Koen Claessen - researchr profile publications

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Publications tagged random testing

Testing an optimising compiler by generating random lambda termsMichal H. Palka, Koen Claessen, Russo, Alejandro, John Hughes. In Proceedings of the 6th International Workshop on Automation of Software Test. 2011: 91-97 [doi]

Adaptive Random TestingT. Y. Chen. qsic 2008: 443 [doi]

Tests of randomness by the gambler s ruin algorithmChihurn Kim, Geon Ho Choe, Dong Han Kim. amc, 199(1):195-210, 2008. [doi]

Generation of address sequences for effective random access memory testingS. V. Yarmolik. accs, 41(6):337-342, 2007. [doi]

An SPU reference model for simulation, random test generation and verificationYukio Watanabe, Balazs Sallay, Brad W. Michael, Daniel A. Brokenshire, Gavin Meil, Hazim Shafi, Daisuke Hiraoka. aspdac 2006: 860-866 [doi]

When only random testing will doDick Hamlet. ISSTA 2006: 1-9 [doi]

Honest-Verifier Private Disjointness Testing Without Random OraclesSusan Hohenberger, Stephen A. Weis. pet 2006: 277-294 [doi]

Applying operational profiles to existing random testing results: meeting the square root efficiency challengeStefan Mankefors-Christiernin, Andreas Boklund. iadis 2005: 233-244

A Universal Random Test Generator for Functional Verification of Microprocessors and System-on-ChipK. Uday Bhaskar, M. Prasanth, G. Chandramouli, V. Kamakoti. vlsid 2005: 207-212 [doi]

Comparing the Fault Detection Effectiveness of N-way and Random Test SuitesPatrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu. isese 2004: 49-59 [doi]

Multiple Profile Evaluation Using a Single Test Suite in Random TestingStefan Mankefors-Christiernin, Andreas Boklund. issre 2004: 283-294 [doi]

QuickCheck: a lightweight tool for random testing of Haskell programsKoen Claessen, John Hughes. ICFP 2000: 268-279 [doi]

On Random Pattern Testability of Cryptographic VLSI CoresA. Schubert, Walter Anheier. et, 16(3):185-192, 2000. [doi]

Randomized Zero Testing of Radical Expressions and Elementary Geometry Theorem ProvingDaniela Tulone, Chee-Keng Yap, Chen Li 0003. adg 2001: 58-82 [doi]

Parallel Streams of Linear Random Numbers in the Spectral TestKarl Entacher. tomacs, 9(1):31-44, 1999. [doi]

Measuring the Spatial Homogeneity in Corneal Endotheliums by Means of a Randomization TestMaría Elena Díaz, Guillermo Ayala. ipmi 1999: 418-423 [doi]

Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path ConnectionsJacob Savir. et, 15(3):279-296, 1999. [doi]

An Implementation of the Lattice and Spectral Tests for Multiple Recursive Linear Random Number GeneratorsPierre L Ecuyer, Raymond Couture. informs, 9(2):206-217, 1997. [doi]

Test Length for Random Testing of Sequential Machines Application to RAMsRené David. ats 1997: 392-397 [doi]

An Automated Tool for Efficiently Generating a Massive Number of Random Test CasesAnouar Jamoussi. hase 1997: 104-107 [doi]

Transparent random access memory testing for pattern sensitive faultsMark G. Karpovsky, Vyacheslav N. Yarmolik. et, 9(3):251-266, 1996. [doi]

Experiences with a Random Test DriverColin H. West, Angelo Tosi. cn, 27(7):1163-1174, 1995. [doi]

Provably Good Pattern Generators for a Random Pattern TestThomas H. Spencer. algorithmica, 11(5):429-442, 1994.

Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant CircuitsMohammed F. AlShaibi, Charles R. Kime. itc 1994: 929-938

Using Boundary Scan Test to Test Random Access Memory ClustersMath Muris, Alex S. Biewenga. itc 1993: 174-179

CACOP - A Random Pattern Testability AnalyzerWen-Ben Jone, Sunil R. Das. vlsid 1993: 61-64

On testing the pseudo-randomness of a hypergraphJulie Haviland, Andrew Thomason. DM, 103(3):321-327, 1992. [doi]

Testing of static random access memories by monitoring dynamic power supply currentShyang-Tai Su, Rafic Z. Makki. et, 3(3):265-278, 1992. [doi]

Testing random number generatorsPierre L Ecuyer. wsc 1992: 305-313 [doi]

Functional Fault Simulation as a Guide for Biased-Random Test Pattern GenerationGabriel M. Silberman, Ilan Y. Spillinger. TC, 40(1):66-79, 1991.

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. TC, 40(10):1177-1180, 1991.

Defect Level Estimation of Random and Pseudorandom TestingWen-Ben Jone. itc 1991: 712-721

The Random Testability of the n-Input AND GateJoachim Hartmann. STACS 1991: 488-498

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1989: 439-451

A Method for Generating Weighted Random Test PatternsJohn A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Orazio P. Forlenza. ibmrd, 33(2):149-161, 1989.

Random Pattern Testability of Delay FaultsJacob Savir, William H. McAnney. TC, 37(3):291-300, 1988.

Random Pattern Testability of Delay FaultsJacob Savir, William H. McAnney. itc 1986: 263-273

Random Pattern Testing for Address-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 106-114

Random Pattern Testing for Data-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 100-105

Note on a Proposed Test for Random Number GeneratorsGeorge Marsaglia. TC, 34(8):756-758, 1985.

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. TC, 33(6):467-474, 1984.

Random testing of LSI self-checking circuitsHugues Deneux, Pascale Thévenod-Fosse. icftcs 1984: 380-390

Random Pattern TestabilityJacob Savir, Gary S. Ditlow, Paul H. Bardell. TC, 33(1):79-90, 1984.

Random Testing for Stuck-At Storage Cells in an Embedded MemoryWilliam H. McAnney, Paul H. Bardell, V. P. Gupta. itc 1984: 157-166

Functional Testing of Semiconductor Random Access MemoriesMagdy S. Abadir, Hassan K. Reghbati. ACM Comput. Surv., 15(3):175-198, 1983.

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. itc 1983: 95-107

An LSSD Pseudo Random Pattern Test SystemFranco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom. itc 1983: 283-288

Testing Random Number Generators by Walsh TransformChung-Kwong Yuen. TC, 26(4):329-333, 1977.

Random Testing of MemoriesPascale Fosse, René David. gi 1977: 139-153

Process Complexity and Effective Random TestsClaus-Peter Schnorr. jcss, 7(4):376-388, 1973.

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