Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 32, Issue 9

1293 -- 1306Andrea Acquaviva, Nicola Bombieri, Franco Fummi, Sara Vinco. Semi-Automatic Generation of Device Drivers for Rapid Embedded Platform Development
1307 -- 1320Yan Luo, Krishnendu Chakrabarty. Design of Pin-Constrained General-Purpose Digital Microfluidic Biochips
1321 -- 1334Suming Lai, Boyuan Yan, Peng Li. Localized Stability Checking and Design of IC Power Delivery With Distributed Voltage Regulators
1335 -- 1346Yibo Chen, Eren Kursun, Dave Motschman, Charles Johnson, Yuan Xie. Through Silicon Via Aware Design Planning for Thermally Efficient 3-D Integrated Circuits
1347 -- 1356Yuan-Kai Ho, Hsu-Chieh Lee, Yao-Wen Chang. Escape Routing for Staggered-Pin-Array PCBs
1357 -- 1368Xiang Qiu, Malgorzata Marek-Sadowska. Routing Challenges for Designs With Super High Pin Density
1369 -- 1382Vasileios Tenentes, Xrysovalantis Kavousianos. High-Quality Statistical Test Compression With Narrow ATE Interface
1383 -- 1394John Liaperdos, Angela Arapoyanni, Y. Tsiatouhas. Adjustable RF Mixers' Alternate Test Efficiency Optimization by the Reduction of Test Observables
1395 -- 1408Naghmeh Karimi, Krishnendu Chakrabarty. Detection, Diagnosis, and Recovery From Clock-Domain Crossing Failures in Multiclock SoCs
1409 -- 1420Jinpeng Lv, Priyank Kalla, Florian Enescu. Efficient Gröbner Basis Reductions for Formal Verification of Galois Field Arithmetic Circuits
1421 -- 1434Yi-Ting Chung, Jie-Hong Roland Jiang. Functional Timing Analysis Made Fast and General
1435 -- 1439Zuochang Ye. Noise Companion State-Space Passive Macromodeling for RF/mm-Wave Circuit Design
1440 -- 1444Li-Ren Huang, Shi-Yu Huang, Stephen K. Sunter, Kun-Han Tsai, Wu-Tung Cheng. Oscillation-Based Prebond TSV Test
1445 -- 1449Irith Pomeranz. Functional Broadside Tests With Incompletely Specified Scan-In States

Volume 32, Issue 8

1137 -- 1150Jen-Wei Hsieh, Yu-Cheng Zheng, Yong-Sheng Peng, Po-Hung Yeh. VAST: Virtually Associative Sector Translation for MLC Storage Systems
1151 -- 1162Ying-Han Chen, Chung-Lun Hsu, Li-Chen Tsai, Tsung-Wei Huang, Tsung-Yi Ho. A Reliability-Oriented Placement Algorithm for Reconfigurable Digital Microfluidic Biochips Using 3-D Deferred Decision Making Technique
1163 -- 1176Mihir R. Choudhury, Kartik Mohanram. Low Cost Concurrent Error Masking Using Approximate Logic Circuits
1177 -- 1186Dan Burke, Tom Smy. Thermal Models for Optical Circuit Simulation Using a Finite Cloud Method and Model Reduction Techniques
1187 -- 1200Ehsan K. Ardestani, Francisco J. Mesa-Martinez, Gabriel Southern, Elnaz Ebrahimi, Jose Renau. Sampling in Thermal Simulation of Processors: Measurement, Characterization, and Evaluation
1201 -- 1214Chris Yakopcic, Tarek M. Taha, Guru Subramanyam, Robinson E. Pino. Generalized Memristive Device SPICE Model and its Application in Circuit Design
1215 -- 1227Ulrich Brenner. BonnPlace Legalization: Minimizing Movement by Iterative Augmentation
1228 -- 1239Zigang Xiao, Yuelin Du, Hongbo Zhang, Martin D. F. Wong. A Polynomial Time Exact Algorithm for Overlay-Resistant Self-Aligned Double Patterning (SADP) Layout Decomposition
1240 -- 1253Peter van Stralen, Andy D. Pimentel. Fitness Prediction Techniques for Scenario-Based Design Space Exploration
1254 -- 1264Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Wee-Lung Ang. An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters
1265 -- 1273Shi-Yu Huang, Yu-Hsiang Lin, Li-Ren Huang, Kun-Han Tsai, Wu-Tung Cheng. Programmable Leakage Test and Binning for TSVs With Self-Timed Timing Control
1274 -- 1287Srobona Mitra, Ansuman Banerjee, Pallab Dasgupta, Priyankar Ghosh, Harish Kumar. Formal Guarantees for Localized Bug Fixes
1288 -- 1292Andrew B. Kahng, Seokhyeong Kang, Tajana Simunic Rosing, Richard D. Strong. Many-Core Token-Based Adaptive Power Gating

Volume 32, Issue 7

977 -- 990Leyi Yin, Yue Deng, Peng Li. Simulation-Assisted Formal Verification of Nonlinear Mixed-Signal Circuits With Bayesian Inference Guidance
991 -- 1002Mark Po-Hung Lin, Yi-Ting He, Vincent Wei-Hao Hsiao, Rong-Guey Chang, Shuenn-Yuh Lee. Common-Centroid Capacitor Layout Generation Considering Device Matching and Parasitic Minimization
1003 -- 1016Qing Xie, Yanzhi Wang, Younghyun Kim, Massoud Pedram, Naehyuck Chang. Charge Allocation in Hybrid Electrical Energy Storage Systems
1017 -- 1030Donghwa Shin, Younghyun Kim, Naehyuck Chang, Massoud Pedram. Dynamic Driver Supply Voltage Scaling for Organic Light Emitting Diode Displays
1031 -- 1044Vidyabhushan Mohan, Trevor Bunker, Laura M. Grupp, Sudhanva Gurumurthi, Mircea R. Stan, Steven Swanson. Modeling Power Consumption of NAND Flash Memories Using FlashPower
1045 -- 1058Chuan Xu, Seshadri K. Kolluri, Kazuhiko Endo, Kaustav Banerjee. Analytical Thermal Model for Self-Heating in Advanced FinFET Devices With Implications for Design and Reliability
1059 -- 1071Xuanxing Xiong, Jia Wang. Verifying RLC Power Grids With Transient Current Constraints
1072 -- 1085Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar. Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression
1086 -- 1099Mohammad Rahman, Hiran Tennakoon, Carl Sechen. Library-Based Cell-Size Selection Using Extended Logical Effort
1100 -- 1109Chiao-Ling Lung, Yu-Shih Su, Hsih-Hsiu Huang, Yiyu Shi, Shih-Chieh Chang. Through-Silicon Via Fault-Tolerant Clock Networks for 3-D ICs
1110 -- 1123Shervin Sharifi, Dilip Krishnaswamy, Tajana Simunic Rosing. PROMETHEUS: A Proactive Method for Thermal Management of Heterogeneous MPSoCs
1124 -- 1135Abishek Ramdas, Ozgur Sinanoglu. Testing Chips With Spare Identical Cores

Volume 32, Issue 6

809 -- 817Yibo Guo, Qingfeng Zhuge, Jingtong Hu, Juan Yi, Meikang Qiu, Edwin Hsing-Mean Sha. Data Placement and Duplication for Embedded Multicore Systems With Scratch Pad Memory
818 -- 830Matthew Amy, Dmitri Maslov, Michele Mosca, Martin Roetteler. A Meet-in-the-Middle Algorithm for Fast Synthesis of Depth-Optimal Quantum Circuits
831 -- 844Omid Sarbishei, Katarzyna Radecka. On the Fixed-Point Accuracy Analysis and Optimization of Polynomial Specifications
845 -- 857Dusung Kim, Maciej J. Ciesielski, Seiyang Yang. MULTES: Multilevel Temporal-Parallel Event-Driven Simulation
858 -- 868Haotian Liu, Ngai Wong. Autonomous Volterra Algorithm for Steady-State Analysis of Nonlinear Circuits
869 -- 881Hamed Abrishami, Safar Hatami, Massoud Pedram. Design and Multicorner Optimization of the Energy-Delay Product of CMOS Flip-Flops Under the Negative Bias Temperature Instability Effect
882 -- 893Tao Huang, Evangeline F. Y. Young. ObSteiner: An Exact Algorithm for the Construction of Rectilinear Steiner Minimum Trees in the Presence of Complex Rectilinear Obstacles
894 -- 904Andrzej Kozik. Fully Dynamic Evaluation of Sequence Pair
905 -- 917Krit Athikulwongse, Jae-Seok Yang, David Z. Pan, Sung Kyu Lim. Impact of Mechanical Stress on the Full Chip Timing for Through-Silicon-Via-based 3-D ICs
918 -- 927Ashutosh Chakraborty, David Z. Pan. Skew Management of NBTI Impacted Gated Clock Trees
928 -- 939Yu-Fu Yeh, Hsin-Cheng Lin, Chung-Yang Huang. An Ultrasynchronization Checking Method With Trace-Driven Simulation for Fast and Accurate MPSoC Virtual Platform Simulation
940 -- 951Wooyoung Jang, David Z. Pan. Chemical-Mechanical Polishing-Aware Application-Specific 3D NoC Design
952 -- 965Samuel Hertz, David Sheridan, Shobha Vasudevan. Mining Hardware Assertions With Guidance From Static Analysis
966 -- 970Andrei B. Khlopotine, Vikram Jandhyala, Desmond Kirkpatrick. A Variant of Parallel Plane Sweep Algorithm for Multicore Systems
971 -- 975Chia-Yuan Chang, Kuan-Yu Liao, Sheng-Chang Hsu, James Chien-Mo Li, Jiann-Chyi Rau. Compact Test Pattern Selection for Small Delay Defect

Volume 32, Issue 5

653 -- 666Daesung Lee 0002, W. Scott Lee, Chen Chen, Farzan Fallah, J. Provine, Soogine Chong, John Watkins, Roger T. Howe, H.-S. Philip Wong, Subhasish Mitra. Combinational Logic Design Using Six-Terminal NEM Relays
667 -- 680Bill Teng, Jason Helge Anderson. Latch-Based Performance Optimization for Field-Programmable Gate Arrays
681 -- 694Mirjana Stojilovic, David Novo, Lazar Saranovac, Philip Brisk, Paolo Ienne. Selective Flexibility: Creating Domain-Specific Reconfigurable Arrays
695 -- 708Sangyoung Park, Jaehyun Park, Donghwa Shin, Yanzhi Wang, Qing Xie, Massoud Pedram, Naehyuck Chang. Accurate Modeling of the Delay and Energy Overhead of Dynamic Voltage and Frequency Scaling in Modern Microprocessors
709 -- 722Wen-Hao Liu, Wei-Chun Kao, Yih-Lang Li, Kai-Yuan Chao. NCTU-GR 2.0: Multithreaded Collision-Aware Global Routing With Bounded-Length Maze Routing
723 -- 736Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu. Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting
737 -- 747Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, Stephen K. Sunter, Yung-Fa Chou, Ding-Ming Kwai. Parametric Delay Test of Post-Bond Through-Silicon Vias in 3-D ICs via Variable Output Thresholding Analysis
748 -- 759Xiao Liu, Qiang Xu. On Multiplexed Signal Tracing for Post-Silicon Validation
760 -- 773Abdul Naeem, Axel Jantsch, Zhonghai Lu. Scalability Analysis of Memory Consistency Models in NoC-Based Distributed Shared Memory SoCs
774 -- 787Alessandro Cimatti, Iman Narasamdya, Marco Roveri. Software Model Checking SystemC
788 -- 801Jayanand Asok Kumar, Shobha Vasudevan. Formal Probabilistic Timing Verification in RTL
802 -- 806Quan Chen, Wim Schoenmaker, Guan-Hua Chen, Lijun Jiang, Ngai Wong. A Numerically Efficient Formulation for Time-Domain Electromagnetic-Semiconductor Cosimulation for Fast-Transient Systems

Volume 32, Issue 4

485 -- 486Yuan Xie, Gabriel H. Loh. Guest Editorial
487 -- 496Wei Yao, Siming Pan, Brice Achkir, Jun Fan, Lei He. Modeling and Application of Multi-Port TSV Networks in 3-D IC
497 -- 509Meng-Kai Hsu, Valeriy Balabanov, Yao-Wen Chang. TSV-Aware Analytical Placement for 3-D IC Designs Based on a Novel Weighted-Average Wirelength Model
510 -- 523Guojie Luo, Yiyu Shi, Jason Cong. An Analytical Placement Framework for 3-D ICs and Its Extension on Thermal Awareness
524 -- 537Mohamed M. Sabry, Arvind Sridhar, Jie Meng, Ayse Kivilcim Coskun, David Atienza. GreenCool: An Energy-Efficient Liquid Cooling Design Technique for 3-D MPSoCs Via Channel Width Modulation
538 -- 546Nabeeh Kandalaft, Rashid Rashidzadeh, Majid Ahmadi. Testing 3-D IC Through-Silicon-Vias (TSVs) by Direct Probing
547 -- 558Brandon Noia, Krishnendu Chakrabarty. Pre-Bond Probing of Through-Silicon Vias in 3-D Stacked ICs
559 -- 571Li Jiang, Qiang Xu, Bill Eklow. On Effective Through-Silicon Via Repair for 3-D-Stacked ICs
572 -- 583Che-Wei Chou, Yu-Jen Huang, Jin-Fu Li. A Built-In Self-Repair Scheme for 3-D RAMs With Interdie Redundancy
584 -- 596Yaoyao Ye, Jiang Xu, Baihan Huang, Xiaowen Wu, Wei Zhang 0012, Xuan Wang, Mahdi Nikdast, Zhehui Wang, Weichen Liu, Zhe Wang. 3-D Mesh-Based Optical Network-on-Chip for Multiprocessor System-on-Chip
597 -- 610Christian Weis, Igor Loi, Luca Benini, Norbert Wehn. Exploration and Optimization of 3-D Integrated DRAM Subsystems
611 -- 615Jonathan Valamehr, Timothy Sherwood, Ryan Kastner, David Marangoni-Simonsen, Ted Huffmire, Cynthia E. Irvine, Timothy E. Levin. A 3-D Split Manufacturing Approach to Trustworthy System Development
616 -- 629Cristian Ferent, Alex Doboli. Symbolic Matching and Constraint Generation for Systematic Comparison of Analog Circuits
630 -- 643Cheng Zhuo, Dennis Sylvester, David Blaauw. A Statistical Framework for Post-Fabrication Oxide Breakdown Reliability Prediction and Management

Volume 32, Issue 3

325 -- 338Jie Wu 0001, Jia Wang, Kun Li, Hai Zhou, Qin Lv, Li Shang, Yihe Sun. Large-Scale Energy Storage System Design and Optimization for Emerging Electric-Drive Vehicles
339 -- 352Antoine Morvan, Steven Derrien, Patrice Quinton. Polyhedral Bubble Insertion: A Method to Improve Nested Loop Pipelining for High-Level Synthesis
353 -- 366Wenjian Yu, Hao Zhuang, Chao Zhang, Gang Hu, Zhi Liu. RWCap: A Floating Random Walk Solver for 3-D Capacitance Extraction of Very-Large-Scale Integration Interconnects
367 -- 380Bing Li, Ning Chen, Yang Xu, Ulf Schlichtmann. On Timing Model Extraction and Hierarchical Statistical Timing Analysis
381 -- 391Ching-Yu Chin, Chung-Yi Kuan, Tsung-Ying Tsai, Hung-Ming Chen, Yoji Kajitani. Escaped Boundary Pins Routing for High-Speed Boards
392 -- 405Kyoung-Hwan Lim, Deokjin Joo, Taewhan Kim. An Optimal Allocation Algorithm of Adjustable Delay Buffers and Practical Extensions for Clock Skew Optimization in Multiple Power Mode Designs
406 -- 418Wei Liu, Andrea Calimera, Alberto Macii, Enrico Macii, Alberto Nannarelli, Massimo Poncino. Layout-Driven Post-Placement Techniques for Temperature Reduction and Thermal Gradient Minimization
419 -- 432Po-Hsun Wu, Mark Po-Hung Lin, Tung-Chieh Chen, Tsung-Yi Ho, Yu-chuan Chen, Shun-Ren Siao, Shu-Hung Lin. 1-D Cell Generation With Printability Enhancement
433 -- 441Iftekhar Ibne Basith, Nabeeh Kandalaft, Rashid Rashidzadeh, Majid Ahmadi. Charge-Controlled Readout and BIST Circuit for MEMS Sensors
442 -- 452Irith Pomeranz. Generation of Functional Broadside Tests for Logic Blocks With Constrained Primary Input Sequences
453 -- 466Kuntal Nanshi, Fabio Somenzi. Using Abstraction to Guide the Search for Long Error Traces
467 -- 478Shao-Lun Huang, Wei-Hsun Lin, Po-Kai Huang, Chung-Yang Huang. Match and Replace: A Functional ECO Engine for Multierror Circuit Rectification
479 -- 483Pedro Reviriego, Salvatore Pontarelli, Juan Antonio Maestro, Marco Ottavi. A Method to Construct Low Delay Single Error Correction Codes for Protecting Data Bits Only

Volume 32, Issue 2

173 -- 174Jiang Hu, Cheng-Kok Koh. Guest editorial: Special section on cross-domain physical optimization
175 -- 188Jackey Z. Yan, Chris Chu. SDS: An Optimal Slack-Driven Block Shaping Algorithm for Fixed-Outline Floorplanning
189 -- 201Shao-Yun Fang, Wei-Yu Chen, Yao-Wen Chang. Graph-Based Subfield Scheduling for Electron-Beam Photomask Fabrication
202 -- 215Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta. Layout Decomposition and Legalization for Double-Patterning Technology
216 -- 227Jia-Wen Chang, Sheng-Han Yeh, Tsung-Wei Huang, Tsung-Yi Ho. Integrated Fluidic-Chip Co-Design Methodology for Digital Microfluidic Biochips
228 -- 241Samuel I. Ward, Myung-Chul Kim, Natarajan Viswanathan, Zhuo Li, Charles J. Alpert, Earl E. Swartzlander Jr., David Z. Pan. Structure-Aware Placement Techniques for Designs With Datapaths
242 -- 246Chih-Long Chang, Iris Hui-Ru Jiang. Pulsed-Latch Replacement Using Concurrent Time Borrowing and Clock Gating
247 -- 260JungHee Lee, Youngjae Kim, Galen M. Shipman, Sarp Oral, Jongman Kim. Preemptible I/O Scheduling of Garbage Collection for Solid State Drives
261 -- 274Xiaoming Chen, Yu Wang 0002, Huazhong Yang. NICSLU: An Adaptive Sparse Matrix Solver for Parallel Circuit Simulation
275 -- 288Guoyong Shi. Graph-Pair Decision Diagram Construction for Topological Symbolic Circuit Analysis
289 -- 300Ozgur Sinanoglu. Scan to Nonscan Conversion via Test Cube Analysis
301 -- 312Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents
313 -- 317Fabio L. Traversa, Fabrizio Bonani. Selective Determination of Floquet Quantities for the Efficient Assessment of Limit Cycle Stability and Oscillator Noise
318 -- 322Mengmeng Li, Ru-Shan Chen, HuaXia Wang, Zhenhong Fan, Qian Hu. A Multilevel FFT Method for the 3-D Capacitance Extraction

Volume 32, Issue 12

1837 -- 1838Sachin S. Sapatnekar. Editorial
1839 -- 1852Yan Luo, Krishnendu Chakrabarty, Tsung-Yi Ho. Real-Time Error Recovery in Cyberphysical Digital-Microfluidic Biochips Using a Compact Dictionary
1853 -- 1865Shervin Vakili, J. M. Pierre Langlois, Guy Bois. Enhanced Precision Analysis for Accuracy-Aware Bit-Width Optimization Using Affine Arithmetic
1866 -- 1878Seong-I. Lei, Wai-Kei Mak. Simultaneous Constrained Pin Assignment and Escape Routing Considering Differential Pairs for FPGA-PCB Co-Design
1879 -- 1891Domenic Forte, Ankur Srivastava. Improving the Quality of Delay-Based PUFs via Optical Proximity Correction
1892 -- 1905Young-Joon Lee, Sung Kyu Lim. Ultrahigh Density Logic Designs Using Monolithic 3-D Integration
1906 -- 1919Young-Jin Yoon, Nicola Concer, Michele Petracca, Luca P. Carloni. Virtual Channels and Multiple Physical Networks: Two Alternatives to Improve NoC Performance
1920 -- 1933De Ma, Rongjie Yan, Kai Huang, Min Yu, Siwen Xiu, Haitong Ge, Xiaolang Yan, Ahmed Amine Jerraya. Performance Estimation Techniques With MPSoC Transaction-Accurate Models
1934 -- 1942Ender Yilmaz, Sule Ozev, Kenneth M. Butler. Efficient Process Shift Detection and Test Realignment
1943 -- 1956Huan Chen 0001, Joao Marques-Silva. A Two-Variable Model for SAT-Based ATPG
1957 -- 1965Irith Pomeranz. Non-Test Cubes for Test Generation Targeting Hard-to-Detect Faults
1966 -- 1977Amitabh Das, Baris Ege, Santosh Ghosh, Lejla Batina, Ingrid Verbauwhede. Security Analysis of Industrial Test Compression Schemes
1978 -- 1991Srobona Mitra, Ansuman Banerjee, Pallab Dasgupta, Harish Kumar. Counterexample Ranking Using Mined Invariants
1992 -- 2003Tsung-Po Liu, Shuo-Ren Lin, Jie-Hong R. Jiang. Software Workarounds for Hardware Errors: Instruction Patch Synthesis
2004 -- 2008Liping Wang, Andrew R. Brown, Binjie Cheng, Asen Asenov. Analytical Models for Three-Dimensional Ion Implantation Profiles in FinFETs
2009 -- 2013S. A. Nahvi, M. Nabi, S. Janardhanan. Piece-wise Quasi-linear Approximation for Nonlinear Model Reduction
2014 -- 2018Wenjian Yu, Tao Zhang, Xiaolong Yuan, Haifeng Qian. Fast 3-D Thermal Simulation for Integrated Circuits With Domain Decomposition Method
2019 -- 2023Smarjeet Sharma, Nicolas G. Constantin. Formulations for the Estimation of IMD Levels in an Envelope Feedback RFIC Amplifier: An Extension to Dynamic AM and PM Behavior

Volume 32, Issue 11

1641 -- 1654Ricardo Martins, Nuno C. Lourenço, Nuno Horta. LAYGEN II - Automatic Layout Generation of Analog Integrated Circuits
1655 -- 1667Jia-Wen Chang, Sheng-Han Yeh, Tsung-Wei Huang, Tsung-Yi Ho. An ILP-Based Routing Algorithm for Pin-Constrained EWOD Chips With Obstacle Avoidance
1668 -- 1681Gayatri Mehta, Krunalkumar Patel, Natalie Parde, Nancy S. Pollard. Data-Driven Mapping Using Local Patterns
1682 -- 1693Hans Georg Brachtendorf, Kai Bittner. Grid Size Adapted Multistep Methods for High $Q$ Oscillators
1694 -- 1707Moongon Jung, David Z. Pan, Sung Kyu Lim. Chip/Package Mechanical Stress Impact on 3-D IC Reliability and Mobility Variations
1708 -- 1721Jordi Cortadella. Area-Optimal Transistor Folding for 1-D Gridded Cell Design
1722 -- 1733Hua-Yu Chang, Iris Hui-Ru Jiang, Yao-Wen Chang. ECO Optimization Using Metal-Configurable Gate-Array Spare Cells
1734 -- 1747Sai Manoj Pudukotai Dinakarrao, Hao Yu, Yang Shang, Chuan Seng Tan, Sung Kyu Lim. Reliable 3-D Clock-Tree Synthesis Considering Nonlinear Capacitive TSV Model With Electrical-Thermal-Mechanical Coupling
1748 -- 1761Jinho Lee, Moo-Kyoung Chung, Yeon Gon Cho, Soojung Ryu, Jung Ho Ahn, Kiyoung Choi. Mapping and Scheduling of Tasks and Communications on Many-Core SoC Under Local Memory Constraint
1762 -- 1775Panagiotis Sismanoglou, Dimitris Nikolos. Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic Approaches
1776 -- 1786Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. Test Time Reduction in EDT Bandwidth Management for SoC Designs
1787 -- 1800Chandan Karfa, Kunal Banerjee, Dipankar Sarkar, Chittaranjan A. Mandal. Verification of Loop and Arithmetic Transformations of Array-Intensive Behaviors
1801 -- 1813Aritra Hazra, Rajdeep Mukherjee, Pallab Dasgupta, Ajit Pal, Kevin Harer, Ansuman Banerjee, Subhankar Mukherjee. POWER-TRUCTOR: An Integrated Tool Flow for Formal Verification and Coverage of Architectural Power Intent
1814 -- 1818Libo Huang, Zhiying Wang, Nong Xiao, Yongwen Wang, Qiang Dou. Dynamic Streamization Model Execution for SIMD Engines on Multicore Architectures
1819 -- 1823Aayush Prakash, Hiren D. Patel. An Instruction Scratchpad Memory Allocation for the Precision Timed Architecture
1824 -- 1828Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur. A Metric for Test Set Characterization and Customization Toward Fault Diagnosis
1829 -- 1833Predrag Teodorovic, Stanisa Dautovic, Veljko Malbasa. Recursive Boolean Formula Minimization Algorithms for Implication Logic

Volume 32, Issue 10

1453 -- 1472David Z. Pan, Bei Yu, Jhih-Rong Gao. Design for Manufacturing With Emerging Nanolithography
1473 -- 1483Yung-Chih Chen, Chun-Yao Wang, Ching-Yi Huang. Verification of Reconfigurable Binary Decision Diagram-Based Single-Electron Transistor Arrays
1484 -- 1494Juinn-Dar Huang, Chia-Hung Liu, Huei-Shan Lin. Reactant and Waste Minimization in Multitarget Sample Preparation on Digital Microfluidic Biochips
1495 -- 1508Morteza Damavandpeyma, Sander Stuijk, Twan Basten, Marc Geilen, Henk Corporaal. Schedule-Extended Synchronous Dataflow Graphs
1509 -- 1519Seungwook Paek, Wongyu Shin, Jaehyeong Sim, Lee-Sup Kim. PowerField: A Probabilistic Approach for Temperature-to-Power Conversion Based on Markov Random Field Theory
1520 -- 1532Youngae Han, Jinsong Zhao. Accurate Substrate Analysis Based on a Novel Finite Difference Method via Synchronization Method on Layered and Adaptive Meshing
1533 -- 1545Zheng Zhang, Tarek A. El-Moselhy, Ibrahim M. Elfadel, Luca Daniel. Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos
1546 -- 1556Xu He, Tao Huang, Linfu Xiao, Haitong Tian, Evangeline F. Y. Young. Ripple: A Robust and Effective Routability-Driven Placer
1557 -- 1568Fong-Yuan Chang, Ren-Song Tsay, Wai-Kei Mak, Sheng-Hsiung Chen. MANA: A Shortest Path Maze Algorithm Under Separation and Minimum Length NAnometer Rules
1569 -- 1582Nikita Nikitin, Javier de San Pedro, Jordi Cortadella. Architectural Exploration of Large-Scale Hierarchical Chip Multiprocessors
1583 -- 1594Fang Bao, Ke Peng, Mohammad Tehranipoor, Krishnendu Chakrabarty. Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects
1595 -- 1608Xiaofei Guo, Ramesh Karri. Recomputing with Permuted Operands: A Concurrent Error Detection Approach
1609 -- 1622Brian Keng, Andreas G. Veneris. Path-Directed Abstraction and Refinement for SAT-Based Design Debugging
1623 -- 1627Rupesh S. Shelar, Marek Patyra. Impact of Local Interconnects on Timing and Power in a High Performance Microprocessor
1628 -- 1632Jieyi Long, Dawei Li, Seda Ogrenci Memik, Semail Ulgen. Theory and Analysis for Optimization of On-Chip Thermoelectric Cooling Systems
1633 -- 1637Chao Zhang, Wenjian Yu. Efficient Space Management Techniques for Large-Scale Interconnect Capacitance Extraction With Floating Random Walks

Volume 32, Issue 1

1 -- 0Sachin S. Sapatnekar. Editorial
8 -- 23Puneet Gupta, Yuvraj Agarwal, Lara Dolecek, Nikil Dutt, Rajesh K. Gupta, Rakesh Kumar, Subhasish Mitra, Alexandru Nicolau, Tajana Simunic Rosing, Mani B. Srivastava, Steven Swanson, Dennis Sylvester. Underdesigned and Opportunistic Computing in Presence of Hardware Variability
24 -- 33Fang Gong, Sina Basir-Kazeruni, Lei He, Hao Yu. Stochastic Behavioral Modeling and Analysis for Analog/Mixed-Signal Circuits
34 -- 46Junwhan Ahn, Kiyoung Choi. Isomorphism-Aware Identification of Custom Instructions With I/O Serialization
47 -- 58Ajay N. Bhoj, Rajiv V. Joshi, Niraj K. Jha. Efficient Methodologies for 3-D TCAD Modeling of Emerging Devices and Circuits
59 -- 72Yan Luo, Krishnendu Chakrabarty, Tsung-Yi Ho. Error Recovery in Cyberphysical Digital Microfluidic Biochips
73 -- 86Karthik V. Aadithya, Alper Demir, Sriramkumar Venugopalan, Jaijeet S. Roychowdhury. Accurate Prediction of Random Telegraph Noise Effects in SRAMs and DRAMs
87 -- 99Ing-Chao Lin, Chin-Hung Lin, Kuan-Hui Li. Leakage and Aging Optimization Using Transmission Gate-Based Technique
100 -- 110Farshad Firouzi, Saman Kiamehr, Mehdi Baradaran Tahoori. Power-Aware Minimum NBTI Vector Selection Using a Linear Programming Approach
111 -- 123Jongyoon Jung, Taewhan Kim. Statistical Viability Analysis for Detecting False Paths Under Delay Variation
124 -- 137Vaibhav Gupta, Debabrata Mohapatra, Anand Raghunathan, Kaushik Roy. Low-Power Digital Signal Processing Using Approximate Adders
138 -- 151Tak-Yung Kim, Taewhan Kim. Resource Allocation and Design Techniques of Prebond Testable 3-D Clock Tree
152 -- 164Wei-Cheng Lien, Kuen-Jong Lee, Tong-Yu Hsieh, Krishnendu Chakrabarty, Yu-Hua Wu. Counter-Based Output Selection for Test Response Compaction
165 -- 169Shyue-Kung Lu, Huan-Hua Huang, Jiun-Lang Huang, Pony Ning. Synergistic Reliability and Yield Enhancement Techniques for Embedded SRAMs