Fred J. Meyer - researchr alias

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Viewing Publication 1 - 55 from 55

2006

2005

Analysis and evaluation of multisite testing for VLSIHamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi. tim, 54(5):1770-1778, 2005. [doi]

QCA-Based Majority Gate Design under Radius of Effect-Induced FaultsZachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer. dft 2005: 217-228 [doi]

2004

2003

Adaptive Algorithms for Maximal Diagnosis of Wiring InterconnectsWenyi Feng, Fred J. Meyer, Fabrizio Lombardi. TC, 52(10):1259-1270, 2003. [doi]

Hybrid Multisite Testing at ManufacturingHamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi. itc 2003: 927-936 [doi]

Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipmentYoung-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max. tim, 52(6):1749-1755, 2003. [doi]

Predicting Defect-Tolerant Yield in the Embedded Core ContextFred J. Meyer, Nohpill Park. TC, 52(11):1470-1479, 2003. [doi]

A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test EquipmentFengming Zhang, Young-Jun Lee, T. Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, S. Max, Phil Perkinson. dft 2003: 159-166 [doi]

Maximal diagnosis of interconnects of random access memoriesJun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park. tr, 52(4):423-434, 2003. [doi]

2002

Test Time Reduction in a Manufacturing Environment by Combining BIST and ATEHamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi. dft 2002: 186-194 [doi]

Random Testing of Multi-Port Static Random Access MemoriesFarzin Karimi, Fred J. Meyer, Fabrizio Lombardi. mtdt 2002: 101-108 [doi]

Analyzing and Diagnosing Interconnect Faults in Bus-Structured SystemsJun Zhao, Fred J. Meyer, Fabrizio Lombardi. dt, 19(1):54-64, 2002. [doi]

2001

Novel Approaches for Fault Detection in Two-Dimensional Combinational ArraysXiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi. dft 2001: 161-169 [doi]

Connectivity-Based Multichip Module RepairMinsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi. prdc 2001: 19-26 [doi]

2000

1999

Design Verification of FPGA ImplementationsXiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi. dt, 16(2):66-73, 1999. [doi]

Reconfiguring one-time programmable FPGAsXiao-Tao Chen, Wenyi Feng, Jun Zhao 0005, Fred J. Meyer, Fabrizio Lombardi. micro, 19(6):53-63, 1999. [doi]

Guest Editors Introduction: DRAM Architecture and TestingBruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer. dt, 16(1):19-21, 1999.

A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STDWenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi. ats 1999: 95-100 [doi]

Reconfiguration of One-Time Programmable FPGAs with Faulty Logic ResourcesWenyi Feng, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi. dft 1999: 368-376 [doi]

Novel Control Pattern Generators for Interconnect Testing with Boundary ScanWenyi Feng, Fred J. Meyer, Fabrizio Lombardi. dft 1999: 112-120 [doi]

Two-Step Algorithms for Maximal Diagnosis of Wiring InterconnectsWenyi Feng, Fred J. Meyer, Fabrizio Lombardi. ftcs 1999: 130-137 [doi]

Test generation and scheduling for layout-based detection of bridge faults in interconnectsTong Liu, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi. tvlsi, 7(1):48-55, 1999. [doi]

Good Processor Identification in Two-Dimensional GridsFred J. Meyer, Fabrizio Lombardi, Jun Zhao. dft 1999: 348-356 [doi]

Adaptive Fault Detection and Diagnosis of RAM InterconnectsJun Zhao, Fred J. Meyer, Fabrizio Lombardi. et, 15(1-2):157-171, 1999. [doi]

Maximal Diagnosis of Interconnects of Random Access MemoriesJun Zhao, Fred J. Meyer, Fabrizio Lombardi. vts 1999: 378-383 [doi]

Interconnect Diagnosis of Bus-Connected Multi-RAM SystemsJun Zhao, Fred J. Meyer, Fabrizio Lombardi. mtdt 1999: 40-47 [doi]

1998

1997

1993

Communication structures in fault-tolerant distributed systemsDhiraj K. Pradhan, Fred J. Meyer. networks, 23(4):379-389, 1993. [doi]

Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite modelD. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan. tvlsi, 1(4):546-558, 1993. [doi]

1991

Consensus With Dual Failure ModesFred J. Meyer, Dhiraj K. Pradhan. tpds, 2(2):214-222, 1991. [doi]

1989

Dynamic Testing Strategy for Distributed SystemsFred J. Meyer, Dhiraj K. Pradhan. TC, 38(3):356-365, 1989.

Modeling Defect Spatial DistributionFred J. Meyer, Dhiraj K. Pradhan. TC, 38(4):538-546, 1989.

1988

Flip-Trees: Fault-Tolerant Graphs with Wide ContainersFred J. Meyer, Dhiraj K. Pradhan. TC, 37(4):472-478, 1988.

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Publications by 'Fred J. Meyer'

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2006

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1988

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