and debug: Frequently asked questionsDavid Lin, Subhasish Mitra. aspdac 2014: 478-482 [doi]
- A structured approach to post-silicon validation and debug using symbolic quick error detectionDavid Lin, Eshan Singh, Clark Barrett, Subhasish Mitra. itc 2015: 1-10 [doi]
- Overcoming post-silicon validation challenges through quick error detection (QED)David Lin, Ted Hong, Yanjing Li, Farzan Fallah, Donald S. Gardner, Nagib Hakim, Subhasish Mitra. date 2013: 320-325 [doi]
- QED: Quick Error Detection tests for effective post-silicon validationTed Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra. itc 2010: 154-163 [doi]
- Effective Post-Silicon Validation of System-on-Chips Using Quick Error DetectionDavid Lin, Ted Hong, Yanjing Li, Eswaran S, Sharad Kumar, Farzan Fallah, Nagib Hakim, Donald S. Gardner, Subhasish Mitra. tcad, 33(10):1573-1590, 2014. [doi]
- Symbolic quick error detection using symbolic initial state for pre-silicon verificationMohammad Rahmani Fadiheh, Joakim Urdahl, Srinivas Shashank Nuthakki, Subhasish Mitra, Clark Barrett, Dominik Stoffel, Wolfgang Kunz. date 2018: 55-60 [doi]
- Quick error detection tests with fast runtimes for effective post-silicon validation and debugDavid Lin, Eswaran S, Sharad Kumar, Eric Rentschler, Subhasish Mitra. date 2015: 1168-1173 [doi]
- E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal MethodsEshan Singh, Clark W. Barrett, Subhasish Mitra. cav 2017: 104-125 [doi]
- Quick detection of difficult bugs for effective post-silicon validationDavid Lin, Ted Hong, Farzan Fallah, Nagib Hakim, Subhasish Mitra. dac 2012: 561-566 [doi]
- A Methodology for Trace Signal Selection to Improve Error Detection in Post-Silicon ValidationBinod Kumar, Ankit Jindal, Virendra Singh, Masahiro Fujita. vlsid 2017: 147-152 [doi]