Mehdi Baradaran Tahoori - researchr alias

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Viewing Publication 1 - 100 from 313

2023

Smart Hammering: A practical method of pinhole detection in MRAM memoriesSina Bakhtavari Mamaghani, Christopher Münch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori. date 2023: 1-6 [doi]

On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSIMahta Mayahinia, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian. ets 2023: 1-4 [doi]

Active and Passive Physical Attacks on Neural Network AcceleratorsVincent Meyers, Dennis Gnad, Mehdi Baradaran Tahoori. dt, 40(5):70-85, October 2023. [doi]

Remote Identification of Neural Network FPGA Accelerators by Power FingerprintsVincent Meyers, Michael Hefenbrock, Dennis Gnad, Mehdi Baradaran Tahoori. fpl 2023: 259-264 [doi]

Timing-accurate simulation framework for NVM-based compute-in-memory architecture explorationVincent Rietz, Christopher Münch, Mahta Mayahinia, Mehdi Baradaran Tahoori. it, 65(1-2):13-29, May 2023. [doi]

A Learning-Based Approach for Single Event Transient Analysis in Pass Transistor LogicZ. Zhang, Zhihang Wu, Christian Weis, Norbert Wehn, Mehdi Baradaran Tahoori. iolts 2023: 1-7 [doi]

Towards Temporal Information Processing - Printed Neuromorphic Circuits with Learnable FiltersHaibin Zhao, Priyanjana Pal, Michael Hefenbrock, Michael Beigl, Mehdi Baradaran Tahoori. NANOARCH 2023: [doi]

2020

Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield AnalysisRajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui. vts 2020: 1-10 [doi]

Secure STT-MRAM Bit-Cell Design Resilient to Differential Power Analysis AttacksSamir Ben Dodo, Rajendra Bishnoi, Mehdi Baradaran Tahoori. tvlsi, 28(1):263-272, 2020. [doi]

A Novel Printed-Lookup-Table-Based Programmable Printed Digital CircuitAhmet Turan Erozan, Dennis D. Weller, Farhan Rasheed, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. tvlsi, 28(6):1496-1504, 2020. [doi]

A Compact Low-Voltage True Random Number Generator Based on Inkjet Printing TechnologyAhmet Turan Erozan, Guan Ying Wang, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. tvlsi, 28(6):1485-1495, 2020. [doi]

Reverse Engineering of Printed Electronics Circuits: From Imaging to Netlist ExtractionAhmet Turan Erozan, Michael Hefenbrock, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. tifs, 15:475-486, 2020. [doi]

Remote Electrical-level Security Threats to Multi-Tenant FPGAsDennis R. E. Gnad, Jonas Krautter, Mehdi Baradaran Tahoori, Falk Schellenberg, Amir Moradi 0001. dt, 37(2):111-119, 2020. [doi]

Achieving Energy Efficiency for Near-Threshold Circuits Through Postfabrication Calibration and AdaptationMohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Anteneh Gebregiorgis, Mehdi Baradaran Tahoori. tvlsi, 28(2):443-455, 2020. [doi]

Selective Flip-Flop Optimization for Reliable Digital Circuit DesignMohammad Saber Golanbari, Saman Kiamehr, Mojtaba Ebrahimi, Mehdi Baradaran Tahoori. tcad, 39(7):1484-1497, 2020. [doi]

Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance SamplingMichael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori. date 2020: 103-108 [doi]

CPAmap: On the Complexity of Secure FPGA Virtualization, Multi-Tenancy, and Physical DesignJonas Krautter, Dennis Gnad, Mehdi Baradaran Tahoori. tches, 2020(3):121-146, 2020. [doi]

Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive MemoriesChristopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori. aspdac 2020: 393-400 [doi]

Defect Characterization and Test Generation for Spintronic-based Compute-In-MemorySarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori. ets 2020: 1-6 [doi]

Mitigating Read Failures in STT-MRAMSarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori. vts 2020: 1-6 [doi]

Dynamic Faults based Hardware Trojan Design in STT-MRAMSarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori. date 2020: 933-938 [doi]

Crossover-aware Placement and Routing for Inkjet Printed CircuitsFarhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. jetc, 16(2), 2020. [doi]

A Universal Spintronic Technology based on Multifunctional Standardized StackMehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, L. Torres, Sophiane Senni, Guillaume Patrigeon, P. Benoit, Gregory di Pendina, Guillaume Prenat. date 2020: 394-399 [doi]

Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated TransistorsDennis D. Weller, Michael Hefenbrock, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Michael Beigl. aspdac 2020: 446-451 [doi]

2019

Guest Editorial: IEEE Transactions on Computers Special Section on Emerging Non-Volatile Memory Technologies: From Devices to Architectures and SystemsYuan-Hao Chang, Jingtong Hu, Mehdi Baradaran Tahoori, Ronald F. DeMara. TC, 68(8):1111-1113, 2019. [doi]

A Spintronics Memory PUF for Resilience Against Cloning CounterfeitSamir Ben Dodo, Rajendra Bishnoi, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori. tvlsi, 27(11):2511-2522, 2019. [doi]

IEEE European Test Symposium (ETS)Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Baradaran Tahoori, Elena Ioana Vatajelu. itc 2019: 1-4 [doi]

Hardware Trojan Detection Using Changepoint-Based Anomaly Detection TechniquesRana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. tvlsi, 27(12):2706-2719, 2019. [doi]

Inkjet-Printed True Random Number Generator based on Additive Resistor TuningAhmet Turan Erozan, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. date 2019: 1361-1366 [doi]

Image PUF: A Physical Unclonable Function for Printed Electronics based on Optical Variation of Printed InksAhmet Turan Erozan, Michael Hefenbrock, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. iacr, 2019:1419, 2019. [doi]

Testing of Neuromorphic Circuits: Structural vs FunctionalAnteneh Gebregiorgis, Mehdi Baradaran Tahoori. itc 2019: 1-10 [doi]

Test Pattern Generation for Approximate Circuits Based on Boolean SatisfiabilityAnteneh Gebregiorgis, Mehdi Baradaran Tahoori. date 2019: 1028-1033 [doi]

A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device ApproachAnteneh Gebregiorgis, Rajendra Bishnoi, Mehdi Baradaran Tahoori. tcad, 38(3):439-452, 2019. [doi]

Voltage-based Covert Channels in Multi-Tenant FPGAsDennis R. E. Gnad, Cong Dang Khoa Nguyen, Syed Hashim Gillani, Mehdi Baradaran Tahoori. iacr, 2019:1394, 2019. [doi]

Leaky Noise: New Side-Channel Attack Vectors in Mixed-Signal IoT DevicesDennis R. E. Gnad, Jonas Krautter, Mehdi Baradaran Tahoori. tches, 2019(3):305-339, 2019. [doi]

Dependability Analysis of Data Storage Systems in Presence of Soft ErrorsMostafa Kishani, Mehdi Baradaran Tahoori, Hossein Asadi. tr, 68(1):201-215, 2019. [doi]

Mitigating Electrical-level Attacks towards Secure Multi-Tenant FPGAs in the CloudJonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori. trets, 12(3), 2019. [doi]

Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAsJonas Krautter, Dennis R. E. Gnad, Falk Schellenberg, Amir Moradi 0001, Mehdi Baradaran Tahoori. iacr, 2019:1152, 2019. [doi]

Active Fences against Voltage-based Side Channels in Multi-Tenant FPGAsJonas Krautter, Dennis R. E. Gnad, Falk Schellenberg, Amir Moradi 0001, Mehdi Baradaran Tahoori. iccad 2019: 1-8 [doi]

Reliable in-memory neuromorphic computing using spintronicsChristopher Münch, Rajendra Bishnoi, Mehdi Baradaran Tahoori. aspdac 2019: 230-236 [doi]

A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAMSarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori. tvlsi, 27(7):1697-1710, 2019. [doi]

Variation-aware Fault Modeling and Test Generation for STT-MRAMSarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, H. Grigoryan, G. Tshagharyan. iolts 2019: 80-83 [doi]

Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI InterconnectsSarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor. irps 2019: 1-6 [doi]

Predictive Modeling and Design Automation of Inorganic Printed ElectronicsFarhan Rasheed, Michael Hefenbrock, Rajendra Bishnoi, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. date 2019: 30-35 [doi]

Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting SchemeNour Sayed, Rajendra Bishnoi, Mehdi Baradaran Tahoori. tvlsi, 27(6):1329-1342, 2019. [doi]

Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache DesignNour Sayed, Longfei Mao, Rajendra Bishnoi, Mehdi Baradaran Tahoori. todaes, 24(4), 2019. [doi]

Defect Clustering-Aware Spare-TSV Allocation in 3-D ICs for Yield EnhancementShengcheng Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. tcad, 38(10):1928-1941, 2019. [doi]

Bayesian Optimized Importance Sampling for High Sigma Failure Rate EstimationDennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Mehdi Baradaran Tahoori. date 2019: 1667-1672 [doi]

Design and Evaluation of a Printed Analog-Based Differential Physical Unclonable FunctionLukas Zimmermann, Alexander Scholz, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Axel Sikora. tvlsi, 27(11):2498-2510, 2019. [doi]

2018

Inkjet-Printed EGFET-Based Physical Unclonable Function - Design, Evaluation, and FabricationAhmet Turan Erozan, Gabriel Cadilha Marques, Mohammad Saber Golanbari, Rajendra Bishnoi, Simone Dehm, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. tvlsi, 26(12):2935-2946, 2018. [doi]

Design and evaluation of physical unclonable function for inorganic printed electronicsAhmet Turan Erozan, Mohammad Saber Golanbari, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. isqed 2018: 419-424 [doi]

Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off AnalysisAnteneh Gebregiorgis, Mehdi Baradaran Tahoori. iolts 2018: 265-268 [doi]

Fine-Grained Energy-Constrained Microprocessor Pipeline DesignAnteneh Gebregiorgis, Mehdi Baradaran Tahoori. tvlsi, 26(3):457-469, 2018. [doi]

Spintronic normally-off heterogeneous system-on-chip designAnteneh Gebregiorgis, Rajendra Bishnoi, Mehdi Baradaran Tahoori. date 2018: 113-118 [doi]

Checking for Electrical Level Security Threats in Bitstreams for Multi-tenant FPGAsDennis R. E. Gnad, Sascha Rapp, Jonas Krautter, Mehdi Baradaran Tahoori. fpt 2018: 286-289 [doi]

An Experimental Evaluation and Analysis of Transient Voltage Fluctuations in FPGAsDennis R. E. Gnad, Fabian Oboril, Saman Kiamehr, Mehdi Baradaran Tahoori. tvlsi, 26(10):1817-1830, 2018. [doi]

Optimizing Datapaths for Near Threshold ComputingMohammad Saber Golanbari, Mehdi Baradaran Tahoori. smacd 2018: 69-72 [doi]

Balancing resiliency and energy efficiency of functional units in ultra-low power systemsMohammad Saber Golanbari, Anteneh Gebregiorgis, Elyas Moradi, Saman Kiamehr, Mehdi Baradaran Tahoori. aspdac 2018: 637-644 [doi]

Runtime adjustment of IoT system-on-chips for minimum energy operationMohammad Saber Golanbari, Mehdi Baradaran Tahoori. dac 2018: [doi]

Reliable memory PUF design for low-power applicationsMohammad Saber Golanbari, Saman Kiamehr, Rajendra Bishnoi, Mehdi Baradaran Tahoori. isqed 2018: 207-213 [doi]

FPGAhammer: Remote Voltage Fault Attacks on Shared FPGAs, suitable for DFA on AESJonas Krautter, Dennis R. E. Gnad, Mehdi Baradaran Tahoori. tches, 2018(3):44-68, 2018. [doi]

From silicon to printed electronics: A coherent modeling and design flow approach based on printed electrolyte gated FETsGabriel Cadilha Marques, Farhan Rasheed, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori. aspdac 2018: 658-663 [doi]

Multi-bit non-volatile spintronic flip-flopChristopher Munch, Rajendra Bishnoi, Mehdi Baradaran Tahoori. date 2018: 1229-1234 [doi]

VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration ToolSarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Fazal Hameed, Mehdi Baradaran Tahoori. tcad, 37(7):1396-1407, 2018. [doi]

Parametric failure modeling and yield analysis for STT-MRAMSarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori. date 2018: 265-268 [doi]

Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAMSarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, G. Tshagharyan, H. Grigoryan, Gurgen Harutyunyan, Yervant Zorian. itc 2018: 1-10 [doi]

A cross-layer adaptive approach for performance and power optimization in STT-MRAMNour Sayed, Rajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori. date 2018: 791-796 [doi]

Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAMNour Sayed, Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori. aspdac 2018: 203-208 [doi]

An Inside Job: Remote Power Analysis Attacks on FPGAsFalk Schellenberg, Dennis R. E. Gnad, Amir Moradi 0001, Mehdi Baradaran Tahoori. iacr, 2018:12, 2018. [doi]

Remote Inter-Chip Power Analysis Side-Channel Attacks at Board-LevelFalk Schellenberg, Dennis R. E. Gnad, Amir Moradi 0001, Mehdi Baradaran Tahoori. iacr, 2018:881, 2018. [doi]

An inside job: Remote power analysis attacks on FPGAsFalk Schellenberg, Dennis R. E. Gnad, Amir Moradi 0001, Mehdi Baradaran Tahoori. date 2018: 1111-1116 [doi]

Remote inter-chip power analysis side-channel attacks at board-levelFalk Schellenberg, Dennis R. E. Gnad, Amir Moradi 0001, Mehdi Baradaran Tahoori. iccad 2018: 114 [doi]

Modeling and Testing of Aging Faults in FinFET Memories for Automotive ApplicationsG. Tshagharyan, Gurgen Harutyunyan, Yervant Zorian, Anteneh Gebregiorgis, Mohammad Saber Golanbari, Rajendra Bishnoi, Mehdi Baradaran Tahoori. itc 2018: 1-10 [doi]

Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time StressArunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. tcad, 37(5):1064-1075, 2018. [doi]

Workload-Aware Static Aging Monitoring and Mitigation of Timing-Critical Flip-FlopsArunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. tcad, 37(10):2098-2110, 2018. [doi]

Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic CoresArunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. tcad, 37(2):499-511, 2018. [doi]

Multicast Testing of Interposer-Based 2.5D ICs: Test-Architecture Design and Test SchedulingShengcheng Wang, Ran Wang 0002, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. todaes, 23(3), 2018. [doi]

Recovery-Aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3-D ICsShengcheng Wang, Taeyoung Kim 0001, Zeyu Sun, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori. tvlsi, 26(3):531-543, 2018. [doi]

2017

Logic synthesis and testing techniques for switching nano-crossbar arraysDan Alexandrescu, Mustafa Altun, Lorena Anghel, Anna Bernasconi 0001, Valentina Ciriani, Luca Frontini, Mehdi Baradaran Tahoori. mam, 54:14-25, 2017. [doi]

Computing with nano-crossbar arrays: Logic synthesis and fault toleranceMustafa Altun, Valentina Ciriani, Mehdi Baradaran Tahoori. date 2017: 278-281 [doi]

Design of Defect and Fault-Tolerant Nonvolatile Spintronic Flip-FlopsRajendra Bishnoi, Fabian Oboril, Mehdi Baradaran Tahoori. tvlsi, 25(4):1421-1432, 2017. [doi]

Run-time hardware trojan detection using performance countersRana Elnaggar, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. itc 2017: 1-10 [doi]

Error Propagation Aware Timing Relaxation For Approximate Near Threshold ComputingAnteneh Gebregiorgis, Saman Kiamehr, Mehdi Baradaran Tahoori. dac 2017: [doi]

Voltage drop-based fault attacks on FPGAs using valid bitstreamsDennis R. E. Gnad, Fabian Oboril, Mehdi Baradaran Tahoori. fpl 2017: 1-7 [doi]

Post-fabrication calibration of Near-Threshold circuits for energy efficiencyMohammad Saber Golanbari, Saman Kiamehr, Fabian Oboril, Anteneh Gebregiorgis, Mehdi Baradaran Tahoori. isqed 2017: 385-390 [doi]

Aging-aware coding scheme for memory arraysMohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori. ets 2017: 1-6 [doi]

Design flows for resilient energy-efficient systemsMohammad Saber Golanbari, Mehdi Baradaran Tahoori. iolts 2017: 233-236 [doi]

Contemporary CMOS aging mitigation techniques: Survey, taxonomy, and methodsNavid Khoshavi, Rizwan Ashraf, Ronald F. DeMara, Saman Kiamehr, Fabian Oboril, Mehdi Baradaran Tahoori. integration, 59:10-22, 2017. [doi]

Leveraging aging effect to improve SRAM-based true random number generatorsSaman Kiamehr, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori. date 2017: 882-885 [doi]

Temperature-Aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold ComputingSaman Kiamehr, Mojtaba Ebrahimi, Mohammad Saber Golanbari, Mehdi Baradaran Tahoori. tvlsi, 25(7):2017-2026, 2017. [doi]

VAET-STT: A variation aware estimator tool for STT-MRAM based memoriesSarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Mehdi Baradaran Tahoori. date 2017: 1456-1461 [doi]

Bias Temperature Instability Mitigation via Adaptive Cache Size ManagementNezam Rohbani, Mojtaba Ebrahimi, Seyed Ghassem Miremadi, Mehdi Baradaran Tahoori. tvlsi, 25(3):1012-1022, 2017. [doi]

Leveraging Systematic Unidirectional Error-Detecting Codes for fast STT-MRAM cacheNour Sayed, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori. vts 2017: 1-6 [doi]

Opportunistic write for fast and reliable STT-MRAMNour Sayed, Mojtaba Ebrahimi, Rajendra Bishnoi, Mehdi Baradaran Tahoori. date 2017: 554-559 [doi]

Exploiting STT-MRAM for approximate computingNour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori. ets 2017: 1-6 [doi]

Workload-aware static aging monitoring of timing-critical flip-flopsArunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori. aspdac 2017: 176-181 [doi]

Recovery-aware proactive TSV repair for electromigration in 3D ICsShengcheng Wang, Hengyang Zhao, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori. date 2017: 220-225 [doi]

Leveraging recovery effect to reduce electromigration degradation in power/ground TSVShengcheng Wang, Zeyu Sun, Yuan Cheng, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori. iccad 2017: 811-818 [doi]

Energy Efficient Scientific Computing on FPGAs using OpenCLDennis Weller, Fabian Oboril, Dimitar Lukarski, Jürgen Becker, Mehdi Baradaran Tahoori. fpga 2017: 247-256 [doi]

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