Willem-Paul Brinkman - researchr profile publications

researchr

You are not signed in
Sign in
Sign up

[Clear Filters]

Publications tagged random testing

Presence for VRET through 3D Architectural VisualizationErvin Sabadi, Willem-Paul Brinkman, Charles van der Mast. In Euromedia 2009 April 15-17 Bruges Belgium. 2009: 108-114

A family of tests to detect misspecifications in the random-effects structure of generalized linear mixed modelsAriel Alonso, S. Litière, Geert Molenberghs. csda, 52(9):4474-4486, 2008. [doi]

Adaptive Random TestingT. Y. Chen. qsic 2008: 443 [doi]

On a Linear Independence Test for Interval-Valued Random SetsÁngela Blanco, Ana Colubi, Norberto Corral, Gil González-Rodríguez. SMP 2008: 111-117 [doi]

Tests of randomness by the gambler s ruin algorithmChihurn Kim, Geon Ho Choe, Dong Han Kim. amc, 199(1):195-210, 2008. [doi]

Asymptotic Tests for the Variance of a Fuzzy Random Variable Using the DK-MetricAna Belén Ramos, Gil González-Rodríguez, Ana Colubi, María Angeles Gil. SMP 2008: 140-146 [doi]

Statistical Metamorphic Testing Testing Programs with Random Output by Means of Statistical Hypothesis Tests and Metamorphic TestingRalph Guderlei, Johannes Mayer. qsic 2007: 404-409 [doi]

Testing randomized software by means of statistical hypothesis testsRalph Guderlei, Johannes Mayer, Christoph Schneckenburger, Frank Fleischer. soqua 2007: 46-54 [doi]

Generation of address sequences for effective random access memory testingS. V. Yarmolik. accs, 41(6):337-342, 2007. [doi]

Test Time Reduction to Test for Path-Delay Faults using Enhanced Random-Access ScanKim T. Le, Dong Hyun Baik, Kewal K. Saluja. vlsid 2007: 769-774 [doi]

Towards Automatic Testing of Imaging Software by Means of Random and Metamorphic TestingRalph Guderlei, Johannes Mayer. ijseke, 17(6):757-781, 2007. [doi]

On the Randomness Complexity of Property TestingOded Goldreich, Or Sheffet. approx 2007: 509-524 [doi]

On the randomness complexity of property testingOded Goldreich, Or Sheffet. eccc, 14(015), 2007. [doi]

Proceedings of the 1st International Workshop on Random Testing, RT 2006, Portland, Maine, July 20, 2006Johannes Mayer, Robert G. Merkel, editors, ACM, 2006.

On Random Testing of Image Processing ApplicationsJohannes Mayer, Ralph Guderlei. qsic 2006: 85-92 [doi]

Bootstrap techniques and fuzzy random variables: Synergy in hypothesis testing with fuzzy dataGil González-Rodríguez, Manuel Montenegro, Ana Colubi, María Angeles Gil. fss, 157(19):2608-2613, 2006. [doi]

Adaptive Random Testing with Enlarged Input DomainJohannes Mayer, Christoph Schneckenburger. qsic 2006: 251-258 [doi]

Towards effective adaptive random testing for higher-dimensional input domainsJohannes Mayer. gecco 2006: 1955-1956 [doi]

A randomness test for block ciphersVasilios Katos. amc, 162(1):29-35, 2005. [doi]

Applying operational profiles to existing random testing results: meeting the square root efficiency challengeStefan Mankefors-Christiernin, Andreas Boklund. iadis 2005: 233-244

A Universal Random Test Generator for Functional Verification of Microprocessors and System-on-ChipK. Uday Bhaskar, M. Prasanth, G. Chandramouli, V. Kamakoti. vlsid 2005: 207-212 [doi]

Adaptive Random Testing by Bisection with RestrictionJohannes Mayer. icfem 2005: 251-263 [doi]

Adaptive Random Testing by Bisection and LocalizationJohannes Mayer. fates 2006: 72-86 [doi]

Bootstrap Techniques: A Valuable Tool in Statistical Hypothesis Testing about the Means of Fuzzy Random VariablesManuel Montenegro, Gil González-Rodríguez, Ana Colubi, María Angeles Gil. eusflat 2005: 599-604 [doi]

Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access MemoriesPetru Cascaval, Stuart Bennett, Corneliu Hutanu. et, 20(3):227-243, 2004. [doi]

Random Access Scan: A solution to test power, test data volume and test timeDong Hyun Baik, Kewal K. Saluja, Seiji Kajihara. vlsid 2004: 883-888 [doi]

A Genetic Algorithm-specific Test Of Random Generator QualityMark M. Meysenburg, Daniel Hoelting, Duane McElvain, James A. Foster. gecco 2002: 691

Two-sample hypothesis tests of means of a fuzzy random variableManuel Montenegro, María Rosa Casals, María Asunción Lubiano, María Angeles Gil. isci, 133(1-2):89-100, 2001. [doi]

On Random Pattern Testability of Cryptographic VLSI CoresA. Schubert, Walter Anheier. et, 16(3):185-192, 2000. [doi]

On Test Pattern Compaction Using Random Pattern Fault SimulationSeiji Kajihara, Kewal K. Saluja. vlsid 1998: 464-469 [doi]

An Implementation of the Lattice and Spectral Tests for Multiple Recursive Linear Random Number GeneratorsPierre L Ecuyer, Raymond Couture. informs, 9(2):206-217, 1997. [doi]

Transparent random access memory testing for pattern sensitive faultsMark G. Karpovsky, Vyacheslav N. Yarmolik. et, 9(3):251-266, 1996. [doi]

Efficient Monte Carlo Method for Generating Random Test Data from Irregular Test Regions Anouar Jamoussi, Farokh B. Bastani. seke 1996: 17-24

Experiences with a Random Test DriverColin H. West, Angelo Tosi. cn, 27(7):1163-1174, 1995. [doi]

Provably Good Pattern Generators for a Random Pattern TestThomas H. Spencer. algorithmica, 11(5):429-442, 1994.

Functional versus random test generation for sequential circuitsMargot Karam, Gabriele Saucier. et, 4(1):33-41, 1993. [doi]

Using Boundary Scan Test to Test Random Access Memory ClustersMath Muris, Alex S. Biewenga. itc 1993: 174-179

CACOP - A Random Pattern Testability AnalyzerWen-Ben Jone, Sunil R. Das. vlsid 1993: 61-64

On testing the pseudo-randomness of a hypergraphJulie Haviland, Andrew Thomason. DM, 103(3):321-327, 1992. [doi]

Functional Fault Simulation as a Guide for Biased-Random Test Pattern GenerationGabriel M. Silberman, Ilan Y. Spillinger. TC, 40(1):66-79, 1991.

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. TC, 40(10):1177-1180, 1991.

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1989: 439-451

Random Pattern Testability of Delay FaultsJacob Savir, William H. McAnney. itc 1986: 263-273

Random Pattern Testing for Address-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 106-114

Random Pattern Testing for Data-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 100-105

Note on a Proposed Test for Random Number GeneratorsGeorge Marsaglia. TC, 34(8):756-758, 1985.

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. TC, 33(6):467-474, 1984.

Functional Testing of Semiconductor Random Access MemoriesMagdy S. Abadir, Hassan K. Reghbati. ACM Comput. Surv., 15(3):175-198, 1983.

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. itc 1983: 95-107

Process Complexity and Effective Random TestsClaus-Peter Schnorr. jcss, 7(4):376-388, 1973.

runs on WebDSL