Saman Adham - researchr alias

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Viewing Publication 1 - 21 from 21

2024

2022

2019

A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective FilteringShih-Lien Lu, Cheng-En Lee, Peter Noel, Saman Adham, Ted Wong, Jonathan Chang. vlsi-dat 2019: 1-4 [doi]

2014

2013

Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case studySandeep Kumar Goel, Saman Adham, Min-Jer Wang, Ji-Jan Chen, Tze-Chiang Huang, Ashok Mehta, Frank Lee, Vivek Chickermane, Brion L. Keller, Thomas Valind, Subhasish Mukherjee, Navdeep Sood, Jeongho Cho, Hayden Hyungdong Lee, Jungi Choi, Sangdoo Kim. itc 2013: 1-10 [doi]

2009

Improved Core Isolation and Access for Hierarchical Embedded TestBenoit Nadeau-Dostie, Saman Adham, Russ Abbott. dt, 26(1):18-25, 2009. [doi]

2004

A BIST Algorithm for Bit/Group Write Enable Faults in SRAMsSaman Adham, Benoit Nadeau-Dostie. mtdt 2004: 98-101 [doi]

2000

Comprehensive defect analysis and testability of current-mode logic circuitsSaman Adham, Dhamin Al-Khalili, Come Rozon, D. Raez. iscas 2000: 339-342 [doi]

Comparing defect coverage for current-mode logic and CMOS VLSI cellsCôme Rozon, Dhamin Al-Khalili, Saman Adham, Douglas Racz. icecsys 2000: 429-432 [doi]

1999

Design For Testability Method for CML Digital CircuitsBernard Antaki, Yvon Savaria, Nanhan Xiong, Saman Adham. date 1999: 360-367 [doi]

Scan-based BIST fault diagnosisYuejian Wu, Saman Adham. tcad, 18(2):203-211, 1999. [doi]

1998

Comprehensive Defect Analysis and Defect Coverage of CMOS CircuitsDhamin Al-Khalili, Saman Adham, Come Rozon, Moazzem Hossain, D. Racz. dft 1998: 84-92 [doi]

Test Reuse at System LevelJosé M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman. vts 1998: 318-319 [doi]

1996

DP-BIST: A Built-In Self Test For DSP DataPaths A Low Overhead and High Fault Coverage TechniqueSaman Adham, Sanjay Gupta. ats 1996: 205-212 [doi]

BIST Fault Diagnosis in Scan-Based VLSI EnvironmentsYuejian Wu, Saman Adham. itc 1996: 48-57

1995

Linking Diagnostic Software to Hardware Self Test in Telecom SystemsHarry Hulvershorn, Paul Soong, Saman Adham. itc 1995: 986-993

A New Hardware Fault Insertion Scheme for System Diagnostics VerificationBenoit Nadeau-Dostie, Harry Hulvershorn, Saman Adham. itc 1995: 994-1002

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