Michal H. Palka - researchr profile publications

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Publications tagged random testing

Testing an optimising compiler by generating random lambda termsMichal H. Palka, Koen Claessen, Russo, Alejandro, John Hughes. In Proceedings of the 6th International Workshop on Automation of Software Test. 2011: 91-97 [doi]

Adaptive Random TestingT. Y. Chen. qsic 2008: 443 [doi]

Tests of randomness by the gambler s ruin algorithmChihurn Kim, Geon Ho Choe, Dong Han Kim. amc, 199(1):195-210, 2008. [doi]

Statistical Metamorphic Testing Testing Programs with Random Output by Means of Statistical Hypothesis Tests and Metamorphic TestingRalph Guderlei, Johannes Mayer. qsic 2007: 404-409 [doi]

Testing randomized software by means of statistical hypothesis testsRalph Guderlei, Johannes Mayer, Christoph Schneckenburger, Frank Fleischer. soqua 2007: 46-54 [doi]

Generation of address sequences for effective random access memory testingS. V. Yarmolik. accs, 41(6):337-342, 2007. [doi]

Towards Automatic Testing of Imaging Software by Means of Random and Metamorphic TestingRalph Guderlei, Johannes Mayer. ijseke, 17(6):757-781, 2007. [doi]

On the Randomness Complexity of Property TestingOded Goldreich, Or Sheffet. approx 2007: 509-524 [doi]

On the randomness complexity of property testingOded Goldreich, Or Sheffet. eccc, 14(015), 2007. [doi]

Proceedings of the 1st International Workshop on Random Testing, RT 2006, Portland, Maine, July 20, 2006Johannes Mayer, Robert G. Merkel, editors, ACM, 2006.

On Random Testing of Image Processing ApplicationsJohannes Mayer, Ralph Guderlei. qsic 2006: 85-92 [doi]

Adaptive Random Testing with Enlarged Input DomainJohannes Mayer, Christoph Schneckenburger. qsic 2006: 251-258 [doi]

Towards effective adaptive random testing for higher-dimensional input domainsJohannes Mayer. gecco 2006: 1955-1956 [doi]

An SPU reference model for simulation, random test generation and verificationYukio Watanabe, Balazs Sallay, Brad W. Michael, Daniel A. Brokenshire, Gavin Meil, Hazim Shafi, Daisuke Hiraoka. aspdac 2006: 860-866 [doi]

When only random testing will doDick Hamlet. ISSTA 2006: 1-9 [doi]

Honest-Verifier Private Disjointness Testing Without Random OraclesSusan Hohenberger, Stephen A. Weis. pet 2006: 277-294 [doi]

Applying operational profiles to existing random testing results: meeting the square root efficiency challengeStefan Mankefors-Christiernin, Andreas Boklund. iadis 2005: 233-244

A Universal Random Test Generator for Functional Verification of Microprocessors and System-on-ChipK. Uday Bhaskar, M. Prasanth, G. Chandramouli, V. Kamakoti. vlsid 2005: 207-212 [doi]

Adaptive Random Testing by Bisection with RestrictionJohannes Mayer. icfem 2005: 251-263 [doi]

Adaptive Random Testing by Bisection and LocalizationJohannes Mayer. fates 2006: 72-86 [doi]

Comparing the Fault Detection Effectiveness of N-way and Random Test SuitesPatrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu. isese 2004: 49-59 [doi]

A Genetic Algorithm-specific Test Of Random Generator QualityMark M. Meysenburg, Daniel Hoelting, Duane McElvain, James A. Foster. gecco 2002: 691

Two-sample hypothesis tests of means of a fuzzy random variableManuel Montenegro, María Rosa Casals, María Asunción Lubiano, María Angeles Gil. isci, 133(1-2):89-100, 2001. [doi]

On Random Pattern Testability of Cryptographic VLSI CoresA. Schubert, Walter Anheier. et, 16(3):185-192, 2000. [doi]

Parallel Streams of Linear Random Numbers in the Spectral TestKarl Entacher. tomacs, 9(1):31-44, 1999. [doi]

Measuring the Spatial Homogeneity in Corneal Endotheliums by Means of a Randomization TestMaría Elena Díaz, Guillermo Ayala. ipmi 1999: 418-423 [doi]

An Implementation of the Lattice and Spectral Tests for Multiple Recursive Linear Random Number GeneratorsPierre L Ecuyer, Raymond Couture. informs, 9(2):206-217, 1997. [doi]

Test Length for Random Testing of Sequential Machines Application to RAMsRené David. ats 1997: 392-397 [doi]

Transparent random access memory testing for pattern sensitive faultsMark G. Karpovsky, Vyacheslav N. Yarmolik. et, 9(3):251-266, 1996. [doi]

Efficient Monte Carlo Method for Generating Random Test Data from Irregular Test Regions Anouar Jamoussi, Farokh B. Bastani. seke 1996: 17-24

Experiences with a Random Test DriverColin H. West, Angelo Tosi. cn, 27(7):1163-1174, 1995. [doi]

Provably Good Pattern Generators for a Random Pattern TestThomas H. Spencer. algorithmica, 11(5):429-442, 1994.

Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant CircuitsMohammed F. AlShaibi, Charles R. Kime. itc 1994: 929-938

Functional versus random test generation for sequential circuitsMargot Karam, Gabriele Saucier. et, 4(1):33-41, 1993. [doi]

Using Boundary Scan Test to Test Random Access Memory ClustersMath Muris, Alex S. Biewenga. itc 1993: 174-179

CACOP - A Random Pattern Testability AnalyzerWen-Ben Jone, Sunil R. Das. vlsid 1993: 61-64

On testing the pseudo-randomness of a hypergraphJulie Haviland, Andrew Thomason. DM, 103(3):321-327, 1992. [doi]

Functional Fault Simulation as a Guide for Biased-Random Test Pattern GenerationGabriel M. Silberman, Ilan Y. Spillinger. TC, 40(1):66-79, 1991.

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. TC, 40(10):1177-1180, 1991.

Defect Level Estimation of Random and Pseudorandom TestingWen-Ben Jone. itc 1991: 712-721

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1989: 439-451

Random Pattern Testability of Delay FaultsJacob Savir, William H. McAnney. itc 1986: 263-273

Random Pattern Testing for Address-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 106-114

Random Pattern Testing for Data-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 100-105

Note on a Proposed Test for Random Number GeneratorsGeorge Marsaglia. TC, 34(8):756-758, 1985.

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. TC, 33(6):467-474, 1984.

Random testing of LSI self-checking circuitsHugues Deneux, Pascale Thévenod-Fosse. icftcs 1984: 380-390

Functional Testing of Semiconductor Random Access MemoriesMagdy S. Abadir, Hassan K. Reghbati. ACM Comput. Surv., 15(3):175-198, 1983.

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. itc 1983: 95-107

Process Complexity and Effective Random TestsClaus-Peter Schnorr. jcss, 7(4):376-388, 1973.

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