Naoki Shibata - researchr profile publications

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Publications tagged coverage

Extending k-Coverage Lifetime of Wireless Sensor Networks Using Mobile Sensor NodesRyo Katsuma, Yoshihiro Murata, Naoki Shibata, Keiichi Yasumoto, Minoru Ito. wimob 2009: 48-54 [doi]

A state coverage tool for JUnitKen Koster. ICSE 2008: 965-966 [doi]

Code coverage, performance approximation and automatic recognition of idioms in scientific applicationsJiahua He, Allan Snavely, Rob F. Van der Wijngaart, Michael A. Frumkin. hpdc 2008: 223-224 [doi]

A Simple Prediction Model for Line of Sight Coverage in Urban ScenariosGeorg Bauer, Rolf Jakoby. vtc 2008: 1-5 [doi]

Throughput-coverage tradeoff in a scalable wireless mesh networkJane-Hwa Huang, Li-Chun Wang, Chung-Ju Chang. jpdc, 68(3):278-290, 2008. [doi]

Evaluating Workloads Using Comparative Functional CoverageYoram Adler, Dale Blue, Thomas Conti, Richard Prewitt, Shmuel Ur. hvc 2009: 84-98 [doi]

Automatic Boosting of Cross-Product Coverage Using Bayesian NetworksDorit Baras, Laurent Fournier, Avi Ziv. hvc 2009: 53-67 [doi]

Double Barrier Coverage in Dense Sensor NetworksCheng-Dong Jiang, Guo-Liang Chen. jcst, 23(1):154-165, 2008. [doi]

Evaluation of Ergodic Capacity Taking into Account of Area Coverage in a Multilink MIMO Cellular Network for Supporting Guaranteed QoSAkiyo Yoshimoto, Takeshi Hattori. ieicet, 90-A(7):1292-1299, 2007. [doi]

Multi Observer 3D Visual Area Coverage Scheduling Using Decomposition MethodologiesHelman Stern, Moshe Zofi, Moshe Kaspi. icai 2007: 114-120

Optimal Configuration of Multi-Faceted Phased Arrays for Wide Angle CoverageInas Khalifa, Rodney G. Vaughan. vtc 2007: 304-308 [doi]

The Parameterized Complexity of the Unique Coverage ProblemHannes Moser, Venkatesh Raman, Somnath Sikdar. isaac 2007: 621-631 [doi]

Information coverage in advisory brokersPatrick van Bommel, Henderik Alex Proper, Theo P. van der Weide. ijis, 22(11):1155-1188, 2007. [doi]

Using Virtual Coverage to Hit Hard-To-Reach EventsLaurent Fournier, Avi Ziv. hvc 2008: 104-119 [doi]

Methods of remote homology detection can be combined to increase coverage by 10 in the midnight zoneAdam James Reid, Corin Yeats, Christine A. Orengo. bioinformatics, 23(18):2353-2360, 2007. [doi]

A BIST TPG for Low Power Dissipation and High Fault CoverageSeongmoon Wang. tvlsi, 15(7):777-789, 2007. [doi]

A study of the influence of coverage on the relationship between static and dynamic coupling metricsÁine Mitchell, James F. Power. SCP, 59(1-2):4-25, 2006. [doi]

Practical methods in coverage-oriented verification of the merom microprocessorAlon Gluska. dac 2006: 332-337 [doi]

Fine-grained transaction-level verification: using a variable transactor for improved coverage at the signal levelKoji Ara, Kei Suzuki. tcad, 24(8):1234-1240, 2005. [doi]

Multi Agent Visual Area Coverage Strategies using an Adaptive Queen Genetic AlgorithmHelman Stern, Yoash Chassidim, Moshe Zofi, Moshe Kaspi. aia 2005: 118-124

Domain fault model and coverage metric for SoC verificationLuo Chun, Yang Jun, Gao Gugang, Shi Longxing. iscas 2005: 5662-5665 [doi]

An Improved Mechanism for Controlling Portable Computers in Limited Coverage AreasDavid Sánchez, Elsa M. Macías, Álvaro Suárez. pvm 2005: 467-474 [doi]

Efficient online computation of statement coverageMustafa M. Tikir, Jeffrey K. Hollingsworth. jss, 78(2):146-165, 2005. [doi]

Improvement of the Fault Coverage of the Pseudo-Random Phase in Column-Matching BISTPeter Filter, Hana Kubatova. dsdm 2005: 56-63 [doi]

FTC turns back challenge on patent coverageRichard H. Stern. micro, 24(4), 2004. [doi]

PNC Selection Method with Candidate List and Radio Coverage for WPANHeonJu Jeong, Moo-Ho Cho, Sunghee Kim, Jungtae Lee. icwn 2004: 311-317

Coverage-oriented verification of baniasAlon Gluska. dac 2003: 280-285 [doi]

Efficient use of code coverage in large-scale software developmentYong Woo Kim. cascon 2003: 145-155 [doi]

Estimating Residual Faults from Code CoveragePeter G. Bishop. safecomp 2002: 163-174 [doi]

Wide-Coverage Spanish Named Entity ExtractionXavier Carreras, Lluís Màrquez, Lluís Padró. sbia 2002: 674-683 [doi]

Path delay fault diagnosis and coverage-a metric and an estimationtechniqueMukund Sivaraman, Andrzej J. Strojwas. tcad, 20(3):440-457, 2001. [doi]

Automatic Bias Generation Using Pipeline Instruction State Coverage for Biased Random Instruction GenerationMrinal Bose, Elizabeth M. Rudnick, Magdy S. Abadir. iolts 2001: 65 [doi]

Measuring complexity and coverage of software specificationsGwendolyn H. Walton, Jesse H. Poore. INFSOF, 42(12):859-872, 2000.

Assessing Error Detection Coverage by Simulated Fault InjectionCristian Constantinescu. edcc 1999: 161-170 [doi]

EGREGION: a branch coverage tool for APLRobert Bernecky. aplas 1998: 3-14 [doi]

Delay fault coverage: a realistic metric and an estimation technique for distributed path delay faultsMukund Sivaraman, Andrzej J. Strojwas. iccad 1996: 494-501 [doi]

Hierarchical Polygon Tiling with Coverage MasksNed Greene. siggraph 1996: 65-74 [doi]

Removal of all Faulty Nodes from a Fault-Tolerant Service by means of Distributed Diagnosis with Imperfect Fault CoverageAndré Postma, Gerie Hartman, Thijs Krol. edcc 1996: 385-402

Line Art Rendering via a Coverage of Isoparametric CurvesGershon Elber. tvcg, 1(3):231-239, 1995. [doi]

Coverage of Transistor-Level and Gate-Level Stuck-at Faults in CMOS CheckersPeter Lidén, Peter Dahlgren. iscas 1995: 2124-2127

Partial scan selection for user-specified fault coverageClay Gloster, Franc Brglez. eurodac 1995: 111-116 [doi]

Dominators, Super Blocks, and Program CoverageHiralal Agrawal. POPL 1994: 25-34

Coverage of Delay Faults: When 13 and 99 Mean the SameAndrzej Krasniewski, Leszek B. Wronski. edcc 1994: 178-195

Defects, Fault Coverage, Yield and Cost in Board ManufacturingMick Tegethoff, Tom Chen. itc 1994: 539-547

On the Coverage of Partial ValidationsEd Brinksma. amast 1994: 245-252

A Method for Consistent Fault Coverage ReportingWarren H. Debany Jr., Kevin A. Kwiat, Sami A. Al-Arian. dt, 10(3):68-79, 1993. [doi]

The Total Delay Fault Model and Statistical Delay Fault CoverageEun Sei Park, M. Ray Mercer, Thomas W. Williams. TC, 41(6):688-698, 1992.

Using functional fault simulation and the difference fault model to estimate implementation fault coverageGabriel M. Silberman, Ilan Y. Spillinger. tcad, 9(12):1335-1343, 1990. [doi]

Statistical Delay Fault Coverage and Defect Level for Delay FaultsEun Sei Park, Thomas W. Williams, M. Ray Mercer. itc 1988: 492-499

The Difference Fault Model : Using Functional Fault Simulation to Obtain Implementation Fault CoverageGabriel M. Silberman, Ilan Y. Spillinger. itc 1986: 332-339

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