Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 11, Issue 9

1053 -- 1064Fur-Shing Tsai, Yu-Chin Hsu. STAR: An automatic data path allocator
1065 -- 1073Kwang-Ting Cheng, Jing-Yang Jou. A functional fault model for sequential machines
1074 -- 1085Lars W. Hagen, Andrew B. Kahng. New spectral methods for ratio cut partitioning and clustering
1086 -- 1094Xiaodong Zhang. Dynamic and static load balancing for solving block bordered circuit equations on multiprocessors
1095 -- 1103Majid Sarrafzadeh, Chak-Kuen Wong. Hierarchical Steiner tree construction in uniform orientations
1104 -- 1113Tsuneo Okubo, Takashi Watanabe, Kou Wada, Kazuyuki Saito. A novel geometric resizing technique for data conversion from CAD data to electron beam exposure data
1114 -- 1119Masayoshi Shirahata, Hiromi Kusano, Norihiko Kotani, Shigeru Kusanoki, Yoichi Akasaka. A mobility model including the screening effect in MOS inversion layer
1120 -- 1130Peter M. Maurer. Two new techniques for unit-delay compiled simulation
1131 -- 1139. An incremental zero/integer delay switch-level simulation environment
1140 -- 1152Mark Hirsch, Daniel P. Siewiorek. The effect of placement of automatically extracted structure
1153 -- 1160Weiping Shi, W. Kent Fuchs. Probabilistic analysis and algorithms for reconfiguration of memory arrays
1161 -- 1166Wu-Tung Cheng, James L. Lewandowski, Eleanor Wu. Optimal diagnostic methods for wiring interconnects
1166 -- 1172Abhijit Ghosh, Srinivas Devadas, A. Richard Newton. Heuristic minimization of Boolean relations using testing techniques

Volume 11, Issue 8

943 -- 954Maciej J. Ciesielski, Seiyang Yang. PLADE: a two-stage PLA decomposition
955 -- 965Rajiv Jain, Alice C. Parker, Nohbyung Park. Predicting system-level area and delay for pipelined and nonpipelined designs
966 -- 975Albert V. Ferris-Prabhu. On the assumptions contained in semiconductor yield models
976 -- 991Chia-Chun Tsai, Sao-Jie Chen, Wu-Shiung Feng. An H-V alternating router
992 -- 1002Ting-Chi Wang, Martin D. F. Wong. Optimal floorplan area optimization
1003 -- 1012Kartikeya Mayaram, Donald O. Pederson. Coupling algorithms for mixed-level circuit and device simulation
1013 -- 1023Mamoru Kurata, Shin Nakamura. An explicit method of numerical integration for the complete set of semiconductor device equations
1024 -- 1031Yeong-Yil Yang, Chong-Min Kyung. HALO: an efficient global placement strategy for standard cells
1032 -- 1043J. Richard Griffith, Michel S. Nakhla. Mixed frequency/time domain analysis of nonlinear circuits
1044 -- 1051Somchai Prasitjutrakul, William J. Kubitz. A performance-driven global router for custom VLSI chip design

Volume 11, Issue 7

805 -- 815Tom Dhaene, Daniel De Zutter. Selection of lumped element models for coupled lossy transmission lines
816 -- 824Mary L. Bailey. A time-based model for investigating parallel logic-level simulation
825 -- 843Sharad Malik, Luciano Lavagno, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli. Symbolic minimization of multilevel logic and the input encoding problem
844 -- 854Sung-Soo Kim, Chong-Min Kyung. Circuit placement on arbitrarily shaped regions using the self-organization principle
855 -- 863Stephan Müller, Kevin Kells, Wolfgang Fichtner. Automatic rectangle-based adaptive mesh generation without obtuse angles
864 -- 875Kenneth M. McDonald, Joseph G. Peters. Smallest paths in simple rectilinear polygons
876 -- 884Hans-Rudolf Heeb, Wolfgang Fichtner. A module generator based on the PQ-tree algorithm
885 -- 892Scott W. Hadley, Brian L. Mark, Anthony Vannelli. An efficient eigenvector approach for finding netlist partitions
893 -- 902Andrew B. Kahng, Gabriel Robins. A new class of iterative Steiner tree heuristics with good performance
903 -- 910Shankar Pennathur, Harry H. L. Kwok. Simulation of charge transfer in GaAs Cermet-Gate CCDs
911 -- 920Edward W. Scheckler, Alexander S. Wong, Robert K. Wang, Goodwin R. Chin, John R. Camagna, Andrew R. Neureuther, Robert W. Dutton. A utility-based integrated system for process simulation
921 -- 925Hiroyoshi Tanimoto, Naoyuki Shigyo. Discretization error in MOSFET device simulation
926 -- 938Eun Sei Park, M. Ray Mercer. An efficient delay test generation system for combinational logic circuits

Volume 11, Issue 6

677 -- 695David W. Knapp. Fasolt: a program for feedback-driven data-path optimization
696 -- 718David C. Ku, Giovanni De Micheli. Relative scheduling under timing constraints: algorithms for high-level synthesis of digital circuits
719 -- 731Yung-Ho Shih, Sung-Mo Kang. Analytic transient solution of general MOS circuit primitives
732 -- 738Terence B. Hook. Automatic extraction of circuit models from layout artwork for a BiCMOS technology
739 -- 752Jason Cong, Andrew B. Kahng, Gabriel Robins, Majid Sarrafzadeh, Chak-Kuen Wong. Provably good performance-driven global routing
753 -- 758Charles R. Bonapace, Chi-Yuan Lo. An O(n log m) algorithm for VLSI design rule checking
759 -- 767Joohyun Jin, Jerry G. Fossum. Non-quasi-static modeling/implementation of BJT current crowding for seminumerical mixed-mode device/circuit simulation
768 -- 777André Ivanov, Yervant Zorian. Count-based BIST compaction schemes and aliasing probability computation
778 -- 793Janusz Rajski, Jagadeesh Vasudevamurthy. The testability-preserving concurrent decomposition and factorization of Boolean expressions
794 -- 800Silvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò. Testability measures in pseudorandom testing
800 -- 803Michael J. Bryan, Srinivas Devadas, Kurt Keutzer. Necessary and sufficient conditions for hazard-free robust transistor stuck-open-fault testability in multilevel networks

Volume 11, Issue 5

545 -- 554TingTing Hwang, Robert Michael Owens, Mary Jane Irwin. Efficiently computing communication complexity for multilevel logic synthesis
555 -- 565David M. Lewis. A compiled-code hardware accelerator for circuit simulation
566 -- 574Luis Miguel Silveira, Jacob K. White, Horácio C. Neto, Luís M. Vidigal. On exponential fitting for circuit simulation
575 -- 585Rakesh Chadha, Chandramouli Visweswariah, Chin-Fu Chen. M:::3:::-a multilevel mixed-mode mixed A/D simulator
586 -- 597John Y. Lee, Xiaoli Huang, Ronald A. Rohrer. Pole and zero sensitivity calculation in asymptotic waveform evaluation
598 -- 606Donald J. Erdman, Donald J. Rose. Newton waveform relaxation techniques for tightly coupled systems
607 -- 619John F. Beetem. Hierarchical topological sorting of apparent loops via partitioning
620 -- 628Stephen Dean Brown, Jonathan Rose, Zvonko G. Vranesic. A detailed router for field-programmable gate arrays
629 -- 637John R. F. McMacken, Savvas G. Chamberlain. A numerical model for two-dimensional transient simulation of amorphous silicon thin-film transistors
638 -- 658José Pineda de Gyvez, Chennian Di. IC defect sensitivity for footprint-type spot defects
659 -- 670Kuen-Jong Lee, Melvin A. Breuer. Design and test rules for CMOS circuits to facilitate IDDQ testing of bridging faults
671 -- 673Deodatta R. Apte, Mark E. Law. Comparison of iterative methods for AC analysis in PISCES-IIB

Volume 11, Issue 4

413 -- 423Stefaan Note, Francky Catthoor, Gert Goossens, Hugo De Man. Combined hardware selection and pipelining in high-performance data-path design
424 -- 431Thomas F. Hayes, John J. Barrett. Modeling of multiconductor systems for packaging and interconnecting high-speed digital IC s
432 -- 442Eugene Z. Xia, Resve A. Saleh. Parallel waveform-Newton algorithms for circuit simulation
443 -- 452Eduard Cerny, John P. Hayes, Nicholas C. Rumin. Accuracy of magnitude-class calculations in switch-level modeling
453 -- 463Allen C.-H. Wu, Daniel D. Gajski. Partitioning algorithms for layout synthesis from register-transfer netlists
464 -- 474Nobuo Funabiki, Yoshiyasu Takefuji. A parallel algorithm for channel routing problems [VLSI]
475 -- 486Chung-Kuan Cheng, Ximtie Deng, Yuh-Zen Liao, So-Zen Yao. Symbolic layout compaction under conditional design rules
487 -- 496Walter B. Richardson, Graham F. Carey, Brian J. Mulvaney. Modeling phosphorus diffusion in three dimensions
497 -- 504Zeyi Wang, Qiming Wu. A two-dimensional resistance simulator using the boundary element method
505 -- 512Keith R. Green, Jerry G. Fossum. A pragmatic approach to integrated process/device/circuit simulation for IC technology development
513 -- 524George L. Matthaei, Gilbert C. Chinn, Charles H. Plott, Nadir Dagli. A simplified means for computation for interconnect distributed capacitances and inductances
525 -- 540Jien-Chung Lo, Suchai Thanawastien, T. R. N. Rao, Michael Nicolaidis. An SFS Berger check prediction ALU and its application to self-checking processor designs

Volume 11, Issue 3

277 -- 300Srinivas Devadas, Kurt Keutzer. Synthesis of robust delay-fault-testable circuits: practice
301 -- 312Bernhard Eschermann, Hans-Joachim Wunderlich. Optimized synthesis techniques for testable sequential circuits
313 -- 321Gary D. Hachtel, Reily M. Jacoby, Kurt Keutzer, Christopher R. Morrison. On properties of algebraic transformations and the synthesis of multifault-irredundant circuits
322 -- 333Karem A. Sakallah, Trevor N. Mudge, Oyekunle A. Olukotun. Analysis and design of latch-controlled synchronous digital circuits
334 -- 340Bixia Li, Deren Gu. SSCNAP: a program for symbolic analysis of switched capacitor circuits
341 -- 352Tak K. Tang, Michel S. Nakhla. Analysis of high-speed VLSI interconnects using the asymptotic waveform evaluation technique
353 -- 360Bradly J. Cooke, John L. Prince, Andreas C. Cangellaris. S-parameter analysis of multiconductor, integrated circuit interconnect systems
361 -- 372Maria C. Bernardo, Robert J. Buck, Lihsin Liu, William A. Nazaret, Jerome Sacks, William J. Welch. Integrated circuit design optimization using a sequential strategy
373 -- 383Srinivas Devadas, Kurt Keutzer, Jacob K. White. Estimation of power dissipation in CMOS combinational circuits using Boolean function manipulation
384 -- 395Michel Dagenais, Serge Gaiotti, Nicholas C. Rumin. Transistor-level estimation of worst-case delays in MOS VLSI circuits
396 -- 403B. Baccus, D. Collard, E. Dubois. Adaptive mesh refinement for multilayer process simulation using the finite element method
404 -- 407Miron Abramovici, David T. Miller, Rabindra K. Roy. Dynamic redundancy identification in automatic test generation
407 -- 408Hyung K. Lee, Dong S. Ha. Comments on A method of fault simulation based on stem regions

Volume 11, Issue 2

142 -- 157Bo-Gwan Kim, Donald L. Dietmeyer. Multilevel logic synthesis with extended arrays
158 -- 184David W. Knapp, Marianne Winslett. A prescriptive formal model for data-path hardware
185 -- 197Kuochen Wang, Sy-Yen Kuo. Computer-aided modeling and evaluation of reconfigurable VLSI processor arrays with VHDL
198 -- 207Thomas M. Niermann, Wu-Tung Cheng, Janak H. Patel. PROOFS: a fast, memory-efficient sequential circuit fault simulator
208 -- 215Mary L. Bailey. How circuit size affects parallelism
216 -- 227Uminder Singh, C. Y. Roger Chen. From logic to symbolic layout for gate matrix
228 -- 234Takayasu Sakurai, Bill Lin, A. Richard Newton. Fast simulated diffusion: an optimization algorithm for multiminimum problems and its application to MOSFET model parameter extraction
235 -- 246Yusuf Leblebici, Sung-Mo Kang. Modeling of nMOS transistors for simulation of hot-carrier-induced device and circuit degradation
247 -- 259Irith Pomeranz, Zvi Kohavi. A limited exponential complexity algorithm for increasing the testability of digital circuits by testing-module insertion
260 -- 267Thomas M. Niermann, Rabindra K. Roy, Janak H. Patel, Jacob A. Abraham. Test compaction for sequential circuits
267 -- 270Xiaoyu Song. An algorithm for L-shaped channel routing in a diagonal model

Volume 11, Issue 12

1469 -- 1478Carl Pixley. A theory and implementation of sequential hardware equivalence
1479 -- 1494Richard W. Thaik, Ngee Lek, Sung-Mo Kang. A new global router using zero-one integer linear programming techniques for sea-of-gates and custom logic arrays
1495 -- 1507Jin-fuw Lee, Chak-Kuen Wong. A performance-aimed cell compactor with automatic jogs
1508 -- 1521Shan-Ping Chin, Ching-Yuan Wu. A new methodology for two-dimensional numerical simulation of semiconductor devices
1522 -- 1528H.-C. Chow, W.-S. Feng, James B. Kuo. An improved analytical short-channel MOSFET model valid in all regions of operating for analog/digital circuit simulation
1529 -- 1558Shiu-Kai Chin. Verified functions for generating signed-binary arithmetic hardware
1559 -- 1573Srinivas Devadas, Kurt Keutzer. Validatable nonrobust delay-fault testable circuits via logic synthesis
1574 -- 1585Raja Venkateswaran, Pinaki Mazumder, K. G. Shin. Restructuring WSI hexagonal processor arrays

Volume 11, Issue 11

1325 -- 1333Thang Nguyen Bui, Willie Hsu, SingLing Lee. A 2.5 approximation algorithm for the multi-via assignment problem
1334 -- 1343Ze-Yi Wang, Ke-Chih Wu, Robert W. Dutton. An approach to construct pre-conditioning matrices for block iteration of linear equations
1344 -- 1354Carlos H. Díaz, Sung-Mo Kang. New algorithms for circuit simulation of device breakdown
1355 -- 1362Gerard A. Allan, Anthony J. Walton, Robert J. Holwill. A yield improvement technique for IC layout using local design rules
1363 -- 1371Tom Chanak, Rakesh Chadha, Kishore Singhal. Switched-capacitor simulation models for full-chips verification
1372 -- 1387Colin Gordon, Thomas Blazeck, Raj Mittra. Time-domain simulation of multiconductor transmission lines with frequency-dependent losses
1388 -- 1401Cheryl Harkness, Daniel P. Lopresti. Interval methods for modeling uncertainty in RC timing analysis
1402 -- 1417J. Paul Harvey, Mohamed I. Elmasry, Bosco Leung. STAIC: an interactive framework for synthesizing CMOS and BiCMOS analog circuits
1418 -- 1425James A. Power, W. A. Lane. An enhanced SPICE MOSFET model suitable for analog applications
1426 -- 1438Peter Vanbekbergen, Gert Goossens, Francky Catthoor, Hugo De Man. Optimized synthesis of asynchronous control circuits from graph-theoretic specifications
1439 -- 1449Vijay S. Iyengar, Gopalakrishnan Vijayan. Optimized test application timing for AC test
1450 -- 1458Michel Renovell, Gaston Cambon. Electrical analysis and modeling of floating-gate fault
1459 -- 1462Michele Favalli, Piero Olivo, Bruno Riccò. A probabilistic fault model for analog faults in digital CMOS circuits
1462 -- 1465Andrew B. Kahng, Gabriel Robins. On the performance bounds for a class of rectilinear Steiner tree heuristics in arbitrary dimension

Volume 11, Issue 10

1177 -- 1197Shinichiro Haruyama, Martin D. F. Wong, Donald S. Fussell. Topological channel routing [VLSI]
1198 -- 1206Kevin S. Eshbaugh. Generation of correlated parameters for statistical circuit simulation
1207 -- 1226Bogdan J. Falkowski, Ingo Schäfer, Marek A. Perkowski. Effective computer methods for the calculation of Rademacher-Walsh spectrum for completely and incompletely specified Boolean functions
1227 -- 1246Mark William Kahrs. Silicon compilation of very high level language
1247 -- 1257Hong June Park, Ping Keung Ko, Chenming Hu. A non-quasi-static MOSFET model for SPICE-AC analysis
1258 -- 1277Rui Wang, Omar Wing. Transient analysis of dispersive VLSI interconnects terminated in nonlinear loads
1278 -- 1288Abu S. M. Hassan, Vinod K. Agarwal, Benoit Nadeau-Dostie, Janusz Rajski. BIST of PCB interconnects using boundary-scan architecture
1289 -- 1300Sy-Yen Kuo, Ing-Yi Chen. Efficient reconfiguration algorithms for degradable VLSI/WSI arrays
1301 -- 1316Slawomir Pilarski, Andrzej Krasniewski, Tiko Kameda. Estimating testing effectiveness of the circular self-test path technique
1317 -- 1322Uwe Hinsberger, Reiner Kolla. A cell-based approach to performance optimization of fanout-free circuits

Volume 11, Issue 1

4 -- 15Tracy Larrabee. Test pattern generation using Boolean satisfiability
16 -- 25Dhiren Xavier, Robert C. Aitken, André Ivanov, Vinod K. Agarwal. Using an asymmetric error model to study aliasing in signature analysis registers
26 -- 33Hans-Joachim Wunderlich, Sybille Hellebrand. The pseudoexhaustive test of sequential circuits
34 -- 44Thomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler. A hierarchical test pattern generation system based on high-level primitives
45 -- 67John D. Calhoun, Franc Brglez. A framework and method for hierarchical test generation
68 -- 75W. David Ballew, Lauren M. Streb. Board-level boundary scan: regaining observability with an additional IC
76 -- 82David L. Landis. A test methodology for wafer scale system
83 -- 86Paul H. Bardell. Calculating the effects of linear dependencies in m-sequences used as test stimuli
87 -- 101Srinivas Devadas, Kurt Keutzer. Synthesis of robust delay-fault-testable circuits: theory
102 -- 114Lawrence L. Larmore, Daniel D. Gajski, Allen C.-H. Wu. Layout placement for sliced architecture
115 -- 127Chung-Kuan Cheng, David N. Deutsch, Craig Shohara, Mark Taparauskas, Mark Bubien. Geometric compaction on channel routing
128 -- 136Gerd Nanz, Peter Dickinger, Siegfried Selberherr. Calculation of contact currents in device simulation