Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 13, Issue 9

1073 -- 1087Arun Achyuthan, Mohamed I. Elmasry. Mixed analog/digital hardware synthesis of artificial neural networks
1088 -- 1096Pak K. Chan, Martine D. F. Schlag, Jason Y. Zien. Spectral K-way ratio-cut partitioning and clustering
1097 -- 1109Brian Lockyear, Carl Ebeling. Optimal retiming of level-clocked circuits using symmetric clock schedules
1110 -- 1122Chi-Ying Tsui, Massoud Pedram, Alvin M. Despain. Power efficient technology decomposition and mapping under an extended power consumption model
1123 -- 1131Farid N. Najm. Low-pass filter for computing the transition density in digital circuits
1132 -- 1142Sherif H. K. Embabi, R. Damodaran. Delay models for CMOS, BiCMOS and BiNMOS circuits and their applications for timing simulations
1143 -- 1158Wolfgang Kunz, Dhiraj K. Pradhan. Recursive learning: a new implication technique for efficient solutions to CAD problems-test, verification, and optimization
1159 -- 1166Tai-Yu Chou, Zoltan J. Cendes. Capacitance calculation of IC packages using the finite element method and planes of symmetry
1166 -- 1170Sudhir M. Gowda, Bing J. Sheu. BSIM plus: an advanced SPICE model for submicron MOS VLSI circuits
1170 -- 1178Dimitrios Kagaris, Fillia Makedon, Spyros Tragoudas. A method for pseudo-exhaustive test pattern generation
1179 -- 1184Ted Stanion, Carl Sechen. Boolean division and factorization using binary decision diagrams

Volume 13, Issue 8

959 -- 975Yung-Te Lai, Massoud Pedram, Sarma B. K. Vrudhula. EVBDD-based algorithms for integer linear programming, spectral transformation, and function decomposition
976 -- 986J. Narasimham, Kazuo Nakajima, Chong S. Rim, Anton T. Dahbura. Yield enhancement of programmable ASIC arrays by reconfiguration of circuit placements
987 -- 1004C. Thomas Gray, Wentai Liu, Ralph K. Cavin III. Timing constraints for wave-pipelined systems
1005 -- 1015Prabhat Jain, Ganesh Gopalakrishnan. Efficient symbolic simulation-based verification using the parametric form of Boolean expressions
1016 -- 1023Li-Ren Liu, Hsi-Chuan Chen, David Hung-Chang Du. The calculation of signal stable ranges in combinational circuits
1024 -- 1034Carl Pixley, Seh-Woong Jeong, Gary D. Hachtel. Exact calculation of synchronizing sequences based on binary decision diagrams
1035 -- 1044Gwo-Chung Tai, Can E. Korman, Isaak D. Mayergoyz. A parallel-in-time method for the transient simulation of SOI devices with drain current overshoots
1045 -- 1051Wing Ning. Strongly NP-hard discrete gate-sizing problems
1051 -- 1056Elizabeth M. Rudnick, Vivek Chickermane, Janak H. Patel. An observability enhancement approach for improved testability and at-speed test
1057 -- 1064Jacob Savir, Srinivas Patil. Broad-side delay test
1065 -- 1068Shun-Lin Su, Charles H. Barry, Chi-Yuan Lo. A space-efficient short-finding algorithm [VLSI layouts]

Volume 13, Issue 7

829 -- 842Balkrishna Ramkumar, Prithviraj Banerjee. ProperCAD: A portable object-oriented parallel environment for VLSI CAD
843 -- 856D. L. Springer, Donald E. Thomas. Exploiting the special structure of conflict and compatibility graphs in high-level synthesis
857 -- 864Siu-Wing Cheng, Hsi-Chuan Chen, David Hung-Chang Du, Andrew Lim. The role of long and short paths in circuit performance optimization
865 -- 874June-Kyung Rho, Fabio Somenzi. Don t care sequences and the optimization of interacting finite state machines
875 -- 883Alexander Saldanha, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli. Circuit structure relations to redundancy and delay
884 -- 890Shun-Shii Lin. Constant-time algorithms for the channel assignment problem on processor arrays with reconfigurable bus systems
891 -- 898Xiaoyu Song, Xuehou Tan. An optimal channel-routing algorithm in the times square model
899 -- 908Woo-Sung Choi, Jae-Gyung Ahn, Young-June Park, Hong-Shick Min, Chang-Gyu Hwang. A time dependent hydrodynamic device simulator SNU-2D with new discretization scheme and algorithm
909 -- 919Li-Ren Liu, David Hung-Chang Du, Hsi-Chuan Chen. An efficient parallel critical path algorithm
920 -- 934Vivek Chickermane, Jaushin Lee, Janak H. Patel. Addressing design for testability at the architectural level
935 -- 939Rochit Rajsuman. A new testing method for EEPLA
940 -- 949Jos van Sas, Francky Catthoor, Hugo De Man. Cellular automata based deterministic self-test strategies for programmable data paths
950 -- 956Sharad Malik. Analysis of cyclic combinational circuits

Volume 13, Issue 6

669 -- 683Jan M. Rabaey, Miodrag Potkonjak. Estimating implementation bounds for real time DSP application specific circuits
684 -- 693Tae Won Cho, Sam S. Pyo, J. Robert Heath. PARALLEX: a parallel approach to switchbox routing
694 -- 701Alessandro De Gloria, Paolo Faraboschi, Mauro Olivieri. Block placement with a Boltzmann Machine
702 -- 711Y. Apanovich, Eugeny D. Lyumkis, Boris S. Polsky, Alex I. Shur, Peter A. Blakey. Steady-state and transient analysis of submicron devices using energy balance and simplified hydrodynamic models
712 -- 724Udaya A. Ranawake, Carl Huster, Patrick M. Lenders, Stephen Marshall Goodnick. PMC-3D: a parallel three-dimensional Monte Carlo semiconductor device simulator
725 -- 728Jason Yao-Tsung Tsai, Kuo-Don Hong, Yin-Lun Yuan. An efficient analytical model for calculating trapped charge in amorphous silicon
729 -- 736Demos F. Anastasakis, Nanda Gopal, Seok-Yoon Kim, Lawrence T. Pillage. Enhancing the stability of asymptotic waveform evaluation for digital interconnect circuit applications
737 -- 745Sina Balkir, Mehmet Yanilmaz, Martin A. Plonus. Numerical integration using Bezier splines
746 -- 762Anirudh Devgan, Ronald A. Rohrer. Adaptively controlled explicit simulation
763 -- 776Curtis L. Ratzlaff, Lawrence T. Pillage. RICE: rapid interconnect circuit evaluation using AWE
777 -- 785Chung-Hsing Chen, Tanay Karnik, Daniel G. Saab. Structural and behavioral synthesis for testability techniques
786 -- 795Silvano Gai, Pier Luca Montessoro. Creator: new advanced concepts in concurrent simulation
796 -- 813Linda S. Milor, Alberto L. Sangiovanni-Vincentelli. Minimizing production test time to detect faults in analog circuits
814 -- 822Srinivas Devadas, Kurt Keutzer, Sharad Malik, Albert Wang. Event suppression: improving the efficiency of timing simulation for synchronous digital circuits
822 -- 826Hsu-Chun Yen. On multiterminal single bend wirability

Volume 13, Issue 5

537 -- 552Said Amellal, Bozena Kaminska. Functional synthesis of digital systems with TASS
553 -- 565Daniel Brand, Vijay S. Iyengar. Identification of redundant delay faults
566 -- 580Kaushik De, Balkrishna Ramkumar, Prithviraj Banerjee. A portable parallel algorithm for logic synthesis using transduction
581 -- 588P. N. Lam, Hon F. Li, S. C. Leung. Optimization of state encoding in distributed circuits
589 -- 602Alexander Saldanha, Tiziano Villa, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli. Satisfaction of input and output encoding constraints
603 -- 609C. Y. Roger Chen, Cliff Yungchin Hou, Uminder Singh. Optimal algorithms for bubble sort based non-Manhattan channel routing
610 -- 615Mitiko Miura-Mattausch. Analytical MOSFET model for quarter micron technologies
616 -- 624Kenny K. H. Toh, Andrew R. Neureuther, Edward W. Scheckler. Algorithms for simulation of three-dimensional etching
625 -- 637Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer. SWiTEST: a switch level test generation system for CMOS combinational circuits
638 -- 646Weiwei Mao, Michael D. Ciletti. Reducing correlation to improve coverage of delay faults in scan-path design
638 -- 0Kuo-Feng Liao, Majid Sarrafzadeh. Correction to Boundary single-layer routing with movable terminals
646 -- 651Premachandran R. Menon, Hitesh Ahuja, Mohan Harihara. Redundancy identification and removal in combinational circuits
651 -- 658Michael Nicolaidis. Fault secure property versus strongly code disjoint checkers
658 -- 664Janusz A. Starzyk. Hierarchical analysis of high frequency interconnect networks

Volume 13, Issue 4

401 -- 424Jerry R. Burch, Edmund M. Clarke, David E. Long, Kenneth L. McMillan, David L. Dill. Symbolic model checking for sequential circuit verification
425 -- 438Taewhan Kim, Noritake Yonezawa, Jane W.-S. Liu, C. L. Liu. A scheduling algorithm for conditional resource sharing-a hierarchical reduction approach
439 -- 450Tsing-Fa Lee, Allen C.-H. Wu, Youn-Long Lin, Daniel D. Gajski. A transformation-based method for loop folding
451 -- 458Minjoong Rim, Rajiv Jain. Lower-bound performance estimation for the high-level synthesis scheduling problem
459 -- 470Mark Aagaard, Miriam Leeser. PBS: proven Boolean simplification
471 -- 481Ahmed S. Desouki, Young-June Park, Hong-Shick Min. A CAD procedure for optimizing bipolar devices relative to BiCMOS circuit delays
482 -- 493Carlos H. DĂ­az, Sung-Mo Kang, Charvaka Duvvury. Circuit-level electrothermal simulation of electrical overstress failures in advanced MOS I/O protection devices
494 -- 506Rupert Howes, William Redman-White, Ken G. Nichols, Peter J. Mole, Michael J. Robinson, Simon Bird. An SOS MOSFET model based on calculation of the surface potential
507 -- 514Tatsuya Kunikiyo, Katsuyoshi Mitsui, Masato Fujinaga, Tetsuya Uchida, Norihiko Kotani. Reverse short-channel effect due to lateral diffusion of point-defect induced by source/drain ion implantation
515 -- 530Henry Cox, Janusz Rajski. On necessary and nonconflicting assignments in algorithmic test pattern generation
531 -- 535Noriyuki Takahashi, Nagisa Ishiura, Shuzo Yajima. Fault simulation for multiple faults by Boolean function manipulation

Volume 13, Issue 3

277 -- 292Miodrag Potkonjak, Jan M. Rabaey. Optimizing resource utilization using transformations
293 -- 302Philip B. M. Wolbert, Gerhard K. M. Wachutka, Benno H. Krabbenborg, Ton J. Mouthaan. Nonisothermal device simulation using the 2D numerical process/device simulator TRENDY and application to SOI-devices
303 -- 309Ting-Hai Chao, Yu-Chin Hsu. Rectilinear Steiner tree construction by local and global refinement
310 -- 317Ronald J. G. Goossens, Stephen G. Beebe, Zhiping Yu, Robert W. Dutton. An automatic biasing scheme for tracing arbitrarily shaped I-V curves
318 -- 337Shiang-Tang Huang, Tai-Ming Parng, Jyuo-Min Shyu. Timed Boolean calculus and its applications in timing analysis
338 -- 352Peter M. Maurer, Yun Sik Lee. Gateways: a technique for adding event-driven behavior to compiled simulations
353 -- 358Bechir Ayari, Bozena Kaminska. A new dynamic test vector compaction for automatic test pattern generation
359 -- 369VĂ­ctor H. Champac, Antonio Rubio, Joan Figueras. Electrical model of the floating gate defect in CMOS ICs: implications on I::DDQ:: testing
370 -- 377Beyin Chen, Chung-Len Lee. A complement-based fast algorithm to generate universal test sets for multi-output functions
378 -- 386Irith Pomeranz, Sudhakar M. Reddy. On achieving complete fault coverage for sequential machines
387 -- 395Antonio Rubio, Noriyoshi Itazaki, Xiaole Xu, Kozo Kinoshita. An approach to the analysis and detection of crosstalk faults in digital VLSI circuits
396 -- 397Russell Kao, Mark Horowitz. Eliminating redundant DC equations for asymptotic waveform evaluation

Volume 13, Issue 2

137 -- 149Yi-Min Jiang, Tsing-Fa Lee, TingTing Hwang, Youn-Long Lin. Performance-driven interconnection optimization for microarchitecture synthesis
150 -- 166Zebo Peng, Krzysztof Kuchcinski. Automated transformation of algorithms into register-transfer level implementations
167 -- 177June-Kyung Rho, Gary D. Hachtel, Fabio Somenzi, Reily M. Jacoby. Exact and heuristic algorithms for the minimization of incompletely specified state machines
178 -- 186Yang Cai, Martin D. F. Wong. On shifting blocks and terminals to minimize channel density
187 -- 200Masayuki Terai, Kazuo Nakajima, Kazuhiro Takahashi, Koji Sato. A new approach to over-the-cell channel routing with three layers
201 -- 210Hans Kosina, Siegfried Selberherr. A hybrid device simulator that combines Monte Carlo and drift-diffusion analysis
211 -- 218Larry G. Jones, David Blaauw. A cache-based method for accelerating switch-level simulation
219 -- 230Edward W. Scheckler, Andrew R. Neureuther. Models and algorithms for three-dimensional topography simulation with SAMPLE-3D
231 -- 239Andrew T. Yang, Yu Liu, Jack T. Yao. An efficient nonquasi-static diode model for circuit simulation
240 -- 250Irith Pomeranz, Sudhakar M. Reddy. An efficient nonenumerative method to estimate the path delay fault coverage in combinational circuits
251 -- 263Irith Pomeranz, Sudhakar M. Reddy. SPADES-ACE: a simulator for path delay faults in sequential circuits with extensions to arbitrary clocking schemes
264 -- 276Georg Pelz, Uli Roettcher. Pattern matching and refinement hybrid approach to circuit comparison

Volume 13, Issue 12

1441 -- 1449Xiaobo Sharon Hu, Steven C. Bass, Ronald G. Harber. Minimizing the number of delay buffers in the synchronization of pipelined systems
1450 -- 1460Champaka Ramachandran, Fadi J. Kurdahi. Combined topological and functionality-based delay estimation using a layout-driven approach for high-level applications
1461 -- 1469Charles Chiang, Chak-Kuen Wong, Majid Sarrafzadeh. A weighted Steiner tree-based global router with simultaneous length and density minimization
1470 -- 1479Massoud Pedram, Bahman S. Nobandegani, Bryan Preas. Design and analysis of segmented routing channels for row-based FPGA s
1480 -- 1488Ching-Wei Yeh, Chung-Kuan Cheng, Ting-Ting Y. Lin. A general purpose, multiple-way partitioning algorithm
1489 -- 1497Joe Rodriguez-Tellez, Kahtan A. Mezher, M. Al-Daas. Computationally efficient and accurate capacitance model for the GaAs MESFET for microwave nonlinear circuit design
1498 -- 1512Russell Kao, Mark Horowitz. Timing analysis for piecewise linear Rsim
1513 -- 1525Sanjay L. Manney, Michel S. Nakhla, Qi-Jun Zhang. Analysis of nonuniform, frequency-dependent high-speed interconnects using numerical inversion of Laplace transform
1526 -- 1535Jessica Qian, Satyamurthy Pullela, Lawrence T. Pillage. Modeling the Effective capacitance for the RC interconnect of CMOS gates
1536 -- 1549Sachin S. Sapatnekar, Pravin M. Vaidya, Sung-Mo Kang. Convexity-based algorithms for design centering
1550 -- 1562Karl Fuchs, Michael Pabst, Torsten Rössel. RESIST: a recursive test pattern generation algorithm for path delay faults considering various test classes
1563 -- 1568Manjit Borah, Robert Michael Owens, Mary Jane Irwin. An edge-based heuristic for Steiner routing

Volume 13, Issue 11

1309 -- 1318Ganesh Gopalakrishnan, Erik Brunvand, Nick Michell, Steven M. Nowick. A correctness criterion for asynchronous circuit validation and optimization
1319 -- 1332Amir H. Farrahi, Majid Sarrafzadeh. Complexity of the lookup-table minimization problem for FPGA technology mapping
1333 -- 1350S. Parameswaran, M. F. Schulz. Computer-aided selection of components for technology-independent specifications
1351 -- 1365Jeff Griffith, Gabriel Robins, Jeffrey S. Salowe, Tongtong Zhang. Closing the gap: near-optimal Steiner trees in polynomial time
1366 -- 1378Dirk Theune, Ralf Thiele, W. John, Thomas Lengauer. Robust methods for EMC-driven routing
1379 -- 1390M. Karim Moallemi, Hui Zhang. A general numerical procedure for multilayer multistep IC process simulation
1391 -- 1399Giorgio Casinovi, Jeen-Mo Yang. Multi-level simulation of large analog systems containing behavioral models
1400 -- 1408Alberto Leone, Antonio Gnudi, Giorgio Baccarani. Hydrodynamic simulation of semiconductor devices operating at low temperature
1409 -- 1412Jun-Fa Mao, Zheng-Fan Li. Waveform relaxation solution of the ABCD matrices of nonuniform transmission lines for transient analysis
1413 -- 1418S. Wayne Bollinger, Scott F. Midkiff. Test generation for I::DDQ:: testing of bridging faults in CMOS circuits
1418 -- 1425Richard I. Hartley, Albert E. Casavant. Optimizing pipelined networks of associative and commutative operators
1425 -- 1428Akira Kato, Mitsutaka Katada, Toyoharu Kamiya, Toyoki Ito, Tadashi Hattori. A rapid, stable decoupled algorithm for solving semiconductor hydrodynamic equations
1428 -- 1434Irith Pomeranz, Sudhakar M. Reddy. On determining symmetries in inputs of logic circuits
1434 -- 1437Yasunori Sameshima, Yoshihiro Kitamura, Tomoo Fukazawa. Multiple signature analysis method using fault simulation

Volume 13, Issue 10

1189 -- 1200Konrad Doll, Frank M. Johannes, Kurt Antreich. Iterative placement improvement by network flow methods
1201 -- 1222King C. Ho, Sarma B. K. Vrudhula. Interval graph algorithms for two-dimensional multiple folding of array-based VLSI layouts
1223 -- 1234Ping-Chung Li, Georgios I. Stamoulis, Ibrahim N. Hajj. A probabilistic timing approach to hot-carrier effect estimation
1235 -- 1240Minchang Liang, Mark E. Law. An object-oriented approach to device simulation-FLOODS
1241 -- 1246Dwight L. Woolard, Hong Tian, Michael A. Littlejohn, K. W. Kim. The implementation of physical boundary conditions in the Monte Carlo simulation of electron devices
1247 -- 1256Walter Allegretto, Bing Shen, P. Haswell, Zhongsheng Lai, Alexander M. Robinson. Numerical modeling of a micromachined thermal conductivity gas pressure sensor
1257 -- 1270Seok-Yoon Kim, Nanda Gopal, Lawrence T. Pillage. Time-domain macromodels for VLSI interconnect analysis
1271 -- 1279Abdolreza Nabavi-Lishi, Nicholas C. Rumin. Inverter models of CMOS gates for supply current and delay evaluation
1280 -- 1287TingTing Hwang, Robert Michael Owens, Mary Jane Irwin, Kuo-Hua Wang. Logic synthesis for field-programmable gate arrays
1288 -- 1300Jaushin Lee, Janak H. Patel. Architectural level test generation for microprocessors
1301 -- 1305T. V. Nguyen. Recursive convolution and discrete time domain simulation of lossy coupled transmission lines

Volume 13, Issue 1

1 -- 12Jason Cong, Yuzheng Ding. FlowMap: an optimal technology mapping algorithm for delay optimization in lookup-table based FPGA designs
13 -- 26Martine D. F. Schlag, Jackson Kong, Pak K. Chan. Routability-driven technology mapping for lookup table-based FPGA s
27 -- 37Lars W. Hagen, Andrew B. Kahng, Fadi J. Kurdahi, Champaka Ramachandran. On the intrinsic Rent parameter and spectra-based partitioning methodologies
38 -- 47Majid Sarrafzadeh, Kuo-Feng Liao, Chak-Kuen Wong. Single-layer global routing
48 -- 56Reiji Suda, Ryotaro Kamikawai, Yasuo Wada, Willy Hioe, Mutsumi Hosoya, Eiichi Goto. QFP wiring problem-introduction and analytical considerations
57 -- 71Kurt Antreich, Helmut E. Graeb, Claudia U. Wieser. Circuit analysis and optimization driven by worst-case distances
72 -- 81Franz Fasching, Walter Tuppa, Siegfried Selberherr. VISTA-the data level
82 -- 95Martin D. Giles, Duane S. Boning, Goodwin R. Chin, Walter C. Dietrich Jr., Michael S. Karasick, Mark E. Law, Purnendu K. Mozumder, Lee R. Nackman, V. T. Rajan, Duncan M. Hank Walker, Robert H. Wang, Alexander S. Wong. Semiconductor wafer representation for TCAD
96 -- 104Jaijeet S. Roychowdhury, A. Richard Newton, Donald O. Pederson. Algorithms for the transient simulation of lossy interconnect
105 -- 109W. W. Wong, Juin J. Liou. JFET circuit simulation using SPICE implemented with an improved model
110 -- 121So-Zen Yao, Nan-Chi Chou, Chung-Kuan Cheng, T. C. Hu. A multi-probe approach for MCM substrate testing
122 -- 134Filip Van Aelten, Jonathan Allen, Srinivas Devadas. Event-based verification of synchronous, globally controlled, logic designs against signal flow graphs