Casey Klein - researchr profile publications

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Publications tagged test coverage

Randomized Testing in PLT RedexCasey Klein, Robby Findler. In Workshop on Scheme and Functional Programming (SFP). 2009:

Test Plan Generation for Concurrent Real-Time Systems Based on Zone Coverage AnalysisFarn Wang, Geng-Dian Huang. pts 2008: 234-249 [doi]

GB Coverage Criteria: The Measurement for Testing a Go Back Function Based on a Pushdown AutomatonTomohiko Takagi, Zengo Furukawa. issre 2008: 293-294 [doi]

Delay Test Scan Flip-Flop: DFT for High Coverage Delay TestingGefu Xu, Adit D. Singh. vlsid 2007: 763-768 [doi]

Improving test coverage of LAPACKDavid J. Barnes, Tim R. Hopkins. aaecc, 18(3):209-222, 2007. [doi]

Improving test coverage of LAPACKDavid J. Barnes, Tim R. Hopkins. aaecc, 18(3):209-222, 2007. [doi]

Efficiently monitoring data-flow test coverageRaúl A. Santelices, Mary Jean Harrold. ASE 2007: 343-352 [doi]

Re-computing Coverage Information to Assist Regression TestingPavan Kumar Chittimalli, Mary Jean Harrold. ICSM 2007: 164-173 [doi]

Test sequence generation for controller verification and test with high coverageSezer Gören, F. Joel Ferguson. todaes, 11(4):916-938, 2006. [doi]

The collateral coverage of data flow criteria when branch testingNicos Malevris, Derek F. Yates. INFSOF, 48(8):676-686, 2006. [doi]

Embedded Software Validation: Applying Formal Techniques for Coverage and Test GenerationTamarah Arons, Elad Elster, Terry Murphy, Eli Singerman. mtv 2006: 45-51 [doi]

A methodology for automated test generation guided by functional coverage constraints at specification levelOdile Laurent, Christel Seguin, Virginie Wiels. ASE 2006: 285-288 [doi]

Test Coverage for Loose Timing AnnotationsC. Helmstetter, Florence Maraninchi, Laurent Maillet-Contoz. fmics 2007: 100-115 [doi]

Pseudo-Random System Testing: Coverage Estimation and EnhancementAli Y. Duale, Theodore J. Bohizic, Dennis W. Wittig. serp 2005: 283-289

Coverage-Directed Test Generation with Model Checkers: Challenges and OpportunitiesGeorge Devaraj, Mats Per Erik Heimdahl, Donglin Liang. compsac 2005: 455-462 [doi]

How Well Do Professional Developers Test with Code Coverage Visualizations? An Empirical StudyJoseph Lawrance, Steven Clarke, Margaret M. Burnett, Gregg Rothermel. vl 2005: 53-60 [doi]

Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes?Kenneth P. Parker. itc 2003: 1268-1276 [doi]

Correct Passive Testing Algorithms and Complete Fault CoverageArun N. Netravali, Krishan K. Sabnani, Ramesh Viswanathan. forte 2003: 303-318 [doi]

Towards Testing SDL Specifications: Models and Fault Coverage for Concurrent TimersMariusz A. Fecko, M. Ümit Uyar, Ali Y. Duale. forte 2003: 273-288 [doi]

Test-Suite Reduction and Prioritization for Modified Condition/Decision CoverageJames A. Jones, Mary Jean Harrold. TSE, 29(3):195-209, 2003. [doi]

Test Coverage: What Does It Mean When a Board Test Passes?Kathy Hird, Kenneth P. Parker, Bill Follis. itc 2002: 1066-1074 [doi]

Continuous and high coverage self-testing of dynamically re-configurable systemsA. C. Zawada, N. Luke Seed, Peter A. Ivey. pc, 28(7-8):1155-1178, 2002.

Efficient instrumentation for code coverage testingMustafa M. Tikir, Jeffrey K. Hollingsworth. ISSTA 2002: 86-96 [doi]

Tool Support for Improving Test CoverageSusan Horwitz. ESOP 2002: 162-177 [doi]

Coverage Estimation Using Statistics of the Extremes for When Testing Reveals No FailuresLori M. Kaufman, Barry W. Johnson, Joanne Bechta Dugan. TC, 51(1):3-12, 2002. [doi]

Test-Suite Reduction and Prioritization for Modified Condition/Decision CoverageJames A. Jones, Mary Jean Harrold. ICSM 2001: 92 [doi]

Coverage Based Test-Case Generation Using Model CheckersSanjai Rayadurgam, Mats Per Erik Heimdahl. ECBS 2001: 83 [doi]

Coverage criteria for GUI testingAtif M. Memon, Mary Lou Soffa, Martha E. Pollack. ESEC/FSE 2001: 256-267 [doi]

Power pin testing: making the test coverage completeFrans de Jong, Ben Kup, Rodger Schuttert. itc 2000: 575-584

Residual Test Coverage MonitoringChristina Pavlopoulou, Michal Young. ICSE 1999: 277-284 [doi]

Increasing test coverage in a VLSI design courseMichel Robert. itc 1999: 1135

Alpha 21164 Manufacturing Test Development and Coverage AnalysisCarol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong. dt, 15(3):98-104, 1998. [doi]

Assessing SRAM test coverage for sub-micron CMOS technologiesV. Kim, T. Chen. vts 1997: 24-30 [doi]

Fault coverage of a long random test sequence estimated from a short simulationV. Prepin, R. David. vts 1997: 391-398 [doi]

Coverage-Directed Test Generation Using Symbolic TechniquesDaniel Geist, Monica Farkas, Avner Landver, Yossi Lichtenstein, Shmuel Ur, Yaron Wolfsthal. FMCAD 1996: 143-158

A Performance Evaluation of Heuristics-Based Test Case Generation Methods for Software Branch CoverageKai H. Chang, James H. Cross II, W. Homer Carlisle, Shih-Sung Liao. ijseke, 6(4):585-608, 1996. [doi]

Minimal Coverage for Relationships in Regression Testing of Object-Oriented SoftwareW. M. Mak, T. Y. Cheung. oois 1996: 106

On Fault Coverage of Tests for Finite State SpecificationsAlexandre Petrenko, Gregor von Bochmann, Ming Yu Yao. cn, 29(1):81-106, 1996. [doi]

Test Quality: Required Stuck-at Fault Coverage with the Use of I::DDQ:: TestingRon Wantuck. itc 1995: 301

Selecting Tests and Identifying Test Coverage Requirements for Modified SoftwareGregg Rothermel, Mary Jean Harrold. ISSTA 1994: 169-184 [doi]

The Cost of Quality: Reducing ASIC Defects with I::DDQ:: At-Speed Testing and Increased Fault CoverageRick Gayle. itc 1993: 285-292

Test Sets and Reject Rates: All Fault Coverages are Not Created EqualPeter C. Maxwell, Robert C. Aitken. dt, 10(1):42-51, 1993. [doi]

On Test Coverage Metrics for Communication ProtocolsSon T. Vuong, Jadranka Alilovic-Curgus. pts 1992: 31-45

Experimental evaluation of a test coverage analyzer for C and C + +William B. Frakes, David J. Lubinsky, D. N. Neal. jss, 16(2):135-139, 1991. [doi]

Delay Test Generation 1: Concepts and Coverage MetricsVijay S. Iyengar, Barry K. Rosen, Ilan Y. Spillinger. itc 1988: 857-866

A New Built-In Self-Test Design for PLA s with High Fault Coverage and Low OverheadRobert P. Treuer, Vinod K. Agarwal, Hideo Fujiwara. TC, 36(3):369-373, 1987.

Self-Testing in Bit Serial VLSI Parts: High Coverage at Low CostAlan F. Murray, Peter B. Denyer, David S. Renshaw. itc 1983: 260-268

Software Quality = Test Accuracy * Test CoverageH. Ohba. ICSE 1982: 287-295

Recursive Coverage Projection of Test SetsVinod K. Agarwal, Gerald M. Masson. TC, 28(11):865-870, 1979.

A Functional Form Approach to Test Set Coverage in Tree NetworksVinod K. Agarwal, Gerald M. Masson. TC, 28(1):50-52, 1979.

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