Kai Yu - researchr profile publications

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Publications tagged test coverage

Lazy symbolic execution for test data generationMengxiang Lin, Yin-li Chen, Kai Yu, Guo-shi Wu. iee, 5(2):132-141, 2011. [doi]

Call-Stack Coverage for GUI Test Suite ReductionScott McMaster, Atif M. Memon. TSE, 34(1):99-115, 2008. [doi]

Towards a deeper understanding of test coverageTeemu Kanstrén. SMR, 20(1):59-76, 2008. [doi]

Efficiently monitoring data-flow test coverageRaúl A. Santelices, Mary Jean Harrold. ASE 2007: 343-352 [doi]

Re-computing Coverage Information to Assist Regression TestingPavan Kumar Chittimalli, Mary Jean Harrold. ICSM 2007: 164-173 [doi]

Enhancing Software Testing by Judicious Use of Code Coverage InformationStefan Berner, Roland Weber, Rudolf K. Keller. ICSE 2007: 612-620 [doi]

Test Coverage for Continuous and Hybrid SystemsTarik Nahhal, Thao Dang. cav 2007: 449-462 [doi]

Test sequence generation for controller verification and test with high coverageSezer Gören, F. Joel Ferguson. todaes, 11(4):916-938, 2006. [doi]

The collateral coverage of data flow criteria when branch testingNicos Malevris, Derek F. Yates. INFSOF, 48(8):676-686, 2006. [doi]

Embedded Software Validation: Applying Formal Techniques for Coverage and Test GenerationTamarah Arons, Elad Elster, Terry Murphy, Eli Singerman. mtv 2006: 45-51 [doi]

A methodology for automated test generation guided by functional coverage constraints at specification levelOdile Laurent, Christel Seguin, Virginie Wiels. ASE 2006: 285-288 [doi]

Test Coverage for Loose Timing AnnotationsC. Helmstetter, Florence Maraninchi, Laurent Maillet-Contoz. fmics 2007: 100-115 [doi]

Call Stack Coverage for GUI Test-Suite ReductionScott McMaster, Atif M. Memon. issre 2006: 33-44 [doi]

Pseudo-Random System Testing: Coverage Estimation and EnhancementAli Y. Duale, Theodore J. Bohizic, Dennis W. Wittig. serp 2005: 283-289

Coverage-Directed Test Generation with Model Checkers: Challenges and OpportunitiesGeorge Devaraj, Mats Per Erik Heimdahl, Donglin Liang. compsac 2005: 455-462 [doi]

Call Stack Coverage for Test Suite ReductionScott McMaster, Atif M. Memon. ICSM 2005: 539-548 [doi]

Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes?Kenneth P. Parker. itc 2003: 1268-1276 [doi]

Towards Testing SDL Specifications: Models and Fault Coverage for Concurrent TimersMariusz A. Fecko, M. Ümit Uyar, Ali Y. Duale. forte 2003: 273-288 [doi]

Test Pattern Length Required to Reach the Desired Fault CoverageJunichi Hirase. ats 2003: 508 [doi]

Test Coverage: What Does It Mean When a Board Test Passes?Kathy Hird, Kenneth P. Parker, Bill Follis. itc 2002: 1066-1074 [doi]

Efficient instrumentation for code coverage testingMustafa M. Tikir, Jeffrey K. Hollingsworth. ISSTA 2002: 86-96 [doi]

Tool Support for Improving Test CoverageSusan Horwitz. ESOP 2002: 162-177 [doi]

Formulation of the Interaction Test Coverage Problem as an Integer ProgramAlan W. Williams, Robert L. Probert. pts 2002: 283

Projected state machine coverage for software testingG. Friedman, A. Hartman, K. Nagin, T. Shiran. ISSTA 2002: 134-143 [doi]

A Measure for Component Interaction Test CoverageAlan W. Williams, Robert L. Probert. aiccsa 2001: 304-312 [doi]

Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP SystemLaurent Arditi, Hédi Boufaïed, Arnaud Cavanié, Vincent Stehlé. FM 2001: 449-464 [doi]

Cost evaluation of coverage directed test generation for the IBM mainframeGilly Nativ, Steven Mittermaier, Shmuel Ur, Avi Ziv. itc 2001: 793-802

Power pin testing: making the test coverage completeFrans de Jong, Ben Kup, Rodger Schuttert. itc 2000: 575-584

Determination of Test Configurations for Pair-Wise Interaction CoverageAlan W. Williams. pts 2000: 59-74

Micro Architecture Coverage Directed Generation of Test ProgramsShmuel Ur, Yaov Yadin. dac 1999: 175-180 [doi]

Alpha 21164 Manufacturing Test Development and Coverage AnalysisCarol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong. dt, 15(3):98-104, 1998. [doi]

Fault coverage of a long random test sequence estimated from a short simulationV. Prepin, R. David. vts 1997: 391-398 [doi]

Delay Fault Coverage Enhancement Using Multiple Test Observation TimesWen-Ben Jone, Yun-Pan Ho, Sunil R. Das. vlsid 1997: 106-110 [doi]

Minimal Coverage for Relationships in Regression Testing of Object-Oriented SoftwareW. M. Mak, T. Y. Cheung. oois 1996: 106

On Fault Coverage of Tests for Finite State SpecificationsAlexandre Petrenko, Gregor von Bochmann, Ming Yu Yao. cn, 29(1):81-106, 1996. [doi]

Test Quality: Required Stuck-at Fault Coverage with the Use of I::DDQ:: TestingRon Wantuck. itc 1995: 301

Parallel Delay Fault Coverage and Test Quality EvaluationIra Pramanick, Ankan K. Pramanick. itc 1995: 113-122

Selecting Tests and Identifying Test Coverage Requirements for Modified SoftwareGregg Rothermel, Mary Jean Harrold. ISSTA 1994: 169-184 [doi]

The Cost of Quality: Reducing ASIC Defects with I::DDQ:: At-Speed Testing and Increased Fault CoverageRick Gayle. itc 1993: 285-292

Test Sets and Reject Rates: All Fault Coverages are Not Created EqualPeter C. Maxwell, Robert C. Aitken. dt, 10(1):42-51, 1993. [doi]

Coverage Measurement Experience During Function TestPaul Piwowarski, Mitsuru Ohba, Joseph M. Caruso. ICSE 1993: 287-301 [doi]

Transistor Fault Coverage for Self-Testing CMOS CheckersPeter Lidén, Peter Dahlgren, Jan Torin. itc 1992: 476-485

AC Test Quality: Beyond Transition Fault CoverageYaron Aizenbud, Paul Chang, Moshe Leibowitz, Dave Smith, Bernd Könemann, Vijay S. Iyengar, Barry K. Rosen. itc 1992: 568-577

On Test Coverage Metrics for Communication ProtocolsSon T. Vuong, Jadranka Alilovic-Curgus. pts 1992: 31-45

Experimental evaluation of a test coverage analyzer for C and C + +William B. Frakes, David J. Lubinsky, D. N. Neal. jss, 16(2):135-139, 1991. [doi]

Delay Test Generation 1: Concepts and Coverage MetricsVijay S. Iyengar, Barry K. Rosen, Ilan Y. Spillinger. itc 1988: 857-866

A New Built-In Self-Test Design for PLA s with High Fault Coverage and Low OverheadRobert P. Treuer, Vinod K. Agarwal, Hideo Fujiwara. TC, 36(3):369-373, 1987.

Software Quality = Test Accuracy * Test CoverageH. Ohba. ICSE 1982: 287-295

Recursive Coverage Projection of Test SetsVinod K. Agarwal, Gerald M. Masson. TC, 28(11):865-870, 1979.

A Functional Form Approach to Test Set Coverage in Tree NetworksVinod K. Agarwal, Gerald M. Masson. TC, 28(1):50-52, 1979.

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