Tim Koopman - researchr profile publications

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Publications tagged random testing

Applying Extended Resolution and Forced Patterns on Random 3-SAT instancesNathan Bruning, Tim Koopman, Siem Kok, Joris Scharpff, Jip-Man Vuong. Technical Report 2009.

Adaptive Random TestingT. Y. Chen. qsic 2008: 443 [doi]

Tests of randomness by the gambler s ruin algorithmChihurn Kim, Geon Ho Choe, Dong Han Kim. amc, 199(1):195-210, 2008. [doi]

Generation of address sequences for effective random access memory testingS. V. Yarmolik. accs, 41(6):337-342, 2007. [doi]

An SPU reference model for simulation, random test generation and verificationYukio Watanabe, Balazs Sallay, Brad W. Michael, Daniel A. Brokenshire, Gavin Meil, Hazim Shafi, Daisuke Hiraoka. aspdac 2006: 860-866 [doi]

When only random testing will doDick Hamlet. ISSTA 2006: 1-9 [doi]

Applying operational profiles to existing random testing results: meeting the square root efficiency challengeStefan Mankefors-Christiernin, Andreas Boklund. iadis 2005: 233-244

Comparing the Fault Detection Effectiveness of N-way and Random Test SuitesPatrick J. Schroeder, Pankaj Bolaki, Vijayram Gopu. isese 2004: 49-59 [doi]

Multiple Profile Evaluation Using a Single Test Suite in Random TestingStefan Mankefors-Christiernin, Andreas Boklund. issre 2004: 283-294 [doi]

Occupancy Numbers in Testing Random Number GeneratorsA. Figotin, A. Gordon, J. Quinn, N. Stavrakas, S. Molchanov. siamam, 62(6):1980-2011, 2002. [doi]

On Random Pattern Testability of Cryptographic VLSI CoresA. Schubert, Walter Anheier. et, 16(3):185-192, 2000. [doi]

Randomized Zero Testing of Radical Expressions and Elementary Geometry Theorem ProvingDaniela Tulone, Chee-Keng Yap, Chen Li 0003. adg 2001: 58-82 [doi]

Parallel Streams of Linear Random Numbers in the Spectral TestKarl Entacher. tomacs, 9(1):31-44, 1999. [doi]

Measuring the Spatial Homogeneity in Corneal Endotheliums by Means of a Randomization TestMaría Elena Díaz, Guillermo Ayala. ipmi 1999: 418-423 [doi]

Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path ConnectionsJacob Savir. et, 15(3):279-296, 1999. [doi]

An Implementation of the Lattice and Spectral Tests for Multiple Recursive Linear Random Number GeneratorsPierre L Ecuyer, Raymond Couture. informs, 9(2):206-217, 1997. [doi]

Test Length for Random Testing of Sequential Machines Application to RAMsRené David. ats 1997: 392-397 [doi]

An Automated Tool for Efficiently Generating a Massive Number of Random Test CasesAnouar Jamoussi. hase 1997: 104-107 [doi]

Transparent random access memory testing for pattern sensitive faultsMark G. Karpovsky, Vyacheslav N. Yarmolik. et, 9(3):251-266, 1996. [doi]

Experiences with a Random Test DriverColin H. West, Angelo Tosi. cn, 27(7):1163-1174, 1995. [doi]

Provably Good Pattern Generators for a Random Pattern TestThomas H. Spencer. algorithmica, 11(5):429-442, 1994.

Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant CircuitsMohammed F. AlShaibi, Charles R. Kime. itc 1994: 929-938

Using Boundary Scan Test to Test Random Access Memory ClustersMath Muris, Alex S. Biewenga. itc 1993: 174-179

CACOP - A Random Pattern Testability AnalyzerWen-Ben Jone, Sunil R. Das. vlsid 1993: 61-64

On testing the pseudo-randomness of a hypergraphJulie Haviland, Andrew Thomason. DM, 103(3):321-327, 1992. [doi]

Testing of static random access memories by monitoring dynamic power supply currentShyang-Tai Su, Rafic Z. Makki. et, 3(3):265-278, 1992. [doi]

Testing random number generatorsPierre L Ecuyer. wsc 1992: 305-313 [doi]

An Expanded Set of Correlation Tests for Linear Congruential Random Number GeneratorsOra Engelberg Percus, Jerome K. Percus. cpc, 1:161-168, 1992.

Functional Fault Simulation as a Guide for Biased-Random Test Pattern GenerationGabriel M. Silberman, Ilan Y. Spillinger. TC, 40(1):66-79, 1991.

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. TC, 40(10):1177-1180, 1991.

Defect Level Estimation of Random and Pseudorandom TestingWen-Ben Jone. itc 1991: 712-721

The Random Testability of the n-Input AND GateJoachim Hartmann. STACS 1991: 488-498

A realistic fault model and test algorithms for static random access memoriesRob Dekker, Frans P. M. Beenker, Loek Thijssen. tcad, 9(6):567-572, 1990. [doi]

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1989: 439-451

A Method for Generating Weighted Random Test PatternsJohn A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Orazio P. Forlenza. ibmrd, 33(2):149-161, 1989.

Random Pattern Testability of Delay FaultsJacob Savir, William H. McAnney. TC, 37(3):291-300, 1988.

Random Pattern Testability of Delay FaultsJacob Savir, William H. McAnney. itc 1986: 263-273

Random Pattern Testing for Address-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 106-114

Random Pattern Testing for Data-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 100-105

Note on a Proposed Test for Random Number GeneratorsGeorge Marsaglia. TC, 34(8):756-758, 1985.

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. TC, 33(6):467-474, 1984.

Random testing of LSI self-checking circuitsHugues Deneux, Pascale Thévenod-Fosse. icftcs 1984: 380-390

Random Pattern TestabilityJacob Savir, Gary S. Ditlow, Paul H. Bardell. TC, 33(1):79-90, 1984.

Random Testing for Stuck-At Storage Cells in an Embedded MemoryWilliam H. McAnney, Paul H. Bardell, V. P. Gupta. itc 1984: 157-166

Functional Testing of Semiconductor Random Access MemoriesMagdy S. Abadir, Hassan K. Reghbati. ACM Comput. Surv., 15(3):175-198, 1983.

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. itc 1983: 95-107

An LSSD Pseudo Random Pattern Test SystemFranco Motika, John A. Waicukauski, Edward B. Eichelberger, Eric Lindbloom. itc 1983: 283-288

Testing Random Number Generators by Walsh TransformChung-Kwong Yuen. TC, 26(4):329-333, 1977.

Random Testing of MemoriesPascale Fosse, René David. gi 1977: 139-153

Process Complexity and Effective Random TestsClaus-Peter Schnorr. jcss, 7(4):376-388, 1973.

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